Integrated circuit carrier package test probe

• US 4,340,860 A
• Filed: 05/19/1980
• Issued: 07/20/1982
• Est. Priority Date: 05/19/1980
• Status: Expired due to Term

• Current Assignee: Trigon Incorporated
• Original Assignee: Trigon Incorporated
• Inventors: Teeple, Lawrence R. Jr.
• Primary Examiner(s): Karlsen, Ernest F.
• Application Number:
  US06/151,128
• Time in Patent Office: 792 Days
• Field of Search: 324/158 P, 324/158 F, 324/72.5, 324/51, 324/52, 324/54, 200/245, 200/257, 200/267
• US Class Current: 324/750.16
• CPC Class Codes: G01R 1/07314 the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support on an elastic support, e.g. a film, G01R1/0735
• CPC Class Codes: G01R 31/2886 Features relating to contacting the IC under test, e.g. probe heads; chucks G01R31/2865 takes precedence, test connections, e.g. test sockets, or probes per se, G01R1/04 or G01R1/06

Abstract

An IC carrier package test probe including a test probe head which is formed to penetrate into the IC chip cavity of the carrier package and which includes an elastic base having a thin layer of metal foil affixed to the outer face thereof, which foil is slited for greater elasticity and which is disposed to make simultaneous contact with each interior lead contact point within the cavity to permit rapid electrical testing of the continuity of the carrier package circuitry.

Claims

1. A test probe for facilitating the conductor continuity testing of integrated circuit carrier packages of the type having a cavity for receiving an integrated circuit chip and having conductors extending between exterior contact points disposed along the outside edges of the package and interior contact points disposed within said cavity, comprising:

test probe head means including;

an elastomeric member having at least a portion shaped to matingly penetrate into the chip receiving cavity of said integrated circuit carrier package, the distal surface of said portion forming an outer face; and

a thin metal foil plate means configured to be approximately co-extensive in size with said outer face and joined thereto, said foil plate means being formed to make simultaneous electrical contact with each interior contact point located within said chip receiving cavity; and

means for carrying said probe head means so as to position said elastomeric member in aligned relation to and in mating engagement with said chip receiving cavity whereby said foil plate means simultaneously engages and shorts all of said interior contact points together so that continuity testing of each said conductor can be accomplished by contacting pairs of said exterior contact points with a continuity tester.

2. A test probe as recited in claim 1 wherein a plurality of slits are provided in said foil plate means.

3. A test probe as recited in claim 2 wherein said slits are arrayed in a symmetrical pattern about the center point of said foil plate means.

4. A test probe as recited in claim 3 wherein each of said slits extends perpendicularly inwardly from an edge of said foil plate means.

5. A test probe as recited in claim 3 wherein said foil plate means is rectangular in shape and said slits extend perpendicularly inwardly from each side thereof, the slits disposed at the middle of each said side being of greatest length, and the slits located closer towards each corner of each side being of progressively shorter lengths, said slits being disposed such that no slit will intersect with any other slit.

6. A test probe as recited in claims 1 or 5 wherein a thin layer of silicone is disposed between said outer face of said elastomeric member and said foil plate means, with one surface of said silicone layer being bonded to said foil plate means and the opposite surface of said silicone layer being bonded to said outer face.

7. A test probe as recited in claims 1 or 5 wherein a filler plate is joined to said foil plate means, said filler plate being centrally disposed relative to the outer edges of said foil plate means and being formed for mating insertion into a lower portion of said chip receiving cavity.

8. A test probe as recited in claim 6 wherein said means for carrying includes a pivotal arm having a receptacle disposed at the outer end thereof, said receptacle being formed to attachably receive said test probe head means, said pivotal arm having a hinge means and an actuating means disposed at the inner end thereof, whereby said outer end of said pivotal arm may be disposed above an integrated circuit carrier package and said actuating means may then be activated to impel said probe head into mating relation within the chip receiving cavity of said carrier package, said actuating means exerting sufficient pressure upon said probe head means so as to cause said elastomeric member to expand within said IC chip cavity pressing said foil plate means into good electrical contact with the interior contact points disposed within said chip receiving cavity.

9. A test probe as recited in claim 6 wherein a filler plate is joined to said foil plate means, said filler plate being centrally disposed relative to the outer edges of said foil plate means and being formed for mating insertion into a lower portion of said chip receiving cavity.