Visual defect inspection of masks

• US 4,432,641 A
• Filed: 10/16/1981
• Issued: 02/21/1984
• Est. Priority Date: 10/16/1981
• Status: Expired due to Fees

• Current Assignee: RCA Corporation
• Original Assignee: RCA Corporation
• Inventors: Caprari, Fausto, Geshner, Robert A.
• Primary Examiner(s): McGraw, Vincent P.
• Assistant Examiner(s): Dietert, L. A.
• Application Number:
  US06/312,277
• Time in Patent Office: 858 Days
• Field of Search: 350/235, 350/236, 350/237, 350/523, 356/237, 356/429, 356/430, 353/38 (U.S. only), 353/102, 362/268
• US Class Current: 356/237.5
• CPC Class Codes: G01N 21/8803 Visual inspection measuring projectors G01B9/08

Abstract

An optical system and method for direct human eye visual inspection of specimens of photoresist coated masks for defects as small as 2 μm. The specimens are uniformly illuminated with a partially coherent sodium light that has very high illuminance and constrast levels. The system consists of a high pressure (1-1.5 atmosphere) sodium lamp source projected onto the specimen by a Kohler-type illumination system.

Claims

1. A method for visually inspecting specimens of photoresist coated masks having a sensitivity to radiation in the blue and ultra-violet wave length spectrum, comprising:

(a) generating an elongated light source of sodium light said source of light being substantially free of radiation in the blue and ultra-violet wave length spectrum;

(b) focusing said source in a Kohler-type illumination system within the exit pupil thereof;

(b1) said Kohler-type illumination system having at least three lens elements, comprising two contiguous input lens elements and spaced therefrom one output lens element, wherein an aerial surface of uniform illuminance is located between said three lens elements and the source, an entrance pupil plane is located at the input side of the output lens element, and an image surface plane is located at the output side of said output lens element;

(c) imaging said light source as an aerial image within the exit pupil of said lens system at an aerial surface that is a conjugate of said light source; and

(d) projecting a substantially uniform illuminance field on a specimen positioned at a plane that is conjugate to said aerial surface of uniform illuminance with sufficiently high contrast levels and illuminance levels to detect with the human eye defects as small as 2 μ

m by scattering light from said defects.

5. A method according to claim 1, wherein said beam of light source is partially coherent by providing a reduced image of the source that is smaller than the entrance pupil of the illumination system.

2. An optical system for visual inspections of specimens of photoresist coated masks having a sensitivity to radiation in the blue and ultra-violet wave length spectrum comprising:

(a) a light source consisting of a predetermined length of an elongated sodium arc oriented perpendicularly to the optical axis of the system said source of light being substantially free of radiation in the blue and ultra-violet wavelength spectrum;

(b) a Kohler-type illuminating system for projecting a uniform field of illuminance onto a specimen plane located in the image plane of said system;

(bi) said Kohler-type system comprising a pair of plano-convex positive lens elements positioned along said optical axis proximate to an aerial surface of uniform illuminance, and a single plano-convex lens element positioned on said optical axis remote from said aerial illuminance surface;

(bii) the aerial illuminance surface of said system being located between said pair of lens elements and said source, and the plane of the entrance pupil of said lens system lying between said pair of said adjacent lenses and single lens elements;

(biii) said system being positioned between said source and specimen plane and arranged to provide a conjugate image of said light source between said single lens element and said specimen plane that is smaller in diameter than both said sodium arc length and said entrance pupil diameter;

whereby a specimen positioned at said specimen plane is uniformly illuminated at significantly high contrast levels and high illuminance levels so that defects to at least 2 μ

m in diameter on said specimen are easily detected by direct human eye inspection.

3. A system according to claim 2, wherein said sodium lamp source is a 100 watt lamp that provides 95 lumens per watt, having an elongated arc of approximately 2" (5 cm) long.

4. A system according to claim 3, wherein said specimen is about 91/2" (24 cm) in diameter and is spaced 10" (25 cm) from said single lens.