Digital circuit unit testing system utilizing signature analysis

• US 4,503,536 A
• Filed: 09/13/1982
• Issued: 03/05/1985
• Est. Priority Date: 09/13/1982
• Status: Expired due to Term

• Current Assignee: Hughes Missile Systems Company
• Original Assignee: General Dynamics Corporation
• Inventors: Panzer, Gary W.
• Primary Examiner(s): Smith, Jerry
• Assistant Examiner(s): NOT, DEFINED
• Application Number:
  US06/417,798
• Time in Patent Office: 904 Days
• Field of Search: 371/25, 371/24, 371/26, 371/27, 364/580, 324/73 R
• US Class Current: 714/732
• CPC Class Codes: G06F 11/277 with comparison between actual response and known fault-free response

Abstract

A system for testing digital circuit units at the design speed of the circuit. A first memory stores a minimized set of optimum generated predetermined test patterns for application to a unit under test. A second memory stores expected signature patterns corresponding to signature patterns that are derived from the unit under test in response to the predetermined test patterns when the unit under test is functioning properly. A signature analyzer derives signature patterns from a unit under test in response to the application of the test patterns to the unit. A comparator compares the derived signature patterns with the expected signature patterns and provides an indication of the results of the comparison. A clock provides a clock signal having a pulse rate that corresponds to the design speed of the unit under test; and a sequential counter responds to said clock signal by providing a sequential count to the first memory for addressing the first memory at storage positions therein having addresses corresponding to the sequential count to cause the predetermined test patterns to be read from the first memory and applied to the unit at a speed that corresponds to the design speed of the unit under test. The testing system further includes a backtracing system for enabling determination of the location of faults in the unit under test.

Claims

1. A system for testing digital circuit units at the design speed of the circuit units, comprising

a first memory for storing a computer generated minimized set of optimum predetermined test patterns for application to a unit under test;

a second memory for storing computer generated expected signature patterns which correspond to signature patterns that would be derived from a properly functioning unit under test in response to the predetermined test patterns;

a signature analyzer for deriving signature patterns from a unit under test in response to the application of said test patterns to said unit;

a comparator for comparing said derived signature patterns with said expected signature patterns and for providing an indication of the results of said comparison; and

means for addressing the first and second memories, the address means for addressing the first memory so as to apply said test patterns to said unit under test at a speed that corresponds to the design speed of the unit under test and the address means for addressing the second memory so as to apply said expected signature patterns to said comparator.

2. A system according to claim 1, wherein the addressing means include

a clock for providing a clock signal having a pulse rate that corresponds to the design speed of the unit under test;

and

a sequential counter responsive to said clock signal for providing a sequential count to the first memory for addressing the first memory at storage positions therein having addresses corresponding to said sequential count to cause said predetermined test patterns to be read from the first memory and applied to said unit at a speed that corresponds to the design speed of the unit under test.

3. The system according to claim 2 wherein the addressing means sequential counter in response to said clock signal provides said sequential count to the second memory for addressing the second memory at storage positions therein having addresses corresponding to said sequential count to cause said expected signature patterns to be read from the second memory and applied to the comparator.

4. A system according to claim 1 or 3, further comprising

backtracing means for enabling determination of the location of faults in the unit under test.

5. A system according to claim 4, wherein the backtracing means comprises

a third memory for storing computer generated expected signature patterns which correspond to signature patterns that would be derived from selected terminals and internal nodes of a properly functioning unit under test in response to the predetermined test patterns,

a second signature analyzer for deriving signature patterns from selected terminals and internal nodes of the unit under test in response to the application of said test patterns to said unit;

a data processor for addressing the third memory which responds with said expected signature patterns, for comparing said signature patterns derived by the second signature analyzer with said expected signature patterns from the third memory, and for providing an indication of the results of said comparison;

means for connecting the second signature analyzer directly to selected terminals and internal nodes of the unit under test; and

a fourth memory for storing correlations of various terminals and internal nodes in the unit under test, from which the signature patterns are derived, to other internal nodes in the unit under test to which the second signature analyzer should be coupled when the data processor indicates a fault upon the second signature analyzer being connected directly to one of said various terminals and internal nodes;

wherein the data processor is coupled to the fourth memory for providing an indication of one of said other internal nodes to which the second signature analyzer should be coupled in accordance with the indication of the results of said comparison.

6. A system according to claim 5, wherein the memories include RAMs.

7. A system according to claim 1, wherein the memories include RAMs.