Process for inspecting and automatically sorting objects showing patterns with constant dimensional tolerances and apparatus for carrying out said process

• US 4,477,926 A
• Filed: 12/14/1981
• Issued: 10/16/1984
• Est. Priority Date: 12/18/1980
• Status: Expired due to Term

• Current Assignee: International Business Machines Corporation
• Original Assignee: International Business Machines Corporation
• Inventors: Locicero, Gisele C., Linger, Claude J. A.
• Primary Examiner(s): Martin, John C.
• Assistant Examiner(s): McDowell, Erin A.
• Application Number:
  US06/330,411
• Time in Patent Office: 1,037 Days
• Field of Search: 358/106, 364/489, 364/49, 250/562, 250/563, 382/8, 382/45, 382/51, 382/49
• US Class Current: 382/149
• CPC Class Codes: G01N 21/956 Inspecting patterns on the surface of objects contactless testing of electronic circuits G01R31/308; testing currency G07D; manufacturing processes per se of semiconductor devices implementing a measuring step H01L22/10
• CPC Class Codes: G01R 31/308 using non-ionising electromagnetic radiation, e.g. optical radiation investigating or analysing materials by the use of optical means G01N21/00; image analysis G06T7/00
• CPC Class Codes: G06T 2207/10056 Microscopic image
• CPC Class Codes: G06T 2207/30141 Printed circuit board [PCB]
• CPC Class Codes: G06T 7/001 using an image reference approach

Abstract

This invention relates to a process for inspecting and sorting objects showing patterns with constant dimensional tolerances as masks, integrated circuit chips, modules currently in use in the electronic industry. The process is based on the comparison of the image of a reference object I_ref with the image of an object to be inspected I_exa. Images I_ref and I_exa after being picked up and sampled, are thresheld to produce binary electronic images which are cleaned, then centered to allow the comparison of resulting electronic images I_REF and I_EXA to be carried out. The image processing includes the following operations: First of all constructing electronic images I_REF max and I_REF min respectively which are images I_REF expanded and eroded by a structuring element adapted to the dimensional tolerances of the object to be inspected. Then, the images of the defects of the "spreading" type and of the "lack" type are constructed by respectively carrying out the following logic operations: [I_REF max OR I_EXA ] EXC.OR I_REF max and [I_REF min OR I_EXA ] EXC.OR I_EXA. Then, the defect images are analyzed with respect to a predetermined reject criterion. At last, final sorting step is carried out. This invention also relates to an apparatus for carrying out said process. Said apparatus can comprise a digital computer for automatizing the various steps which are indicated above.

Claims

1. A process for inspecting and automatically sorting objects showing patterns provided with constant dimensional tolerances, of the type including the comparison of image I_ref of a reference object with image I_exa of an object to be inspected, wherein image I_exa being able to show geometrical defects with respect to the reference object, said process characterized in that it includes the following steps:

Step 1, processing images I_ref and I_exa to provide electronic binary images I_REF and I_EXA, respectively,

Step 2, defining a structuring element B for each image point of the said electronic binary image and adapted to the dimensional tolerances of the said object to be inspected and the construction of the electronic images I_REF max and I_REF min which consist in image I_REF expanded and eroded respectively by structuring element B,

Step 3, forming the images of the "spreading" or "lack" type defects by respectively carrying out the following logic operations;

space="preserve" listing-type="equation">[I.sub.REF max OR I.sub.EXA ] EXC. OR I.sub.REF max and

space="preserve" listing-type="equation">[I.sub.REF min OR I.sub.EXA ] EXC. OR I.sub.EXA and

Step 4, analyzing the defects with respect to a reject criterion which defines a maximum allowed size for the defects.

2. Inspecting and sorting process as set forth in claim 1 characterized in that the maximum allowed size is determined by the calculation of the horizontal and vertical projections of the defects which define an analysis window.

3. Inspecting and sorting process as set forth in claim 1, characterized in that the step 2 provided for constructing images I_REF and I_EXA comprises:

picking up images I_ref and I_exa of the reference object and of the object to be inspected, and

thresholding the images to obtain electronic binary images.

4. Inspecting and sorting process as set forth in claim 1, characterized in that the step 2 provided for constructing images I_REF and I_EXA comprises:

picking up image I_exa of the object to be inspected and thresholding this image to obtain an electronic binary image I_EXA,

directly constructing the reference object in binary mode either from a digital pattern generator or from a data bank.

5. Inspecting and sorting process as set forth in claim 3 characterized in that it further includes a step for centering electronic images I_REF and I_EXA, which corresponds to the optical centering of images I_ref and I_exa.

6. Inspecting and sorting process as set forth in claim 3 characterized in that the image picking up step provides analog images including black and white and grey levels.

7. Inspecting and sorting process as set forth in claim 6 characterized in that the picking up step further includes a step for discretizing the image to retain only a number 2^N of grey levels, N being between 2 and 6.

8. Inspecting and sorting process as set forth in claim 7 characterized in including an image point intensity frequency curve and wherein the thresholding step includes the threshold determination which is performed from the image point intensity frequency curve, said determination being carried out by using a program.

9. Inspecting and sorting process as set forth in claim 3 characterized in that it further includes a step for cleaning images I_REF and I_EXA (noise suppression), performed prior to the defect image forming step, and consisting in an erode operation, the size of the structuring element which is to erode the image being smaller than the size of the smallest defect which is to be detected, followed by an expand operation which returns the image to its size prior to said erosion.

10. Apparatus for carrying out the process for inspecting and automatically sorting objects showing patterns with constant dimensional tolerances, of the type including the comparison of image I_ref of a reference object with image I_exa of an object to be inspected, wherein image I_exa being able to show geometrical defects with respect to the reference object, characterized in that it includes:

means for processing images I_ref and I_exa to provide electronic binary images I_REF and I_EXA, respectively,

means for picking up at least image I_exa of the object to be inspected,

means for constructing binary electronic images I_REF and I_EXA,

processing means including means for constructing electronic images I_REF max and I_REF min, respectively, which are the images of I_REF expanded and eroded respectively by a previously determined structuring element B and directly linked to the dimensional tolerances of said patterns,

compare means for constructing the images of the "lack" and "spreading" type defects by performing the following logic operations;

space="preserve" listing-type="equation">[I.sub.REF max OR I.sub.EXA ] EXCL. OR I.sub.REF max and [I.sub.REF min OR I.sub.EXA ] EXCL. OR I.sub.EXA,

and means for analyzing defects with repect to predetermined reject criteria and

means for sorting and selecting the objects which are accepted.

11. Apparatus as set forth in claim 10 characterized in that pick up means are chosen from the group consisting of the electron microscopes, the TV cameras, the photodiode array and the charge coupled devices.

12. Apparatus as set forth in claim 10 characterized in that said means for constructing binary electronic images I_REF and I_EXA comprise a threshold detection and thresholding unit.

13. Apparatus as set forth in claim 10, characterized in that it further includes:

compute means for recentering electronic images I_REF and I_EXA.

14. Apparatus as set forth in claim 10 characterized in that said reject criteria are based upon the maximum allowed projections of the defect image on axis x and y, in order to check that a defect can be accepted only if it is really contained within an analysis window the sides of which correspond to said maximum projections.

15. Apparatus as set forth in claim 10 characterized in that it further includes a digital computer which controls all said means.

16. Apparatus or process as set forth in claim 10 characterized in that said objects consist of modules showing a pattern of conducting lines provided on the surface of a ceramic substrate.