Field portable element analysis unit

• US 4,362,935 A
• Filed: 09/18/1980
• Issued: 12/07/1982
• Est. Priority Date: 02/09/1979
• Status: Expired due to Term

• Current Assignee: Lockheed Martin Corporation (Martin Marietta Corporation)
• Original Assignee: Martin Marietta Corporation
• Inventors: Clark, Benton C. III
• Primary Examiner(s): Smith, Alfred E.
• Assistant Examiner(s): Grigsby, T. N.
• Application Number:
  US06/188,594
• Time in Patent Office: 810 Days
• Field of Search: 250/272, 250/274
• US Class Current: 378/48
• CPC Class Codes: G01N 2223/076 X-ray fluorescence
• CPC Class Codes: G01N 23/223 by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

Abstract

A field portable X-ray fluorescent spectrometer is described including a multichannel analyzer (2) and a plurality of interchangeable sensor heads (4). Each sensor head includes a shutter (100) which, when open, permits one of several radiation sources (80, 82) to irradiate a material to be analyzed. The returned radiation is detected by a corresponding detector (86, 90), which provides corresponding data in response. This shutter has calibration plaques attached to it so that, when closed, the plaques are exposed to the radiation sources and return radiation having selected energy distributions to the detectors. The multichannel analyzer uses the resulting detector data to calibrate the sensor head. Each sensor head includes circuitry (290) for identifying itself to the multichannel analyzer. The analyzer automatically adapts its operation in accordance with this identification. When the shutter is open, the multichannel analyzer utilizes the detector data to accumulate an energy spectrum of the material being analyzed, and displays the spectrum on a display screen (12). A cursor control (28) allows the operator to move a cursor along the displayed spectrum. A display (32) is automatically provided with a display of the symbol of the element, if any, having its major spectral peak at the position identified by the cursor. Secondary indications identify other positions along the spectrum at which peaks would appear if the element were present. Memory (202) is provided for storing a number of reference spectra, any of one of which may be displayed on the screen along with the acquired spectrum for comparison purposes. The memory (202) also stores previously acquired spectra for later analysis. The analyzer also includes other operational features, such as normalization, window control, and ratio and concentration determination, to permit the operator to quantitatively analyze materials in the field.

Claims

1. An element analysis unit comprising:

sensor means including radiation means for irradiating a material to be analyzed, detector means for detecting radiation returned by said irradiated material and providing signals representative of said returned radiation, and means for providing an indication as to the type of said radiation means and said detector means included in said sensor means;

means for interconnecting said sensor means to a processing means; and

processing means for processing said signals representative of said returned radiation and responsive to said indication for adapting said processing in accordance with the type of said radiation means and said detector means included in said sensor means interconnected with said processing means, whereby sensor means having different said radiation means and/or different said detector means may be interconnected with said processing means and said processing means will be automatically adapted for operation therewith.

2. An element analysis unit as set forth in claim 1 wherein said sensor means includes a plurality of detector means, and means for selecting one of said detectors for use in detecting said radiation returned from said irradiated material and wherein said indicating means includes sensor identification means identifying that sensor means and detector identification means identifying which of said plurality of detector means is presently being selected by said means for selecting.

3. An element analysis unit as set forth in claim 1, wherein said unit further comprises means controlled by said processing means for displaying at least a portion of the energy spectrum of said radiation returned from said irradiated material, said spectrum including a backscatter peak resulting from radiation scattered back to said detector from said radiation means, and wherein said processing means includes means for determining the location of said backscatter peak through reference to said indication, for calculating the integral of the backscatter peak thus located, and for normalizing said spectrum in accordance with a factor substantially proportionate to said integral.

4. An element analysis unit as set forth in claim 1, and further comprising means responsive to calibration control signals supplied by said processing means for controlling the calibration of said detector means, said processing means supplying calibration control signals selected in accordance with said indication.

5. An element analysis unit as set forth in claim 4, wherein said means for controlling said calibration comprises means for controlling the gain of said signals representative of said returned radiation.

