Column defect compensating apparatus for CCD image sensor

• US 4,400,734 A
• Filed: 10/28/1981
• Issued: 08/23/1983
• Est. Priority Date: 10/28/1981
• Status: Expired due to Fees

• Current Assignee: Eastman Kodak Company
• Original Assignee: Eastman Kodak Company
• Inventors: Davy, Lee N.
• Primary Examiner(s): Martin, John C.
• Application Number:
  US06/315,762
• Time in Patent Office: 664 Days
• Field of Search: 357/24 LR, 357/30, 358/213, 358/212, 358/163, 358/167, 307/221 D
• US Class Current: 348/616
• CPC Class Codes: H04N 25/63 applied to dark current

Abstract

Column defect compensating apparatus for a charge coupled device (CCD) image sensor of the type having a two-dimensional array comprising rows and columns of charge transfer elements, and an output CCD shift register arranged across one end of the columns includes an auxiliary shift register clocked in synchronism with the output shift register, and containing information representing the location of defective columns in the two-dimensional array. A signal processing circuit responsive to the output of the auxiliary shift register processes the output of the array to compensate for the column defects. In a preferred embodiment of the invention, the auxiliary shift register is a CCD shift register, and a plurality of programable input circuits are provided for inserting, in parallel, into the auxiliary CCD shift register, signals representing the condition of the columns of the array. The programable input circuits include input diodes disposed adjacent the cells of the auxiliary shift register for providing a source of signal charge, input gates disposed between the diodes and the respective cells of the auxiliary shift register for selectively isolating the diodes from the cells, and selectively destructible conductors for controlling the transfer of charge from the diodes past the input gates.

Claims

1. Column defect compensating apparatus for a charge coupled device (CCD) image sensor of the type having a two-dimensional array comprising rows and columns of charge transfer elements, and an output CCD shift register arranged across one end of the columns and adapted to receive in parallel, one row of charge packets and to deliver the charge packets serially under control of clock signals to an output location, the column defect compensating apparatus comprising:

auxiliary CCD shift register means having a plurality of cells corresponding to the columns of the two-dimensional array for producing signals representing the condition of said columns;

means for applying said clock signals to said auxiliary shift register means to produce said condition representative signals in synchronism with the delivery of the charge packets in the output shift register to the output location;

programable input means for inserting, in parallel, into said auxiliary shift register, signals representing the condition of the columns of the array;

said programable input means comprising (1) diode means disposed adjacent said cells of said auxiliary shift register for providing a source of signal charge, (2) gate means disposed between said diode means and said cells for selectively isolating said diode means from said cells, and (3) selectively destructible conductor means for controlling the transfer of charge from said diode means past said gate to said cells; and

signal processing circuit means responsive to the signals the said auxiliary shift register for compensating for the column defects in the output of the image sensor.

2. The invention claimed in claim 1 wherein said selectively destructible conductor means comprises a first conductor connected to said gate means and adapted to be connected to a fixed potential and a second conductor connected to said gate means and adapted to be connected to a clocking signal.

3. The invention claimed in claim 1 wherein said selectively destructible conductor means comprises conductor means connected to said diode.