Correction method and device for a magnetic field probe

• US 4,416,067 A
• Filed: 05/13/1982
• Issued: 11/22/1983
• Est. Priority Date: 06/11/1981
• Status: Expired due to Fees

• Current Assignee: Siemens AG
• Original Assignee: Siemens AG
• Inventors: Thilo, Peer, Scherer, Hartmut
• Primary Examiner(s): Little, Willis
• Application Number:
  US06/378,020
• Time in Patent Office: 558 Days
• Field of Search: 33/356, 33/355 R, 33/357, 33/361, 33/362, 33/363 Q, 33/301, 33/363 A
• US Class Current: 33/356
• CPC Class Codes: G01C 17/38 Testing, calibrating, or compensating of compasses
• CPC Class Codes: G01R 33/025 Compensating stray fields G01R33/0017 takes precedence

Abstract

In a correction system for a magnetic field probe, the probe is first moved in a circle for calibration such that respective maximum and minimum values of a measured magnetic field vector or a respective component thereof is determined. By means of a sum formation and halving of the respective maximum and minimum value, a respective additive correction value is derived which is added to the respective measured values during navigation with the magnetic field probe. By so doing, a noise vector superimposed on the external magnetic field is eliminated.

Claims

1. A correction system for a magnetic field probe which measures an external magnetic field in terms of magnitude and direction, and wherein the probe is moved in a circle before a beginning of the measurement, comprising:

means for determining maximum and minimum values of a magnetic field vector relative to the probe by continuous measurement of said magnetic field vector during the circular movement;

means for forming a correction vector from a halved vector sum of said maximum and minimum values;

means for vectorally adding the correction vector to the respective measured values of the probe during the continuous measurement;

the magnetic field probe being followed by an evaluation circuit whose output is selectively connected over a changeover means to a calibration means or to a measuring unit having a display device connected thereto;

and a correction value memory being provided whose input is connected to the calibration means and its output is connected to the measuring unit.

2. A system according to claim 1 wherein the calibration means has comparison means for determining the maximum and minimum values, adders following the comparison means, dividers following said adders, and outputs of said dividers being supplied to the correction value memory.

3. A system according to claim 2 wherein each comparison means has threshold switch means both for positive as well as for negative values back-coupled over intermediate memories, and said threshold switch means are respectively followed by an absolute value formation stage as well as by a respective memory means for the respective maximum or minimum value.

4. A system according to claim 1 wherein in adder means is provided in the measuring installation for addition or additive correction values supplied from the correction value memory to the respective measured values.

5. A system according to claim 1 wherein a multiplier means is provided in the measuring unit for multiplying measured values of a magnetic field component by a correction factor supplied from the correction value memory.

6. A system according to claim 4 wherein the adder means is followed by a divider, a trigonometric converter, and a display means.

7. A system according to claim 4 wherein the multiplier means is followed by a divider, a trigonometric converter, and a display means.

8. A system according to claim 6 wherein an output of the trogonometric converter is supplied in common with an output of a path sensor to a display means over an integrator.