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Biasing method for improved performance in field effect devices

  • US 4,496,909 A
  • Filed: 02/28/1983
  • Issued: 01/29/1985
  • Est. Priority Date: 01/18/1979
  • Status: Expired due to Fees
First Claim
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1. A method of minimizing transistor by noise, the field effect transistor having a gate, source and drain comprising setting the quiescent bias point of the field effect transistor by setting the gate to source voltage and the drain to source voltage to operate the transistor in the current saturation region with an electric field in a drain depletion zone such that the carrier velocity is in the partial carrier velocity saturation zone to provide a carrier drift velocity approximately proportional to the square root of the electric field to distort the output conductance functional with current to substantially match the transconductance functional with current to substantially match the transconductance functional with current, thereby linearizing the voltage transfer function of the device, defined Av =gm /go, where gm is the transconductance and go is the output conductance of the field effect transistor.

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