Gas detector

• US 4,399,686 A
• Filed: 02/05/1981
• Issued: 08/23/1983
• Est. Priority Date: 02/21/1980
• Status: Expired due to Fees

• Current Assignee: Gambro Engstrom AB
• Original Assignee: Engstrom Medical AB
• Inventors: Lundstrom, Kurt I., Kindlund, Alf R.
• Primary Examiner(s): Kreitman, Stephen A.
• Application Number:
  US06/231,942
• Time in Patent Office: 929 Days
• Field of Search: 73/23, 422/88, 422/98, 128/719
• US Class Current: 73/24.06
• CPC Class Codes: G01N 2291/0256 Adsorption, desorption, surface mass change, e.g. on biosensors
• CPC Class Codes: G01N 29/036 by measuring frequency or resonance of acoustic waves

Abstract

An apparatus for detecting and measuring the presence and the concentration, respectively, of halogenated hydrocarbons, in particular anaesthetic gases, as halothane, enfluorane, metoxyfluorane and isofluorane, in a mixture of gases comprises a piezoelectric crystal, which has its surface coated with a thin layer of a substrate and which is so arranged that the substrate layer can be brought into contact with the gas mixture. The crystal is coupled to an oscillator circuit which is connected to means for measuring changes in the oscillating frequency of the crystal and thus also of the oscillator circuit caused by adsorption by the substrate layer of the gas component to be detected. The substrate layer comprises a silicone oil having a structural formula comprising large branch chains or pendant blocks. Preferably a silicone oil is used comprising a silicone glycol copolymer.

Claims

1. An apparatus for detecting the presence of anaesthetic gases selected from the group consisting of halothane, enfluorance, metoxyfluorane and isofluorane in a mixture of gases, comprising a thin layer of a substrate coated on the surface of a carrier body in such manner that the gas mixture can be brought into contact with the substrate layer, and means for measuring a physical property of said substrate layer which is affected by the amount of gaseous components being adsorbed by the substrate layer, said substrate layer comprising a silicone glycol copolymer.

2. An apparatus as claimed in claim 1, wherein said silicone glycol copolymer has the general structural formula ##STR2##

3. An apparatus as claimed in claim 1, wherein said silicone glycol polymer is a random rake copolymer of a trimethylsilylterminated polydimethylsiloxane with pendant silicone-carbon linked blocks of acetate-capped poly-(propylene oxide-ethylene oxide).

4. An apparatus as claimed in claim 1, wherein said silicone glycol polymer is a random rake copolymer of a trimethylsilylterminated polydimethylsiloxane with pendant silicone-carbon linked blocks of hydroxy-terminated poly-(ethylene oxide).

5. An apparatus as claimed in claim 1, wherein said carrier body is a piezoelectric crystal and said measuring means include an oscillator circuit connected to said crystal and means for measuring changes in the oscillating frequency of said oscillator circuit.

6. An apparatus as claimed in claim 5, wherein said measuring means include a second, identical piezoelectrical crystal without any substrate layer, said second crystal being connected to a second, identical oscillator circuit, and circuit means for detecting the frequency difference between the oscillating frequencies of said first and second oscillator circuits.

7. An apparatus as claimed in claim 6, wherein said two crystals are mounted in a common housing designed for permitting a flow of the gas mixture to be analyzed to pass therethrough and in which housing said two crystals are mounted with their side surfaces parallel to the direction of flow of the gas mixture and mutually symmetrically on opposite sides of a symmetry plane through said gas flow.