Reflection coefficient measurements

• US 4,489,271 A
• Filed: 12/29/1980
• Issued: 12/18/1984
• Est. Priority Date: 01/15/1979
• Status: Expired due to Fees

• Current Assignee: Gordon P. Riblet
• Original Assignee: Gordon P. Riblet
• Inventors: Riblet, Gordon P.
• Primary Examiner(s): Karlsen, Ernest F.
• Application Number:
  US06/221,005
• Time in Patent Office: 1,450 Days
• Field of Search: 324/58 B, 324/58 A, 324/58 R, 324/95, 333/109, 333/114, 333/116, 356/345
• US Class Current: 324/638
• CPC Class Codes: G01R 27/06 Measuring reflection coefficients; Measuring standing-wave ratio

Abstract

A compact apparatus for the accurate measurement of complex reflection coefficients and VSWR of a device over either a waveguide bandwidth or multi-octave bandwidth by preferably measuring two power levels at detectors associated with the device. The device is formed by a main coupling means which in one embodiment is a main guide arm having means for receiving a test signal and means for transmitting the signal to the device being measured. In addition to the main coupling means (arms) there are also provided detector arms each having a detector associated therewith and means coupling signals from the main arm to the detector arms with the overall design being controlled in accordance with relatively simple formulae. The techniques of the invention are embodied herein in a waveguide embodiment, a stripline embodiment and a quasi-optical embodiment of the invention.

Claims

1. Apparatus for measuring the reflection coefficient of a device by detecting normalized power level, comprising;

main coupling means having means for receiving a test signal and means for coupling to the device being measured,

first and second secondary coupling means associated with the main coupling means,

first and second detectors associated, respectively, with the first and second secondary coupling means,

and means coupling each secondary coupling means to the main coupling means with the normalized power levels P₁ and P₂ respectively associated with the first and second detectors being provided in accordance with the following equations;

space="preserve" listing-type="equation">P.sub.1 =1+|Γ

|.sup.2 +2|Γ

| cos θ

space="preserve" listing-type="equation">P.sub.2 =1+|Γ

.sup.2 30 2|Γ

| sine θ

where |Γ

| is the magnitude of the reflection coefficient and θ

is its phase.

2. Apparatus as set forth in claim 1 wherein the magnitude of the complex reflection coefficient Γ

is given by;

##EQU8## where P₁ and P₂ are the normalized powers measured at the respective first and second detectors.

3. Apparatus as set forth in claim 1 wherein the main coupling means comprises the main waveguide arm and the secondary coupling means each comprise a secondary waveguide arm.

4. Apparatus as set forth in claim 3 wherein both secondary arms extend substantially transverse to the main arm and each have termination means at an end opposite to the detector ends of each secondary arm.

5. Apparatus as set forth in claim 3 wherein both secondary arms extend at an angle of substantially 90°

to the main waveguide arm.

6. Apparatus as set forth in claim 3 wherein said means coupling each secondary coupling means to the main coupling means includes means defining a coupling hole, one coupling between the main arm and one of the secondary arms and another coupling between the main arm and the other of the secondary arms.

7. Apparatus as set forth in claim 6 wherein the one coupling hole is centered in the main arm and off-center in the one secondary arm and the other coupling hole is centered in the main arm and off-center in the other secondary arm.

8. Apparatus as set forth in claim 6 wherein the one coupling hole is centered in the one secondary arm and off-centered in the main arm and the other coupling hole is centered in the main arm and off-center in the other secondary arm.

9. Apparatus as set forth in claim 7 wherein the coupling holes are circular.

10. Apparatus as set forth in claim 8 wherein the coupling holes are circular.

11. Apparatus as set forth in claim 6 wherein the arms are all of rectangular waveguide with one of the secondary arms longer than the other.

12. Apparatus as set forth in claim 6 including a septum in the main arm having at least one capacitive button associated therewith, said button aligning with a coupling hole.

13. Apparatus as set forth in claim 6 including a rod extending across the main waveguide arm in the long dimension with a sleeve aligning with a coupling hole mounted thereon.

14. Apparatus as set forth in claim 1 wherein said first and second secondary coupling means comprise four directional couplers in series, a first pair of which are associated with the first secondary coupling means and a second pair of which are associated with the second secondary coupling means.

15. Apparatus as set forth in claim 14 wherein the first pair of couplers are spaced a greater distance along the main coupling line than the second pair.

16. Apparatus as set forth in claim 14 wherein the directional couplers are line couplers in stripline, microstrip or coax with two of the secondary lines being on one side of the main line and the other two on the other side of the main line.

17. Apparatus as set forth in claim 16 wherein the two pairs of secondary lines face one another.

18. Apparatus as set forth in claim 17 wherein the first two couplers are separated from the last two by an attenuator in the main line.

19. Apparatus as set forth in claim 14 wherein the directional couplers comprise one of partially reflecting mirrors, thin dielectric sheets, and closely spaced prisms.

20. Apparatus as set forth in claim 1 including a reference detector and means coupling the reference detector to the main coupling means.

21. Apparatus as set forth in claim 1 wherein said secondary means includes a pair of couplers having relatively loose coupling associated, along with a power divider, with one of the detectors and a second pair of couplers having relatively loose coupling associated, along with a 90°

hybrid, with the other detector.

22. Apparatus as set forth in claim 1 wherein said means coupling each secondary means to the main coupling means includes partially reflecting means.

23. Apparatus as set forth in claim 1 wherein said apparatus is constructed in coax.

24. Apparatus as set forth in claim 23 including metal support means forming the outer conductor in the coax circuit.

26. Apparatus as set forth in claim 7 wherein one coupling hole overlies the other coupling hole at substantially the same position along the main arm.

27. Apparatus as set forth in claim 8 wherein both coupling holes are centered along a line extending orthogonally of the direction of the main arm.

25. A four port apparatus for measuring the reflection coefficient of a device by detecting power levels, comprising;

main coupling means having means defining a first port for receiving a test signal and means defining a second port for coupling to the device being measured,

first and second secondary coupling means having means defining third and fourth ports, respectively of the apparatus,

first and second detectors connected respectively at the third and fourth ports,

and means coupling each secondary coupling means to the main coupling means such that when feeding a signal into one secondary port the signals from the first and second ports are the same and when feeding the other secondary port the signals from the first and second ports differ only in a phase difference of 90°

.

28. A four part apparatus as set forth in claim 25 wherein the power levels are normalized power levels P₁ and ovs/P/ ₂ , respectively associated with the first and second detectors, said normalized power levels being identified by the following equations:

space="preserve" listing-type="equation">P.sub.1 =1+|Γ

|.sup.2 +2|Γ

| cos θ

space="preserve" listing-type="equation">P.sub.2 =`+|Γ

|.sup.2 +2|Γ

| sin θ

where |Γ

| is the magnitude of the reflection coefficient and is its phase.