Charge coupled device based inspection system and method

• US 4,454,545 A
• Filed: 06/14/1982
• Issued: 06/12/1984
• Est. Priority Date: 06/14/1982
• Status: Expired due to Fees

• Current Assignee: RCA Corporation (General Electric Company)
• Original Assignee: RCA Corporation (General Electric Company)
• Inventors: Duschl, Robert A.
• Primary Examiner(s): Britton, Howard W.
• Application Number:
  US06/388,143
• Time in Patent Office: 729 Days
• Field of Search: 358/106, 358/107, 358/213, 358/10, 358/139
• US Class Current: 348/312
• CPC Class Codes: H04N 25/00 Circuitry of solid-state image sensors [SSIS]; Control thereof

Abstract

An inspection system utilizing a CCD includes a CCD data transfer generator which allows the changing of the CCD without redesigning the system. The numbers of horizontal rows and vertical columns of pixels of the CCD are set into a digital memory and into a waveform generator. The waveform generator provides horizontal scanning and vertical scanning waveforms in accordance with the row and column settings whereby the CCD can be replaced with a different size CCD and new numbers set into the memory and waveform generator.

Claims

1. In an inspection system including a charge coupled device (CCD) having pixels arranged in horizontal rows and vertical columns and a storage device for storing digital information transferred from said CCD;

an improvement for transferring data from said CCD to said storage device comprising;

memory means for storing the number of horizontal rows of pixels and the number of vertical columns of pixels of said CCD;

first means for selectively setting said number of rows of pixels into said memory means;

second means for selectively setting said number of columns of pixels into said memory means; and

waveform generator means responsive to said memory means for transferring data from said CCD to said storage device in accordance with the numbers of rows and columns set in said memory means whereby different sizes of CCDs can be used in said system by changing the settings on said first and second means for setting.

2. The inspection system of claim 1 wherein said first and second means for setting respectively include first and second counters for setting the number of horizontal rows and vertical columns into said memory means.

3. The inspection system of claim 2 wherein said first and second means for setting further include first and second select switches for respectively setting said first and second counters.

4. The inspection system of claim 3 further including an address counter responsive to said memory means for triggering said waveform generator.

5. The inspection system of claim 4 wherein said control memory simultaneously triggers said waveform generator means and one of said counters.

6. The inspection system of claim 1 or 5 wherein said waveform generator means is a programmable memory whereby the waveforms provided by said generator are changeable.

7. The inspection system of claim 6 wherein said waveform generator includes waveform select input terminals individually responsive to said memory means whereby said memory means selects vertical and horizontal data transfer modes.

8. The inspection system of claims 1 or 3 further including third means for setting a rapid vertical scan of a portion of said CCD whereby a portion of said CCD is used for data storage and the other portion of said CCD is used imaging.

9. A method of transferring analog data to a digital storage device from a charge coupled device (CCD) having X horizontal rows of pixels and Y vertical columns of pixels wherein X and Y can be changed when said CCD is changed comprising the steps of:

setting said number of rows into a first counter and providing the output of said first counter to a control memory;

setting said number of columns into a second counter and providing the output of said second counter to said control memory;

coupling said control memory to a waveform generator to select horizontal and vertical data transfer modes to selectively make one horizontal or one vertical transfer of data in said CCD; and

triggering said control memory with said waveform generator at the end of each data transfer to select another data transfer.

10. The method of claim 9 further including the step of simultaneously triggering one of said vertical or horizontal counters and said waveform generator through an address counter.

11. The method of claim 9 or 10 further including the step setting a fast vertical count whereby a portion of said CCD serves as a data storage device and the other portion of said CCD serves as an imaging device.