Hall effect device test circuit

• US 4,488,112 A
• Filed: 08/30/1982
• Issued: 12/11/1984
• Est. Priority Date: 08/30/1982
• Status: Expired due to Fees

• Current Assignee: AG Communication Systems Corp. (Nokia Corporation)
• Original Assignee: GTE Automatic Electric Incorporated
• Inventors: Thompson, Robert, van Husen, Hendrik W.
• Primary Examiner(s): Levy, Stewart J.
• Application Number:
  US06/412,758
• Time in Patent Office: 834 Days
• Field of Search: 324/202, 324/251, 324/235, 338/32 H
• US Class Current: 324/202
• CPC Class Codes: G01R 15/202 using Hall-effect devices Hall elements in arrangements for measuring electrical power G01R21/08

Abstract

A Hall effect device test circuit which detects Hall effect device operate and release point failures. A magnetic field circuit, a voltage switching circuit, a comparison circuit, a retriggerable monostable multivibrator circuit and a visual indicator circuit are included. The comparison circuit compares the Hall effect device switching voltage to a predetermined threshold and controls the multivibrator circuit which causes a visual pass/fail signal to be provided.

Claims

1. A Hall effect device test circuit for use in a test system including a power signal source, said test circuit comprising:

magnetic field means connected to said power signal source, operated in response to said power signal to periodically provide a magnetic field of varying intensity;

voltage reference means connected to said power source, operated in response to said power signal, to periodically provide a sample voltage of varying magnitude and proportional to the intensity of said magnetic field;

a Hall effect device connected in magnetic field proximity to said magnetic field means, operated in response to each occurrence of said magnetic field of a first predetermined intensity to provide an electrical signal of a first characteristic, and operated in response to each occurrence of said magnetic field of a second predetermined intensity to provide an electrical signal of a second characteristic;

first detection means connected to said voltage reference means and said Hall effect device, operated in response to each electrical signal of said first characteristic and an associated sample voltage of a magnitude less than a first predetermined value to provide a steady first visual indication; and

second detection means connected to said voltage reference means and said Hall effect device, operated in response to each electrical signal of said second characteristic and an associated sample voltage of a magnitude greater than a second predetermined value to provide a steady second visual indication.

2. A Hall effect device test circuit as claimed in claim 1, wherein there is further included:

third detection means connected to said Hall effect device, operated in response to each electrical signal of said first characteristic to provide a third visual indication.

3. A Hall effect device test circuit as claimed in claim 2, wherein said third detection means comprises a light emitting diode.

4. A Hall effect device test circuit as claimed in claim 1, wherein:

said first detection means is further operated in response to each electrical signal of said first characteristic and an associated sample voltage of a magnitude greater than said first predetermined value to inhibit said first visual indication.

5. A Hall effect device test circuit as claimed in claim 4, wherein said first detection means comprises:

comparison means connected to said Hall effect device and said voltage reference means operated in response to each electrical signal of said first characteristic and an associated sample voltage of said magnitude less than said first predetermined value to provide a comparison signal of a first characteristic, and further operated in response to each electrical signal of said first characteristic and said sample voltage of said magnitude greater than said first predetermined value to provide a comparison signal of a second characteristic;

storage means connected to said comparison means, operated in response to periodic comparison signals of said first characteristic to provide a steady storage signal of a first characteristic, and further operated in response to said periodic comparison signals of said second characteristic to provide a steady storage signal of a second characteristic; and

visual signaling means connected to said storage means, operated in response to said storage signal of said first characteristic to provide said first visual indication and further operated in response to said storage signal of said second characteristic to inhibit said first visual indication.

6. A Hall effect device test circuit as claimed in claim 5, wherein said comparison means comprises:

a comparator having first and second inputs, said first input connected to a resistor network defining a threshold for said sample voltage of said first predetermined value; and

a relay circuit connected to said Hall effect device, operated in response to said electrical signal of said first characteristic to disconnect said voltage reference means from said second input.

7. A Hall effect device test circuit as claimed in claim 1, wherein:

said second detection means is further operated in response to each electrical signal of said second characteristic and an associated sample voltage of a magnitude less than said second predetermined value to inhibit said second visual indication.

8. A Hall effect device test circuit as claimed in claim 7, wherein said second detection means comprises:

comparison means connected to said Hall effect device and said voltage reference means operated in response to each electrical signal of said second characteristic and an associated sample voltage of said magnitude greater than said second predetermined value to provide a comparison signal of a first characteristic, and further operated in response to each electrical signal of said second characteristic and said sample voltage of said magnitude less than said second predetermined value to provide a comparison signal of a second characteristic;

storage means connected to said comparison means, operated in response to periodic comparison signals of said first characteristic to provide a steady storage signal of a first characteristic, and further operated in response to periodic comparison signals of said second characteristic to provide a steady storage signal of a second characteristic; and

visual signaling means connected to said storage means, operated in response to said storage signal of said first characteristic to provide said second visual indication and further operated in response to said storage signal of said second characteristic to inhibit said second visual indication.

9. A Hall effect device test circuit as claimed in claim 8, wherein said comparison means comprises:

a comparator having first and second inputs, said first input connected to a resistor network defining a threshold for said sample voltage of said second predetermined value; and

a relay circuit connected to said Hall effect device, operated in response to said electrical signal of said second characteristic to connect said voltage reference means to said second input.

10. A Hall effect device test circuit as claimed in claims 5 or 8, wherein said storage means comprises:

a retriggerable monostable multivibrator having a time constant longer than the period of said first or second comparison signals.

11. A Hall effect device test circuit as claimed in claims 5 or 8, wherein said visual signaling means comprises a light emitting diode.

12. A Hall effect device test circuit as claimed in claim 1, wherein said magnetic field means comprises:

an electromagnet connected to a diode, whereby said magnetic field is unidirectional.

13. A Hall effect device test circuit as claimed in claim 1, wherein said voltage reference means comprises a resistor.

14. A Hall effect device test circuit as claimed in claim 1, wherein there is further included:

disabling means connected between said first and second detection means, operated in response to an absence of said first visual indication to provide a disable signal;

said second detection means being disabled in response to said disable signal, whereby said second visual indication is inhibited.

15. A Hall effect device test circuit as claimed in claim 14, wherein said disabling means comprises an inverter.

16. A Hall effect device test circuit as claimed in claim 1, wherein there is further included:

disabling means connected between said magnetic field means and said second detection means, operated in response to a predetermined value of said power signal to provide a disable signal;

said second detection being disabled in response to said disable signal, whereby said second visual indication is inhibited.