Temperature control system for an element analyzer

• US 4,339,201 A
• Filed: 04/01/1980
• Issued: 07/13/1982
• Est. Priority Date: 04/02/1979
• Status: Expired due to Term

• Current Assignee: Hitachi, Ltd.
• Original Assignee: Hitachi, Ltd.
• Inventors: Murayama, Seiichi, Yasuda, Makoto, Ito, Masaru
• Primary Examiner(s): Punter, William H.
• Application Number:
  US06/136,285
• Time in Patent Office: 833 Days
• Field of Search: 356/364-365, 356/307, 356/311-318, 250/225
• US Class Current: 356/312
• CPC Class Codes: G01N 21/74 using flameless atomising, e.g. graphite furnaces

Abstract

Disclosed is a system for controlling the temperature of an atomizer for an element analyzer, said system comprising a birefringent prism arranged on the optical axis of radiant light emitted out of the atomizer, and a light sensor for detecting the radiant light which passes through said birefringent prism.

Claims

1. A temperature control system for an element analyzer, comprising:

a light source for producing light along an optical axis;

an atomizer positioned along said optical axis for heating a sample placed therein into its vaporized state;

power supply means connected to said atomizer for supplying power thereto necessary to heat a sample placed therein;

a beam splitter positioned on said optical axis between said light source and said atomizer;

detector means positioned at a point on said optical axis which is on the opposite side of said atomizer from said light source to receive light which has passed through said atomizer and convert said light into an output electrical signal;

light sensor means positioned to receive radiant light which passes from said atomizer through said beam splitter for converting said radiant light into a temperature indicating signal; and

control means responsive to said temperature indicating signal for controlling said power supply means to regulate the temperature of said atomizer.

2. A temperature control system for an element analyzer as defined in claim 1 wherein said beam splitter comprises a birefringent prism.

3. A temperature control system for an element analyzer as defined in claim 1 wherein said light sensor means includes a light sensor positioned off said optical axis and means for directing said radiant light passing from said atomizer through said beam splitter to said light sensor.

4. A temperature control system for an element analyzer as defined in claim 3 wherein an interference filter is provided between said beam splitter and said light sensor.

5. A temperature control system for an element analyzer as defined in claim 3 wherein a slit which has the same configuration as the cross-section of said atomizer is provided between said beam splitter and said light sensor.

6. A temperature control system for an element analyzer as defined in claims 1 or 3 wherein said detector means includes wavelength selecting means for selecting at least one wavelength from the light passing through said atomizer and photodetecting means for converting the light at said selected wavelength into said output electric signal.

7. A temperature control system for an element analyzer as defined in claim 6, wherein said detector means includes a further beam splitter positioned on said optical axis on the side of said atomizer opposite said first-mentioned beam splitter.

8. A temperature control system for an element analyzer as defined in claim 1 further including chopper means positioned on said optical axis between said beam splitter and said atomizer for chopping the light passing from said light source to said atomizer via said beam splitter and said radiant light passing from said atomizer to said light sensor means via said beam splitter.