6. Apparatus as set forth in claim 4, wherein said detector means comprises a proportional counter tube providing output signals having amplitudes dependent upon the magnitude of the voltage being applied across said proportional counter tube, and wherein said calibration control means comprises voltage means for applying a selected voltage across said proportional counter tube in accordance with said calibration control signals.

7. Apparatus as set forth in claim 4, wherein said calibration control means comprises means for adjusting the DC level of said signals provide by said detector means in accordance with said calibration control signals.

8. An element analysis unit as set forth in claim 1, wherein said processing means comprises means for accumulating a spectrum generally indicating the energy distribution of said returned radiation, said spectrum including a backscatter peak resulting from radiation scattered back to said detector from said radiation means, for locating said backscatter peak through reference to said indication, and for utilizing the backscatter peak thus located in the processing of said signals representative of said returned radiation.

9. An element analysis unit as set forth in claim 8, further comprising means for manually selecting a portion of said spectrum which is of interest, wherein said processing means calculates the ratio of the amplitude of the located backscatter peak to the amplitude of said selected portion of said spectrum and provides said calculated ratio to a display means, and wherein said unit further comprises display means for displaying said calculated ratio.

10. An element anaylsis unit as set forth in claim 9, and further comprising memory means having element concentration values for various calculated ratios stored therein at addressable locations, and wherein said processing means addresses said memory means in accordance with said calculated ratio so as to retrieve a corresponding said element concentration value.

11. An element analysis unit as set forth in claim 1, wherein said unit further comprises means for displaying the energy spectrum of said radiation returned from said irradiated material and means controlled by said processing means for identifying features of said energy spectrum, the identity of said features being different for different said radiation means and detector means, wherein said processing means is responsive to said indication to control said identifying means to correctly identify features of said spectrum in accordance with the radiation means and detector means included in said sensor means.

12. An element analysis unit as set forth in claim 11, further comprising means for selecting a portion of said spectrum for identification, wherein said identifying means includes means for displaying an indication of which element, if any, has its major spectral peak within the portion of said spectrum selected by said selecting means.

13. Apparatus as set forth in claim 12, wherein said display means also displays a cursor identifying a portion on said spectrum and movable with respect to said spectrum such that said identified point on said spectrum is movable along said spectrum, and wherein said means for selecting a portion of said spectrum for identification comprises cursor control means for controlling the location of said cursor and thus said identified portion.

14. Apparatus as set forth in claim 13, wherein said means for displaying an indication comprises alphanumeric display means for displaying the chemical symbol of the element, if any, which has its major spectral peak within the portion on the displayed spectrum identified by said cursor.

15. Apparatus comprising:

a housing having an opening therein;

radiation means mounted within said housing for irradiating a material through said opening;

detector means also mounted within said housing for detecting radiation returned from said irradiated material, and passing through said opening, said detector means providing signals having values representative of the energy of said returned radiation detected thereby;

calibration means selectively operable for controlling said detector means to adjust the relationship between said values of said signals and the energy of said detected radiation;

shutter means for selectively blocking said opening in said housing to prevent the passage of radiation therethrough, so that a surface of said shutter is irradiated by said radiation means when said shutter means is blocking said opening and that said detector means then detects radiation returned from said surface of said shutter, said surface being formed of a material having a fluorescent radiation characteristic selected so that said signals provided by said detector means will have a known distribution of values; and

means for automatically controlling said calibrating means, when said shutter is blocking said opening, said means being operative to accumulate a spectrum indicating the actual distribution of said values of said signals, to compare said spectrum with said known distribution of values, and to operate said calibration means so as to eliminate any differences between said actual distribution and said known distribution, whereby said detector means is automatically calibrated.

16. Apparatus as set forth in claim 15, wherein said calibration means comprises means for controlling the gain of said signals provided by said detector means.

17. Apparatus as set forth in claim 15, wherein said calibration means comprises means for controlling the offset of said signals provided by said detector means.

18. Apparatus as set forth in claim 15, wherein said calibration means comprises means for controlling both the gain and offset of said signals provided by said detector means.

