Temperature pattern measuring device

• US 4,365,307 A
• Filed: 02/25/1981
• Issued: 12/21/1982
• Est. Priority Date: 02/25/1981
• Status: Expired due to Fees

• Current Assignee: Mitsui Kinzoku Kogyo Kabushiki Kaisha
• Original Assignee: Mitsui Kinzoku Kogyo Kabushiki Kaisha
• Inventors: Nemoto, Shin, Tatsuwaki, Masao, Okada, Michio, Hotta, Kazuyuki, Katayama, Yutaka
• Primary Examiner(s): Wise, Edward J.
• Application Number:
  US06/238,357
• Time in Patent Office: 664 Days
• Field of Search: 364/557, 364/525, 364/526, 358/100, 358/101, 358/106, 358/107, 358/110, 358/113, 73/355 R, 73/356, 356/45, 356/416, 356/418, 250/358 P, 250/342, 250/338
• US Class Current: 702/134
• CPC Class Codes: G01J 5/60 using determination of colour temperature

Abstract

A temperature pattern measuring device for obtaining the surface temperature distribution of an object. The device receives an image of the measured object and two different wavelength components of light emitted from the object. The device performs a two color temperature process for each minute area within a visual field of the image pickup, detecting the temperature at a portion on the surface of the corresponding measured object, thereby obtaining the temperature pattern thereof. The above minute areas can be set by an electrical method using photoelectric conversion means. Also, a supervision unit for the weld zone at an electrically seamed pipe, may employ the temperature pattern measuring unit of the present invention, the supervision unit producing a composite display of the form of the weld zone and the temperature pattern thereof.

Claims

1. A temperature pattern measuring device for obtaining the surface temperature distribution of an object to be measured, comprising:

a two-dimensional image pickup means;

first and second optical filters provided along a light path extending from said object to said image pickup means, said filters arranged to select two different optical wavelength components of light from said object to be measured;

an arithmetic means operatively connected to said image pickup means for determining the temperature on the surface of said object to be measured based on the ratio of the magnitude of said two different wavelength components of light,

an additional image pickup means for obtaining a two-dimensional video image of said object to be measured;

a combining means for combining outputs of said arithmetic means and said additional image pickup means and a monitor means operatively connected to said combining means, said arithmetic means controlling said image pickup means and said combining means such that a composite display comprising a two-dimensional video image of said object to be measured and a graphical representation of the temperature distribution pattern of said object to be measured is produced on said monitor.

6. A temperature pattern measuring device in accordance with claims 1 or 2 or 3 or 4, or 5, wherein said object to be measured comprises a weld zone of an electrically seamed pipe being fabricated on an electrically seamed pipe manufacturing line;

further comprising means operatively connected to said arithmetic means for computing data for use in controlling said fabrication of said electrically seamed pipe from said measured temperature distribution pattern.

7. A temperature measuring device in accordance with claim 1 or 2, wherein said two-dimensional image pickup means comprises a random access scanning type image pickup system.

2. A temperature pattern measuring device for obtaining the surface temperature distribution of an object to be measured, comprising:

a two-dimensional image pickup means;

first and second optical filters provided along a light path extending from said object to said image pickup means, said filters arranged to select two different optical wavelength components of light from said object to be measured;

an arithmetic means operatively connected to said image pickup means for determining the temperature on the surface of said object to be measured based on the ratio of the magnitude of said two different wavelength components of light, said arithmetic means further determining the position on the surface of said object, wherein the temperature distribution pattern of the object to be measured is obtained;

an additional image pickup means for obtaining a two-dimensional video image of said object to be measured;

a combining means for combining outputs of said arithmetic means and said additional image pickup means and a monitor means operatively connected to said combining means, said arithmetic means controlling said image pickup means and said combining means such that a composite display comprising a two-dimensional video image of said object to be measured and a graphical representation of the temperature distribution pattern of said object to be measured is produced on said monitor.

3. A temperature pattern measuring device comprising:

a first two-dimensional image pickup means including a camera head and control unit;

an arithmetic means operatively connected to said first image pickup means;

a filter means including at least a first and a second optical filter movably arranged along a light path extending from an object whose temperature pattern is to be measured to said first image pickup means, said filter means operatively connected to and controlled by said arithmetic unit and said first and second optical filters arranged to select two different wavelength components of light;

said arithmetic means determining the temperature on the surface of said ojbect to be measured based on the ratio of the magnitude of said two different wavelength components of light, said arithmetic means further determining the position on the surface of said object, wherein the temperature distribution pattern of the object to be measured is obtained;

said arithmetic means controlling said filter means to alternately move said first and second optical filters along said light path;

a second two-dimensional image pickup means optically aimed at said object to be measured;

a picture composing unit operatively connected to said arithmetic unit and said second image pickup means;

a monitor means operatively connected to said picture composing unit;

wherein said arithmetic means controls said first image pickup means and said filter means and said picture composing unit such that said monitor displays a two-dimensional video image of said object to be measured and a graphical representation of the temperature distribution pattern thereof.

