Optical measurement system for spectral analysis

• US 4,433,238 A
• Filed: 10/19/1981
• Issued: 02/21/1984
• Est. Priority Date: 10/21/1980
• Status: Expired due to Fees

• Current Assignee: Asea Aktiebolag (ABB Limited)
• Original Assignee: Asea Aktiebolag (ABB Limited)
• Inventors: Brogardh, Torgny, Adolfsson, Morgan, Goransson, Sture, Ovren, Christer
• Primary Examiner(s): Nelms, David C.
• Assistant Examiner(s): Brophy, J. J.
• Application Number:
  US06/312,750
• Time in Patent Office: 855 Days
• Field of Search: 250/227, 250/226, 250/231 R, 350/96.15, 356/418
• US Class Current: 250/227.23
• CPC Class Codes: G01D 5/268 using optical fibres G01D5/28 - G01D5/38 take precedence
• CPC Class Codes: G01K 11/12 using changes in colour, translucency or reflectance
• CPC Class Codes: G01L 11/02 by optical means

Abstract

The invention relates to an optical measuring device for measuring physical or chemical quantities which device employs at least one light source, such as a light-emitting diode, in optical connection with a sensor, the spectral properties of which (e.g. the absorption or luminescence spectrum) are adapted to be changed by the quantity being measured, and at least one light detector (e.g. a photo-diode or a photo-transistor) for receiving the output signal from the sensor. The invention is characterized in that the measuring signal is adapted to be obtained by spectral analysis, and that this spectral analysis is adapted to be performed by varying the spectral distribution of the light source (the light-emitting diode) or maintaining said distribution constant, and/or by varying the sensitivity spectrum of the light detector or maintaining said spectrum constant, and that this control of the emission spectrum and the sensitivity spectrum is adapted to be carried out by a periodic controlling of the temperature of the light source and of the light detector, respectively.

Claims

1. An optical measuring device for measuring at least one parameter of an object at a given location, which device comprises:

a source of incident light which incident light, during a parameter-measuring operation, has a given spectral distribution,

a sensor adapted to be positioned at said given location and to emit output light when irradiated by said incident light, the spectral response of said output light to said incident light during a parameter-measuring operation being changed by a change in the parameter to be measured,

a light detector adapted to generate an output measuring signal when irradiated, during a parameter-measuring operation, with said output light from said sensor,

optical means for transmitting incident light to said sensor and transmitting output light from said sensor to said light detector, and

electronic means for sensing and controlling the temperatures of the light source and the light detector in intervals when the parameter-measuring operation is discontinued.

2. A measuring device according to claim 1, wherein the light detector includes an optical filter in thermal contact with the detector, the transmission curve of which filter is temperature-dependent.

3. A measuring device according to claim 2, in which the light detector is a semiconductor photo-diode and the filter consists of a layer of a semiconductor material applied directly on the photo-diode.

4. A measuring device according to claim 1, in which said electronic means for control of the temperature of the light source and the light detector comprises means to measure a temperature-dependent parameter of the light source and the light detector, respectively, and to adjust the current flowing through the respective light source and light detector between the parameter-measuring intervals to maintain the light source and the light detector at the desired temperatures.

5. A measuring device according to claim 4, in which the electronic means controls the respective current (I) through the light source and the light detector in such a way that U/lnI, where U is the voltage across the respective device, is maintained equal to a desired value.

6. A measuring device according to claim 5, in which the electronic means is employed to modify the temperature of at least one of the light source and the light detector to facilitate spectral analysis of said output light.

7. A measuring device according to claim 1, 4 or 5, in which the electronic means is adapted to measure the temperature of the light source and the light detector, and further including means to adjust the measured temperatures thereof and to measure the spectral properties of the output light from the sensor in sequentially repeated time intervals.

8. A measuring device according to claim 1, 4 or 5, in which the electronic means effects the temperature adjustment of the light source and the light detector by generating current pulses fed to the respective device, the energy of which current pulses depends on the deviation between measured temperature and the desired value of the temperature of the respective device.

9. A measuring device according to claim 8, in which the electronic means is adapted to effect a temperature adjustment only when the difference between the actual and the desired value of the temperature of the light source or the light detector exceeds a certain level.

10. A measuring device according to claim 1, further comprising a separate temperature control device in thermal contact with the light source and the light detector, respectively.

11. A measuring device according to claim 4, further comprising means to control the current through at least one of the light source and the light detector in such a way that the temperature thereof coincides with the desired values.

12. A measuring device according to claim 10, in which means is provided to control the current through each said temperature control device such that the temperature of the light source and the light detector coincides with the respective desired value thereof.

13. A measuring device according to claim 1, wherein said electronic means further includes means to carry out a spectral analysis on the output light by effecting measurements in two non-identical wavelength ranges

by maintaining the emission spectrum of the light source constant and changing the sensitivity spectrum of the light detector.

14. A measuring device according to claim 1, wherein said electronic means further includes means to carry out a spectral analysis on the output light by effecting measurements in two non-identical wavelength ranges by changing the emission spectrum of the light source and maintaining the sensitivity spectrum of the light detector constant.

15. A measuring device according to claim 1, wherein said electronic means further includes means to carry out a spectral analysis on the output light by effecting measurements in two non-identical wavelength ranges by changing both the emission spectrum of the light source and the sensitivity spectrum of the light detector.

16. A measuring device according to claim 13, 14 or 15 wherein said electronic means further includes means for generating an output measuring signal from the quotient of the measuring signals within each of said wavelength ranges.

17. A measuring device according to claim 13, 14 or 15 wherein said electronic means further includes a variable gain amplifier for maintaining a measuring signal output obtained from one of said wavelength ranges constant and means for generating an output measuring signal from the quotient of the measuring output signal generated from each of said wavelength ranges.

18. A measuring device according to claim 10, wherein said source of incident light includes a thermoelectric cooler to cool the light source to improve the regulating properties at a lower working temperature.

19. A measuring device according to claim 10, wherein said light detector further includes a thermoelectric cooler to cool the light detector to improve the regulating properties at a lower working temperature.

20. A measuring device according to claim 1, wherein said electronic means further includes means for generating currents of a different modulating frequency than the currents used in a parameter measuring operation for temperature stabilization of the light source and the light detector.