Phase linear interferometer system and method

• US 4,387,376 A
• Filed: 11/17/1980
• Issued: 06/07/1983
• Est. Priority Date: 11/17/1980
• Status: Expired due to Term

• Current Assignee: United States Of America As Represented By The Secretary Of The Army (Government of the United States of America)
• Original Assignee: The United States Of America As Represented By The Secretary Of The Army
• Inventors: Travers, Douglas N., Martin, Paul E., Sherrill, William M.
• Primary Examiner(s): Blum, Theodore M.
• Application Number:
  US06/207,487
• Time in Patent Office: 932 Days
• Field of Search: 343/117 A, 343/113 R
• US Class Current: 342/424
• CPC Class Codes: G01S 3/46 using antennas spaced apart and measuring phase or time difference between signals therefrom, i.e. path-difference systems

Abstract

A radio interferometer system and method for obtaining more accurate readings from a radio source by processing the received signal as a plane wave and establishing coincidence locations and conditions, and discarding readings which are noncoincidence within a selected tolerance.

Claims

1. A phase linear interferometer system comprising:

at least four antennas for receiving signals from a source, said antennas being linearly positioned at preselected points to form a baseline array such that;

the first and second antennas form a short baseline;

the first and third antennas form an intermediate baseline; and

the first and fourth antennas form a long baseline;

said short and said intermediate baselines forming a first interferometer and said short and said long baselines forming a second interferometer;

processor means connected to each of said antennas for measuring and processing the phase of said received signals, said processor means including means for combining said phase signals within each of said interferometers and providing an output phase from each of said interferometers of all of said signals which are phase linear;

comparison means connected to said processor means for comparing the scaled phase of said first interferometer with the measured phase of said second interferometer to determine the relative coincidence of the output phases; and

output means connected to said comparison means for discarding output phase signals exceeding a given tolerance range of coincidence.

2. A phase linear interferometer system according to claim 1 wherein said short baseline produces a radio path length difference not greater than one wavelength of the operating frequency.

3. A phase linear interferometer system according to claim 2 further comprising:

at least three additional antennas;

said three additional antennas being linearly positioned at preselected points and combining to form a second baseline array of at least four antennas with said first antenna means;

said second baseline array being angularly offset from said first baseline;

said second baseline array being connected to means substantially similar to those of said first baseline array for producing substantially similar results from a second output means; and

means connected to the output means of each of said baselines for correlating said output phase signals to provide the angle of arrival of said source signals.

4. A phase linear interferometer system according to claim 3 wherein said first and second baselines are angularly positioned to form a right angle.

5. In a phase linear interferometer system including at least four antennas positioned along a baseline array such that:

the first and second antennas form a short baseline,

the first and third antenna means form an intermediate baseline, and

the first and fourth antenna means form a long baseline,

the method of processing signals comprising the steps of;

receiving signals at each antenna on the baseline array and determining the signal phase at each of said antennas;

determining the relative phase along the short baseline;

determining the relative phase along the intermediate baseline and discarding the phase data which is not phase linear with that of the short baseline;

determining the relative phase along the long baseline and discarding phase data which is not phase linear with that of the short baseline;

scaling the measured phase from the intermediate baseline by the aperture ratio of the long baseline to the intermediate baseline to provide a calculated phase for the long baseline;

comparing the calculated phase to the measured phase for the long baseline and discarding the data if beyond a given tolerance.

6. The method recited in claim 5 further comprising:

repeating the procedure of claim 5 for a second baseline array positioned at an angle with respect to the first baseline array;

using the angles from the two baselines to determine the angle of approach of the signal.