Focusing probe for moisture measurement device

• US 4,364,008 A
• Filed: 10/02/1980
• Issued: 12/14/1982
• Est. Priority Date: 10/02/1980
• Status: Expired due to Term

• Current Assignee: Steven L. Jacques
• Original Assignee: Steven L. Jacques
• Inventors: Jacques, Steven L.
• Primary Examiner(s): Krawczewicz, Stanley T.
• Application Number:
  US06/193,329
• Time in Patent Office: 803 Days
• Field of Search: 324/58.5 C, 324/58.5 R, 324/58.5 B, 128/632
• US Class Current: 324/636
• CPC Class Codes: G01N 22/04 Investigating moisture content
• CPC Class Codes: G01R 27/04 in circuits having distributed constants , e.g. having very long conductors or involving high frequencies

Abstract

In an apparatus for measuring the moisture content of a target material, the apparatus has means for generating an electromagnetic wave of a microwave frequency. The electromagnetic wave is guided by a guiding means. Detecting means are provided for detecting the wave. Focussing means are provided to focus the wave onto the target, at a specified depth, which is adjustable.

Claims

1. An apparatus for measuring the moisture content of a target, at a particular depth in said target, wherein said apparatus comprises:

means for generating an electromagnetic wave of a microwave frequency,

means for guiding said wave;

means for detecting said wave; and

means for focusing said wave onto said depth in said target.

3. The apparatus of claims 1 or 2 wherein said target is an organic material.

4. The apparatus of claim 3 wherein said organic material is skin tissue.

5. The apparatus of claim 4 wherein said focusing means comprises:

two conductors with a gap therebetween.

6. The apparatus of claim 4 wherein said focusing means comprises:

a plurality of first conductors;

a plurality of second conductors;

said first conductors are all electrically connected;

said second conductors are all electrically connected;

said first and second conductors positioned in alternating pattern with a gap between each first conductor and its adjacent second conductor; and

each gap is of equal dimension.

7. The apparatus of claim 4 wherein said focusing means comprises:

a plurality of spaced electrical conductors; and

means for switching the electrical connection from said guiding means to said conductors such that a plurality of measurements of moisture content are made at various depths of said target.

8. The apparatus of claim 7 wherein:

said conductors further comprise a first electrical conductor and a plurality of second electrical conductors;

each of said second conductors is spaced apart from said first conductor, with the distance between each second and first conductors different; and

said switching means adapted for switching the electrical connection between said guiding means and said second conductors.

9. The apparatus of claim 7 wherein:

each of said conductors is positioned at an equal distance from the conductor immediately adjacent thereto; and

all of said conductors are connected to said guiding means through said switching means.

10. The apparatus of claim 5 wherein the planar dimension of said focussing means immediately adjacent to and facing said target is less than one-fourth of the wavelength of the electromagnetic wave.

11. The apparatus of claim 10 wherein said microwave frequency is between 100 MHz and 20 GHz.

12. The apparatus of claim 11 wherein said guiding means is a resonant cavity.

2. In an apparatus for measuring the moisture content of a target, at a particular depth in said target, wherein said apparatus has means for generating an electromagnetic wave of a microwave frequency;

means for guiding said wave; and

means for detecting said wave;

wherein the improvement to said apparatus comprises;

means for focusing said wave onto said depth in said target.

13. A focusing probe for use with an electrical measuring device to measure a parameter of a target material at various sample depths comprising

a plurality of spaced electrical conductors;

and

means for switching the electrical connection from said measuring device to said conductors such that a plurality of measurements of said parameter are made at various sample depths.

14. The probe of claim 13 wherein:

said conductors further comprise a first electrical conductor and a plurality of second electrical conductors;

each of said second conductors is spaced apart from said first conductor, with the distance between each second and first conductors different; and

said switching means adapted for switching the electrical connection between said measuring device and said second conductors.

15. The apparatus of claim 13 wherein:

each of said conductors is positioned at an equal distance from the conductor immediately adjacent thereto; and

all of said conductors are connected to said measuring device through said switching means.