Apparatus for controlling exposure of a solid state image sensor array

• US 4,338,514 A
• Filed: 04/07/1980
• Issued: 07/06/1982
• Est. Priority Date: 04/07/1980
• Status: Expired due to Term

• Current Assignee: Eastman Kodak Company
• Original Assignee: Spin Physics Incorporated
• Inventors: Bixby, James A.
• Primary Examiner(s): Nelms, David C.
• Application Number:
  US06/138,024
• Time in Patent Office: 820 Days
• Field of Search: 250/201, 250/204, 250/209, 250/211 J, 250/578, 250/205, 357/24, 357/31, 357/32, 358/213, 356/222
• US Class Current: 250/201.1
• CPC Class Codes: H04N 23/71 Circuitry for evaluating the brightness variation
• CPC Class Codes: H04N 23/73 by influencing the exposure time
• CPC Class Codes: H04N 23/75 by influencing optical camera components

Abstract

An apparatus for controlling the exposure of a solid state image sensor array monitors the semiconductor substrate current produced as charge signal accumulates during an exposure of the array to radiant energy. The exposure of the array is controlled in response to an output signal representative of the total substrate current.

Claims

1. Apparatus for controlling the exposure of a solid state image sensor array of the type which includes a photosensitive semiconductive substrate having disposed on one surface thereof a plurality of photosites, said apparatus comprising means for producing a signal representative of the substrate current resulting from an imagewise exposure of said photosites, means for integrating said signal to provide a ramp signal having an instantaneous amplitude representative of the instantaneous average exposure of said photosites, and means responsive to said ramp signal for controlling the exposure of said sensor array.

2. The apparatus as defined in claim 1 wherein said controlling means comprises means for controlling the exposure time of said photosites.

3. The apparatus as defined in claim 1 wherein said controlling means comprises an adjustable aperture and means for adjusting said aperture in response to the amplitude of said ramp signal.

4. The apparatus as defined in claim 1 wherein said sensor array further comprises a layer of conductive material disposed on the surface of said substrate opposite said one surface, said layer being coextensive with the electrodes of said photosites, and wherein said signal producing means is connected to said conductive layer.

5. The apparatus as defined in claim 1 wherein said integrating means comprises an operational amplifier.

6. The apparatus as defined in claim 1 wherein said controlling means comprises a shutter for controlling the exposure time of said sensor array, means for resetting the exposure time of said sensor array, means for resetting said integrating means when said shutter is initially opened, and means for closing said shutter when said ramp signal exceeds a predetermined threshold level.

7. The apparatus as defined in claim 6 further comprising an aperture which is adjustable in size for controlling the intensity of exposure of said sensor array, and means responsive to the size of said aperture for adjusting said threshold level.

8. The apparatus as set forth in claim 4 wherein said integrating means comprises an operational amplifier having one of its input terminals connected to said conductive layer and the other to a reference potential, and a capacitor connected between the output of said operational amplifier and the input which is connected to said conductive layer, and wherein said controlling means comprises a comparator having one of its input terminals connected to the output of said operational amplifier and the other of its input terminals connected to a reference voltage, whereby an exposure controlling signal is provided when the output of said operational amplifier exceeds a threshold level determined by said reference voltage.