8. A temperature pattern measuring device in accordance with claim 3, wherein said first two-dimensional image pickup means comprises a random access scanning image pickup system.

4. A temperature pattern measuring device comprising:

first and second image pickup devices, each comprising a camera head operatively connected to a control unit;

a third image pickup device;

first and second optical filters respectively provided along a light path extending from an object whose temperature pattern is to be measured to said first and second camera heads, said first and second optical filters arranged to respectively pass two different optical wavelength components of light to said first and second camera heads;

first and second integrator means respectively connected to said first and second contol units for integrating outputs thereof;

first and second analog-to-digital converter means respectively connected to said first and second integrator means for converting outputs thereof to digital signals;

an arithmetic means operatively connected to said first and second analog-to-digital converter means;

analog signal generating means for controlling said first and second control units;

a picture composing means operatively connected to said arithmetic means and said third image pickup device;

a monitor means operatively connected to said picture composing means;

said arithmetic means determining the temperature on the surface of said object to be measured based on the ratio of the magnitude of said two different wavelength components of light,

wherein said arithmetic means controls said first and second control units and said picture composing means such that said monitor displays a two-dimensional video image of said object to be measured and a graphical representation of the temperature distribution pattern thereof.

9. A temperature pattern measuring device according to claim 4 or 5, wherein said first and second two-dimensional image pickup device each comprise a random access scanning type image pickup system.

5. A temperature pattern measuring device comprising:

first and second image pickup devices, each comprising a camera head operatively connected to a control unit;

a third image pickup device;

first and second optical filters respectively provided along a light path extending from an object whose temperature pattern is to be measured to said first and second camera heads, said first and second optical filters arranged to respectively pass two different optical wavelength components of light to said first and second camera heads;

first and second integrator means respectively connected to said first and second control units for integrating outputs thereof;

first and second analog-to-digital converter means respectively connected to said first and second integrator means for converting outputs thereof to digital signals;

an arithmetic means including a micro-computer operatively connected to said first and second analog-to-digital converter means;

storage means operatively connected to said micro-computer for storing digital data therein;

first and second digital-to-analog converter means operatively connected respectively between said micro-computer and said first and second control units for converting digital signals from said micro-computer to analog signals for controlling said first and second control units;

a picture composing means operatively connected to said micro-computer and said third image pickup device;

a monitor means operatively connected to said picture composing means;

wherein said first, second, and third image pickup devices are mechanically aimed at said object to be measured through at least one lens;

said arithmetic means determining the temperature on the surface of said object to be measured based on the ratio of the magnitude of said two different wavelength components of light, said arithmetic means further determining the position on the surface of said object, wherein the temperature distribution pattern of the object to be measured is obtained;

wherein said micro-computer controls said storage means and said first and second control units and said picture composing means such that said monitor displays a two-dimensional video image of said object to be measured and a graphical representation of the temperature distribution pattern thereof.

10. A temperature pattern measuring device comprising:

First and second image pickup devices, each comprising a camera head operatively connected to a control unit;

first and second optical filters respectively provided along a light path extending from an object whose temperature pattern is to be measured to said first and second camera heads, said first and second optical filters arranged to respectively pass two different optical wavelength components of light to said first and second camera heads;

first and second integrator means respectively connected to said first and second control units for integrating the outputs thereof;

first and second analog-to-digital converter means respectively connected to said first and second integrator means for converting the outputs thereof to digital signals;

an arithmetic means operatively connected to said first and second analog-to-digital converter means;

analog signal generating means for controlling said first and second control units;

said arithmetic means determining the temperature on the surface of said object to be measure based on the ratio of the magnitude of said two different wavelength components of light.

11. A temperature pattern measuring device comprising:

first and second image pickup devices, each comprising a camera head operatively connected to a control unit;

first and second optical filters respectively provided along a light path extending from an object whose temperature pattern is to be measured to said first and second camera heads, said first and second optical filters arranged to respectively pass two different optical wavelength components of light to said first and second camera heads;

first and second integrator means respectively connected to said first and second control units for integrating the outputs thereof;

first and second analog-to-digital converter means respectively connected to said first and second integrator means for converting the outputs thereof to digital signals;

an arithmetic means including a micro-computer operatively connected to said first and second analog-to-digital converter means;

storage means operatively connected to said micro-computer for storing digital data therein;

first and second digital-to-analog converter means operatively connected respectively between said micro-computer and said first and second control units for converting digital signals from said micro-computer to analog signals for controlling said first and second control units;

a monitor means operatively connected to said micro-computer;

wherein said first and second image pickup devices are mechanically aimed at said object to be measured through at least one lens;

said arithmetic means determining the temperature on the surface of said object to be measured based on the ratio of the magnitude of said two different wavelength components of light, said arithmetic means further determining the position on the surface of said object, wherein the temperature distribution pattern of the object to be measured is obtained;

wherein said micro-computer controls said storage means and said first and second control units such that said monitor displays a graphical representation of the temperature distribution pattern of said object to be measured.