Memory redundancy apparatus for single chip memories

• US 4,358,833 A
• Filed: 09/30/1980
• Issued: 11/09/1982
• Est. Priority Date: 09/30/1980
• Status: Expired due to Term

• Current Assignee: Intel Corporation
• Original Assignee: Intel Corporation
• Inventors: Kokkonen, Kim, Folmsbee, Alan C., Spaw, William J.
• Primary Examiner(s): Stellar, George G.
• Application Number:
  US06/192,494
• Time in Patent Office: 770 Days
• Field of Search: 365/200, 371/10
• US Class Current: 365/200
• CPC Class Codes: G11C 29/785 with redundancy programming schemes
• CPC Class Codes: G11C 29/832 with disconnection of faulty elements

Abstract

An improved addressing means for single chip memories which include a plurality of redundant lines and associated cells is described. Y address signals are used during programming to select and program redundant X decoders. The redundancy apparatus is implemented without any additional package pins and programming may be performed after packaging. The apparatus includes means for permanently disabling all further programming of the redundancy circuitry to prevent inadvertent programming by a user.

Claims

1. In a memory which includes first lines selected by first address signals and second lines selected by second address signals, an improved redundancy apparatus comprising:

a plurality of redundant first lines;

programmable decoder means for selecting said redundant first lines upon receipt of predetermined ones of said first address signals, said selection means being programmed to recognize said predetermined first address signals;

selection means coupled to receive at least a portion of said second address signals for selection of said programmable means during said programming and for disabling programming of said decoder means upon receipt of certain signals;

whereby said memory is programmed to use said redundant lines, and then programmed to prevent inadvertent programming.

2. The apparatus defined by claim 1 wherein said selection means blows a fuse upon said receipt of said certain signals.

3. The apparatus defined by claim 2 wherein said certain signal is a predetermined second address.

4. The apparatus defined by claim 3 wherein said decoder means includes polysilicon fuses which are selectively blown.

5. The apparatus defined by claim 4 wherein said blowing or leaving intact said polysilicon fuses in said decoder means enables the selection of either a true one of said first address signals or the complement of said one of said first address signals.

6. The apparatus defined by claim 5 including means for deselecting a faulty one of said redundant lines.

7. In a memory which includes a plurality of array decoders coupled to receive first address signals and a plurality of array lines selected by said array decoders, an improved redundancy apparatus comprising:

a plurality of redundant lines;

a plurality of redundant decoders for selecting said redundant lines, said redundant decoders coupled to said array decoders so as to prevent selection of said array lines upon selection of one of said redundant lines;

programmable gating means coupled to receive said first address signals, for programming to provide predetermined first address signals to said redundant decoders;

selection means coupled to receive second address signals for selecting said gating means during said programming of said gating means; and

repair inhibit means for preventing said programming of said gating means, said repair inhibit means coupled to receive said second address signals and being activated by predetermined second address signals;

whereby said memory may be programmed to replace faulty lines with said redundant lines and then inhibited from inadvertent programming.

8. The apparatus defined by claim 7 wherein said gating means includes polysilicon fuses which are selectively blown.

9. The apparatus defined by claim 8 wherein said blowing of said polysilicon fuses controls selection of true and complement ones of said first address signals.

10. The apparatus defined by claim 7 wherein said repair inhibit means includes a polysilicon fuse which is blown for said preventing of said programming.

11. The apparatus defined by claim 7 including means for deselecting a faulty one of said redundant lines.