Voltage and electric field measuring device using light
First Claim
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1. An electric field measuring device using light, comprising:
- a source of light;
an optical system comprising a polarizer, an electro-optic crystal, a wave plate, and an analyzer arranged in the series with one another in the path of said light, an electric field to be measured being imposed upon said electro-optic crystal, and said electro-optic crystal being made of a bismuth silicon oxide material having a cubic crystal structure; and
detector means receiving light outputted by said optical system for producing an electrical signal having a magnitude determined by a magnitude of said electric field.
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Abstract
A voltage and electric field measuring device using light as an operating parameter. An electro-optic crystal, a quarter-wave plate, and a polarization analyzer are arranged in that order in the direction of advancement of applied light. A voltage may be applied to the electro-optic crystal through electrodes arranged thereon. The electro-optic crystal belongs to a cubic system, such as bismuth silicon oxide or bismuth germanium oxide.
37 Citations
5 Claims
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1. An electric field measuring device using light, comprising:
- a source of light;
an optical system comprising a polarizer, an electro-optic crystal, a wave plate, and an analyzer arranged in the series with one another in the path of said light, an electric field to be measured being imposed upon said electro-optic crystal, and said electro-optic crystal being made of a bismuth silicon oxide material having a cubic crystal structure; and
detector means receiving light outputted by said optical system for producing an electrical signal having a magnitude determined by a magnitude of said electric field. - View Dependent Claims (2, 3, 4, 5)
- a source of light;
Specification
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Current AssigneeSumitomo Electric Industries Limited (Sumitomo Corporation)
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Original AssigneeSumitomo Electric Industries Limited (Sumitomo Corporation)
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InventorsTada, Koji, Kuhara, Yoshiki, Nanba, Hirokuni, Tatsumi, Masayoshi
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Primary Examiner(s)Karlsen, Ernest F.
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Application NumberUS06/197,432Time in Patent Office1,398 DaysField of Search324/96, 324/109, 324/457, 324/458, 350/390, 332/7.51, 455/616US Class Current324/96CPC Class CodesG01R 15/242 based on the Pockels effect...G01R 29/12 Measuring electrostatic fie...G02F 1/03 based on ceramics or electr...
