Vibrating beam rotation sensor

• US 4,381,672 A
• Filed: 03/04/1981
• Issued: 05/03/1983
• Est. Priority Date: 03/04/1981
• Status: Expired due to Fees

• Current Assignee: Siemens-Bendix Automotive Electronics LP (Siemens AG)
• Original Assignee: The Bendix Corporation (Honeywell International Inc.)
• Inventors: O'Connor, James M., Shupe, David M.
• Primary Examiner(s): Gill, James J.
• Application Number:
  US06/240,518
• Time in Patent Office: 790 Days
• Field of Search: 73/504, 73/505, 74/5, 310/25, 310/309
• US Class Current: 73/504.15
• CPC Class Codes: G01C 19/5719 using planar vibrating masses driven in a translation vibration along an axis

Abstract

A rotation sensor having a vibrating cantilever beam is disclosed herein. The sensor comprises an integral single crystal silicon cantilever beam and support structure, an oscillator circuit for generating an electrical signal vibrating the cantilever beam at or near its natural resonant frequency and a piezoresistive element formed at the base of the base of the vibrating beam. The piezoresistive element is only sensitive to the stresses induced in the beam due to the rotation of the beam about an axis parallel to its length.

Claims

1. A rotation sensor comprising:

a single crystal support structure having an axis of rotation;

an integral cantilever beam supported from said support structure for vibration only in a predetermined plane relative to said support structure and parallel to said axis of rotation, said cantilever beam having a base end attached to said support structure and a free end;

means for vibrating the free end of said cantilever beam in said predetermined plane; and

first sensor means for detecting transverse stresses at said base resisting rotation of said vibrating cantilever beam about said axis to generate a signal having a value corresponding to the rotational velocity of said support structure about said axis of rotation.

2. The rotation sensor of claim 1 wherein said means for vibrating said cantilever beam comprises:

a beam electrode disposed on a surface of said cantilever beam;

a fixed electrode supported by said support structure proximate said beam electrode; and

oscillator means for generating an oscillating electric potential between said beam electrode and said fixed electrode to produce an electrostatic force vibrating said cantilever beam.

3. The rotation sensor of claim 2 wherein said oscillator means comprises:

second sensor means for detecting the vibration of said cantilever beam to produce a signal having a frequency component corresponding to the vibration frequency of the cantilever beam; and

amplifier means for amplifying the signal generated by said second sensor to generate said oscillating electric potential between said beam and fixed electrode.

4. The rotation sensor of claim 1 wherein said single crystal material is single crystal silicon.

5. The rotation sensor of claim 4 wherein said single crystal silicon has a 001 crystallagraphic axis parallel to said axes of rotation and a 110 crystallographic axis normal to said 001 axis.

6. The rotation sensor of claim 5 wherein said cantilever beam has a rectangular configuration, said 110 crystallographic axis is parallel to one surface of said cantilever beam.

7. The rotation sensor of claim 6 wherein said one surface is normal to the cantilever beams plane of vibration.

8. The rotation sensor of claim 6 or 7 wherein said first sensor means is a p-type piezoresistive element formed on said one surface of said cantilever beam adjacent to said base end, said piezoresistive element having an axis parallel to said 110 crystallographic axis.

9. The rotation sensor of claim 7 wherein said first sensor means comprises:

a p-type piezoresistive element formed in said one surface adjacent to said base end, said piezoresistive element having an axis parallel to said 110 crystallographic axis, and

first amplifier circuit means formed in the surface of said support structure and connected to said piezoresistive element for generating an output signal having a value indicative of the resistance value of said piezoresistive element.

10. The rotation sensor of claim 9 wherein said means for vibrating said cantilever beam comprises:

a beam electrode disposed the surface of said cantilever beam opposite said one surface;

a fixed electrode regidly supported by said support structure proximate said beam electrode; and

oscillator means for generating an oscillating electric potential between said beam electrode and said fixed electrode to produce an electrostatic force vibrating said beam.

