Charge coupled device based blemish detection system and method

• US 4,454,541 A
• Filed: 06/14/1982
• Issued: 06/12/1984
• Est. Priority Date: 06/14/1982
• Status: Expired due to Term

• Current Assignee: RCA Corporation
• Original Assignee: RCA Corporation
• Inventors: Duschl, Robert A.
• Primary Examiner(s): Britton, Howard W.
• Application Number:
  US06/388,038
• Time in Patent Office: 729 Days
• Field of Search: 358/106, 358/107, 358/214, 358/10, 358/139
• US Class Current: 348/125
• CPC Class Codes: G01N 2021/8877 Proximity analysis, local statistics
• CPC Class Codes: G01N 21/88 Investigating the presence of flaws or contamination

Abstract

A system for detecting blemishes on an illuminted object, such as the screen of a kinescope, includes a charge coupled device (CCD). The signal from each CCD pixel is compared with the average of the signals of all pixels immediately adjacent to the pixel being investigated to provide a difference signal. The difference signal is compared to a threshold level and a blemish signal generated when the difference signal exceeds the threshold.

Claims

1. A system for detecting blemishes on an illuminated object comprising:

a digital storage device;

a charge coupled device (CCD);

output circuitry for transferring data from said CCD to said digital storage device, whereby the data from each pixel of said CCD is stored at a specific address within said digital storage device;

means for averaging the signals from the adjacent pixels surrounding a particular pixel and providing an average signal;

address generator means for providing the address of the square area containing said adjacent pixels to said digital storage device to transfer the signals from said adjacent pixels to said means for averaging;

means for receiving the particular signal from said particular pixel;

means for receiving said average signal and said particular signal and providing a difference signal representative of the difference between said average signal and said particular signal;

means for providing a threshold signal representative of the permissible maximum of said difference signal; and

comparator means for receiving said difference signal and said threshold signal and providing a blemish signal when said difference signal exceeds said threshold signal.

2. The system of claim 1 further including memory means responsive to said address generator means and to said comparator means for storing the address of said particular pixel when said blemish signal is generated.

3. The system of claim 2 wherein said means for averaging includes means for summing said signals from said adjacent pixels and means for dividing said sum by eight.

4. The system of claim 1 or 2 or 3 wherein said illuminated object is a kinescope and wherein digital storage device provides an output for generating a white field on said kinescope screen prior to receiving data from said CCD.

5. A method for detecting blemishes on an illuminated object comprising the steps of:

generating an illuminated field on the screen of said object;

imaging said field with a CCD and transferring the CCD data to a digital storage device wherein the data from each pixel of said CCD is stored at a different address;

averaging the data from the immediately adjacent pixels surrounding a particular pixel to obtain an average signal;

taking the difference between the data from said particular pixel and said average signal to obtain a difference signal;

comparing said difference signal to a threshold signal and providing a blemish signal when said difference signal exceeds said threshold; and

providing said blemish signal to a memory to store the address of said particular pixel whereby the location of the blemish which caused said blemish signal is known.

6. The method of claim 5 wherein said object is the screen of a kinescope and said illuminated field is a white field on the screen of said kinescope, and wherein there are eight of said adjacent pixels.

7. The method of claim 5 or 6 further including the step of ignoring the data from the pixels contained in peripheral rows and columns of said CCD.