Method and apparatus for determining oxide film thickness

• US 4,495,558 A
• Filed: 06/25/1982
• Issued: 01/22/1985
• Est. Priority Date: 06/25/1982
• Status: Expired due to Fees

• Current Assignee: General Electric Company
• Original Assignee: General Electric Company
• Inventors: Capp, John, Cath, Pieter G., Loeffler, William P.
• Primary Examiner(s): Krass, Errol A.
• Assistant Examiner(s): Teska, Kevin J.
• Application Number:
  US06/392,118
• Time in Patent Office: 942 Days
• Field of Search: 364/482, 364/563, 364/496, 364/497, 364/499, 364/500, 364/481, 118/620, 118/712, 427/10, 134/18, 204/1 T, 204/434
• US Class Current: 205/791
• CPC Class Codes: G01B 7/06 for measuring thickness measuring during the manufacture of coatings C23C14/54

Abstract

Thickness of an electrically insulative metal oxide film deposited on an electrically conductive metal substrate is determined by electrolytically reducing the metal oxide in an electrochemical cell while continuously measuring the cell voltage. A mathematical relationship between the cell voltage change and elapsed time of electrolytic reduction serves as a means for determining thickness of said oxide coating. This method and apparatus is particularly suitable for measurement of the oxide coating thickness on a metal wire substrate.

Claims

1. A method for determining the thickness of an electrically insulative metal oxide coating on an electrically conductive metal substrate sample which comprises:

(a) electrolytically reducing a sample of said oxide coating in an electrochemical cell at relatively constant current density while measuring the cell voltage,

(b) defining the relationship between cell voltage rise attributable to electrolytically reducing the oxide coating and the time interval of electrolytic reduction in the form of a mathematical curve, said curve defining the cell voltage rise with time passage from a predetermined threshold voltage value to a final cell voltage value achieved when said oxide coating has been removed by said electrolytic reduction,

(c) determining the final time value needed to completely remove said coating on said mathematical curve as the intersection point between a tangent to said curve at the region between said threshold voltage value and said final cell voltage value, and

(d) computing the oxide thickness using the total elapsed time of electrolytic reduction as determined by said final time value.

2. A method as in claim 1 wherein the said substrate sample is a wire of predetermined length.

3. A method as in claim 1 wherein the said substrate sample is copper clad nickel-iron core wire oxidized with a surface deposit of copper oxide.

4. A method as in claim 1 wherein the said substrate sample is copper clad nickel-iron core wire oxidized to copper oxide and having a surface borate deposit.

5. A method as in claim 1 wherein said tangent is a straight line.

6. A method as in claim 1 wherein the steps of said method are controlled by a programmed microprocessor.

7. A method as in claim 6 wherein the cell current is computed from the of said sample dimensions.

8. A method as in claim 6 wherein the measured cell voltage values are stored and averaged during a selected time interval in determining the final time value.

9. A method as in claim 5 wherein the cell voltage values employed in determining said tangent are selected from the measured cell voltage values at fixed amounts greater than the minimum cell voltage value measured.

10. A method as in claim 6 wherein the steps of said method are terminated upon fulfillment of all following conditions:

(a) time passage of a first time interval,

(b) a cell voltage value exceeding a threshold value, and

(c) no cell voltage above a predetermined value is encountered during a second time interval subsequent to said first time interval.

11. A method for automatically determining the electrically insulative thickness of a metal oxide coating on an electrically conductive metal substrate sample utilizing a programmed microprocessor which comprises:

(a) electrolytically reducing a sample of said oxide coating in an electrochemical cell at relatively constant current density while measuring the cell voltage,

(b) computing the cell current by said microprocessor from the sample dimensions,

(c) measuring the cell voltage change with respect to the time interval of electrolytic reduction and storing the measurements in said microprocessor,

(d) defining the relationship between cell voltage rise attributable to electrolytically reducing the oxide coating and the time interval of electrolytic reduction in the form of a mathematical curve, said curve defining the cell voltage rise with time passage from a predetermined threshold voltage value to a final cell voltage value achieved when said oxide coating has been removed by said electrolytic reduction,

(e) determining said threshold voltage which is greater in value by a preselected amount than the cell operation,

(f) determining the tangent to said mathematical curve at the region between said threshold voltage value and said final cell voltage value from the stored cell voltage values which are greater by a fixed amount than the minimum cell voltage measured and thereafter determining the final time value to remove said coating by intersection between said tangent and the cell voltage value when said coating has been removed,

(g) computing the oxide thickness in said micropressor utilizing the total elapsed time of electrolytic reduction as determined by said final time value according to the following equation;

##EQU2## wherein t=oxide thickness, cm.

I_D =cell current density, amp./cm²

T=time value, sec.

E=oxide equivalent weight, gms./gm. mole

D=oxide density, gm./cc.

F_C =Faraday'"'"'s constant, coulombs/gm. mole

(h) terminating the steps of said method upon fulfillment of all following conditions;

(i) time passage of a said first time interval,

(ii) achieving the threshold cell voltage, and

(iii) no cell voltage rise above a predetermined value is encountered during a second time interval subsequent to said first time interval.

12. A method as in claim 11 wherein said substrate sample is a wire of predetermined length.

13. A method as in claim 11 wherein said tangent is a straight line.

14. A measurement system for automatically determining the thickness of an electrically insulative metal oxide coating on an electrically conductive metal substrate sample which comprises:

(a) an electrochemical cell to electrolytically reduce said oxide coating having means to measure the cell voltage,

(b) a programmed microprocessor to automatically compute the oxide coating thickness and control operation of said electrochemical cell,

(c) digital to analog converter means which controls the current being supplied to said electrochemical cell as a function of the sample dimensions computed in said microprocessor,

(d) analog to digital converter means to supply the cell voltage measurements to said microprocessor, and

(e) computing means connected to said analog to digital converter means and said digital to analog converter means for

(i) defining the relationship between cell voltage rise attributable to electrolytically reducing the oxide coating and the time interval of electrolytic reduction in the form of a mathmatical curve, said curve defining the cell voltage rise with time passage from a predetermined threshold voltage value to a final voltage value achieved when said oxide coating has been removed by said electrolytic reduction,

(ii) determining the final time value needed to completely remove said coating as the intersection point between a tangent to said curve at the region between said threshold voltage value and the final cell voltage value, and

(iii) computing the oxide thickness using the total elapsed time of electrolytic reduction as determined by said final time value.

15. A measurement system as in claim 14 wherein the measured cell voltage values are stored and averaged during a selected time interval in determining said final time value.

16. A measurement system as in claim 14 wherein said computing means determines a threshold voltage value which is greater in value by a preselected amount than the cell voltage value after a first time interval of cell operation.

17. A measurement system as in claim 14 which further includes means to terminate the measurement system'"'"'s operation upon fulfillment of all following conditions:

(a) time passage of a first time interval,

(b) achieving a threshold voltage value which is greater in value by a preselected amount than the cell voltage value after a first time interval of cell operation, and

(c) no cell voltage rise above a predetermined value is encountered during a second time interval subsequent to said first time interval.