11. The rotation sensor of claim 10 wherein said oscillator means comprises:

a second piezoresistive element formed on the surface of said cantilever beam adjacent to its base end, said second piezoresistive having a resistance value oscillating in response to the vibration of said cantilever beam; and

an integrated oscillator circuit formed on the surface of said support structure, said integrated oscillator circuit generating said oscillating electric potential between said beam electrode and said fixed electrode in response to the oscillating resistance value of said second piezoresistive element.

12. The rotation sensor of claim 10 further including phase detector means for detecting the phase relationship between said oscillator means and the output of said first amplifier circuit means to generate a signal indicating the direction of rotation of said support structure.

13. The rotation sensor of claims 10 or 12 further including integrator means for integrating the output of said first amplifier circuit means to generate a displacement signal indicative of the total angular displacement of said support structure from a predetermined position.

14. The rotation sensor of claims 10 or 12 further including differentiator means for differentiating the output of said first amplifier means to generate an acceleration signal indicative of the angular acceleration of said support structure.

15. The rotation sensor of claims 10 or 12 further including:

integrator means for integrating the output of said first amplifier circuit means to generate a displacement signal indicative of the total angular displacement of said support structure from a predetermined position; and

differentiator means for differentiating the output of said first amplifier means to generate an acceleration signal indicative of the angular acceleration of said support structure.

16. The rotation sensor of claim 5 wherein said means for vibrating said cantilever beam comprises:

a beam electrode disposed on a surface of said cantilever beam;

a fixed electrode rigidly supported from said support structure proximate said beam electrode; and

oscillator means for generating an oscillating electric potential between said beam and fixed electrodes to produce an electrostatic force vibrating said cantilever beam.

17. The rotation sensor of claim 16 wherein said oscillator means comprises:

second sensor means for detecting the vibration of said cantilever beam to generate an output signal having a frequency corresponding to the vibrating frequency of the cantilever beams; and

second amplifier means for amplifying said output signal to generate said oscillating electric potential.

18. The rotation sensor of claim 17 wherein said second sensor means is a second piezoresistive element formed on the surface of said cantilever beam adjacent to its base end and said amplifier is an integrated circuit formed on the surface of said support structure.

19. The rotation sensor of claim 18 wherein said second piezoresistive element has its axis parallel to the 001 crystallographic axis of said integral structure.

20. The rotation sensor of claim 1 further including phase detector means for detecting the phase relationship between said vibrating cantilever beam and the signal generated by said first sensor to generate a signal indicating the direction of rotation of said support structure.

21. The rotation sensor of claims 1 or 20 further including integrator means for integrating the signal generated by said first sensor means to generate a displacement signal indicative of the total angular displacement of said support structure from a predetermined position.

22. The rotation sensor of claims 1 or 20 further including differentiator means for differentiating the signal generated by said first sensor to generate an acceleration signal indicative of the angular acceleration of said support structure.

23. The rotation sensor of claims 1 or 20 further including:

integrator means for integrating the signal generated by said first sensor to generate a displacement signal indicative of the total angular displacement of said support structure from a predetermined position; and

differentiator means for differentiating the signal generated by said first detector to generate an acceleration signal indicative of the angular acceleration of said support structure.

24. A micromechanical angular rate sensor comprising:

an integral single crystal support structure and cantilever beam, said cantilever beam supported from said support structure parallel to an axis of rotation;

means for vibrating said cantilever beam in a plane parallel to said axis of rotation; and

first sensor means for detecting the stresses at the base of said cantilever beam in a plane normal to said axis of rotation to generate a rate signal indicative of the rotation of said support structure about said axis of rotation.

25. The angular rate sensor of claim 24 wherein said single crystal is single crystal silicon.

26. The angular rate sensor of claim 25 wherein said single crystal silicon a 001 crystallographic axis parallel to said axis of rotation and a 110 crystallographic axis normal to said 001 axis;

and

said sensor means is a p-type piezoresistive element formed on said cantilever beam adjacent to said support structure, said piezoresistive element having an axis parallel to said 110 crystallographic axis.

