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Defect analysis system

  • US 4,484,081 A
  • Filed: 03/22/1984
  • Issued: 11/20/1984
  • Est. Priority Date: 09/19/1980
  • Status: Expired due to Fees
First Claim
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1. A defect analysis system for examining a part to determine whether defects are present, said system comprising:

  • first means for obtaining electrical signals representative of the condition of a plurality of discrete picture elements in a field of view of the part presented for analysis;

    thresholding means coupled to said first means for generating a set of electrical signals indicative of picture elements of an anomalous type distinct from the other picture elements;

    region growing means for associating contiguous picture elements of the anomalous type to define multiple regions of anomalous picture elements in a single raster scan of the field of view being analyzed;

    region statistics generation means for generating statistics relative to the size, shape and orientation of the anomalous regions during the same single raster scan; and

    region analysis means for comparing the region statistics with predetermined rejection parameters to determine whether a rejectable defect exists in the part.

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