19. Apparatus as set forth in claim 15, wherein said detector means comprises a proportional counter providing an output signal whose gain is dependent upon the magnitude of the voltage applied across said proportional counter, and wherein said calibration means comprises means for controlling the magnitude of the voltage being applied across said proportional counter.

20. Apparatus as set forth in claim 19, wherein said means for controlling the magnitude of the voltage being applied across said proportional counter comprises a programmable high voltage supply whose high voltage output is applied across said proportional counter.

21. Apparatus as set forth in claim 19, wherein said calibration control means further comprises means for adding a controllable offset signal into said output signal being provided by said proportional counter, and wherein said means for automatically controlling said calibration means comprises means for controlling both said voltage controlling means and said offset signal adding means, whereby both the gain and the offset of said proportional counter output signal are controlled.

22. A method of calibrating a system including a housing having an opening therein, radiation means mounted within said housing for irradiating a material through said opening, detector means also mounted within said housing for detecting radiation returned from said irradiated material and passing through said opening, said detector means providing signals having values representative of the energy of said returned radiation detected thereby, calibration means selectively operable for controlling said detector means to adjust the relationship between said values of said signals and the energy of said detected radiation, shutter means for selectively blocking said opening in said housing to prevent the passage of radiation therethrough so that a surface of said shutter is irradiated by said radiation means when said shutter means is blocking said opening and that said detector means then detects radiation returned from said surface of said shutter, said surface being formed of a material having a fluorescent radiation characteristic selected so that said signals provided by said detector means will have a known distribution of values, said method comprising the steps of:

blocking said opening with said shutter;

accumulating a spectrum indicating the actual distribution of values of said signals;

comparing said accumulated distribution with said known distribution; and

operating said calibrating means so as to eliminate any difference between said actual distribution and said known distribution, whereby said detector means is calibrated.

23. Apparatus comprising

visual display means for providing an at least two dimensional visual display,

control means for controlling said visual display means to provide a visual representation of a selected fluorescent radiation spectrum, and to provide a visual indication identifying a selected portion of said visual representation, said control means being responsive to a cursor control signal for controlling the position of said visual indication on said visual display;

cursor control means for providing said cursor control signal, said cursor control means being manually operable such that the position of said visual indication on said visual display is manually controllable, and

means for providing a visual display of an element indication representing a selected atomic element

wherein said control means further controls said element display means so as to display the said element indication representing the atomic element, if any, having its major spectral peak at the position along said visual representation identified by said visual indication.

24. Apparatus as set forth in claim 23 wherein said control means includes means for controlling said visual display means to provide secondary visual indications identifying portions of said visual representation corresponding to the locations of all of the other spectral peaks of the fluorescent radiation spectrum of said atomic element, if any, having its major spectral peak at the position along said visual representation identified by said visual indication.

25. Apparatus as set forth in claim 23, wherein said control means includes means for controlling said visual display means to display at least two said spectrums at once, whereby said spectrums may be compared one with another.

26. Apparatus as set forth in claim 23, wherein said control means comprises computer means programmed to control said visual display means and said means for providing a visual display of said element indication.

27. Apparatus comprising:

a housing having an opening therein;

radiation means mounted within said housing for irradiating a material through said opening;

detector means also mounted within said housing for detecting radiation returned from said irradiated material, and passing through said opening, said detector means providing signals in accordance with said returned radiation detected thereby;

shutter means for selectively blocking said opening in said housing to prevent the passage of radiation therethrough, so that a surface of said shutter means is then irradiated by said radiation means and that said detector means then detects radiation returned from said surface of said shutter, said surface being formed of a material having a known flourescent radiation characteristic;

means responsive to said detector signals for providing output signals having values related to the energy of said returned radiation detected by said detector means;

calibration means selectively operable for controlling the relationship between the values of said output signals and the energy of said returned radiation detected by said detector means; and

means for automatically controlling said calibrating means when said shutter is blocking said opening, said means being operative to compare the flourescent radiation characteristic represented by said output signals provided by said processing means with said known flourescent radiation characteristic and to operate said calibration means so as to eliminate any difference between said characteristics, whereby said detector means is automatically calibrated.