27. The angular rate sensor of claim 26 further including first amplifier circuit means formed on the surface of said support structure and connected to said piezoresistive element for generating an output signal having a value indicative of the resistance value of said piezoresistive element.

28. The angular rate sensor of claim 26 wherein said means for vibrating said cantilever beam comprises:

a beam electrode disposed on a surface of said cantilever beam;

a fixed electrode supported by said support structure proximate said beam electrode; and

oscillator means for generating an oscillating electric potential between said beam electrode and said fixed electrode to produce an electrostatic force vibrating said cantilever beam.

29. The angular rate sensor of claim 28 wherein said oscillator means comprises:

second sensor means for detecting the vibration of said cantilever beam to generate an output signal having a frequency corresponding to the vibrating frequency of the cantilever beams; and

second amplifier means for amplifying said output signal to generate said oscillating electric potential.

30. The angular rate sensor of claim 29 wherein said second sensor means is a second piezoresistive element formed on the surface of said cantilever beam adjacent to said support structure and said amplifier is an integrated circuit formed on the surface of said support structure.

31. The angular rate sensor of claim 29 further including phase detector means for detecting the phase relationship between the output signals of said first and second amplifiers to generate a direction signal indicating the direction the support structure is rotating with respect to axis.

32. The angular rate sensor of claim 31 further including integrator means for integrating the output of said first amplifier with respect to time to generate a displacement signal indicative of the total angular displacement of said support structure from a predetermined position.

33. The angular rate sensor of claim 31 or 32 further including a differentiator circuit for differentiating the output of said first amplifier with respect to time to generate a signal indicative of the angular acceleration of sid support structure.

34. A method for sensing a rotation comprising the steps of:

vibrating a single crystal silicon cantilever beam in a predetermined plane relative to a support structure; and

detecting the stress induced in said cantilever beam resisting the displacement of said vibrating beam from said predetermined plane due to a rotation of said support structure to generate a rate signal having a value proportional to the rate of rotation.

35. The method of claim 34 wherein the 001 crystallographic axis of said single crystal silicon is parallel to the length of said cantilever beam and said 110 crystallographic axis is normal to said beam, said step of vibrating vibrates said beam in a plane normal to said 110 crystallographic axis and said step of detecting includes detecting with a piezoresistive element formed on the surface of said cantilever beam with its length parallel to said 110 crystallographic axis to generate said rate signal having a value proportional to the stress induced in said cantilever beam due to a rotation about an axis parallel to said 001 crystallographic axis.

36. The method of claim 35 wherein said step of detecting further includes converting the changes in the resistance value of said piezoresistive element due to said rotation to generate an electrical rate signal having a value proportional to the rate of rotation.

37. The method of claim 36 wherein said step of vibrating comprises:

generating an oscillating electrical signal;

applying said oscillating signal between a fixed electrode and an electrode disposed on said cantilever beam to generate an electric field therebetween and produce an electrostatic force vibrating said beam.

38. The method of claim 37 wherein said step of generating an oscillating electrical signal generates an oscillating electric signal having a frequency corresponding to the resonant frequency of said cantilever beam.

39. The method of claim 38 wherein said step of generating an oscillating field comprises the steps of:

detecting the vibration of said cantilever beam to generate an intput signal having a frequency component corresponding to the vibrating frequency of said beam; and

amplifying said input signal to generate said electrical signal.

40. The method of claim 39 wherein said step of detecting the vibration frequency of said cantilever beam comprises the steps of:

detecting with a piezoresistive element formed on the surfaces of said beam the stresses induced in said beam due to its vibration.

41. The method of claim 40 further including the step of differentiating said rate signal to generate an angular acceleration signal.

42. The method of claim 37 further including the step of comparing the phase of said electrical rate signal with said electrical signal to generate a phase signal indicative of the direction of rotation.

43. The method of claims 40 or 42 further including the step of integrating said rate signal to generate a displacement signal indicative of the angle through which the vibrating cantilever beam was rotated.