Method and apparatus for electrical and optical inspection and testing of unpopulated printed circuit boards and other like items

• US 4,507,605 A
• Filed: 05/17/1982
• Issued: 03/26/1985
• Est. Priority Date: 05/17/1982
• Status: Expired due to Fees

• Current Assignee: Testamatic Incorporated
• Original Assignee: Testamatic Incorporated
• Inventors: Geisel, Donald J.
• Primary Examiner(s): Krawczewicz, Stanley T.
• Assistant Examiner(s): Solis, Jose M.
• Application Number:
  US06/379,005
• Time in Patent Office: 1,044 Days
• Field of Search: 324/51, 324/52, 324/54, 324/73 PC
• US Class Current: 324/536
• CPC Class Codes: G01R 31/2806 Apparatus therefor, e.g. test stations, drivers, analysers, conveyors G01R31/2805, G01R31/281, G01R31/2818 take precedence
• CPC Class Codes: G01R 31/309 of printed or hybrid circuits or circuit substrates

Abstract

This application describes a novel method and apparatus for the electrical and mechanical inspection and testing of unpopulated electronic printed circuit boards, ceramic substrates and other items which have conductive pathways formed thereon, interconnecting conductive pads and other conducting surfaces. Examination and testing is accomplished by placing a printed circuit board or other item to be tested within a sealed chamber which contains a gaseous atmosphere capable of cathode luminescence such as argon, neon and the like. The sealed chamber includes a transparent panel or partition which allows viewing of the printed circuit board or other item under test and preferably is electrically conductive. One terminal of a source of excitation electric potential is connected to the transparent conductive panel and the other terminal is applied to one of the metallic runs or paths on the surface of the sample item to be tested. The electric field produced between the metallic run or path on the sample item and the transparent panel or window in the sealed chamber causes the gas immediately adjacent to the run to emit light or other electromagnetic radiation in accordance with the well-known "cathode luminescence" phenomenon. The light or other emissions thus produced forms a pattern which matches in size and shape the conductive pathway or run on the sample item which has been electrically excited. The observed pattern is then compared to a known or desired pattern to determine whether it meets a preset standard.

Claims

1. An apparatus using the electrical and photo-emissive properties of a gaseous atmosphere for the electrical and physical inspection and testing by optical means of ites such as printed circuit boards, ceramic substrates, and other like items which contain or include electrically conductive parts, paths, and surfaces whose electrical and physical continuity and conformance to a standard is to be verified, said apparatus comprising a sealable substantially airtight chamber for containing a gaeous atmosphere while allowing access to the interior thereof for the placement of items under test, means for introducing a gaseous atmosphere capable of cathode luminescence at a low pressure into the sealable chamber with an item to be tested in place within the chamber, a movable probe disposed within the sealable chamber for coupling one terminal of a source of excitation electric potential to desired test points located within an x-y plane on the surface of an item under test, said sealable chamber having a transparent partition disposed over the location of an item under test for allowing viewing of the surface of an item being tested, and means for coupling a remaining terminal of said source of excitation electric potential to a conductive surface in said sealable chamber substantially opposite the surface of an item under test whereby cathode luminescence is produced within the sealable chamber around test points excited by said movable probe and around all points having electrical continuity therewith.

2. An apparatus according to claim 1 wherein the gaseous atmosphere introduced into the sealable chamber is at a pressure on the order of 10-100 millimeters absolute, and more particularly comprises one of the inert elements namely helium, neon, argon and mixtures thereof and the apparatus further includes means for evacuating the interior of the chamber to a low pressure in the range of 10 to 100 millimeters absolute pressure prior to the introduction of the gaseous atmosphere therein.

3. An apparatus according to claim 1 wherein the sealable chamber is designed to operate at low pressure and includes a sealable and easily opened and closed door through which items under test may be inserted and removed readily from the interior of the sealable chamber withint impairment of its sealable character and the low pressure gaseous atmosphere contained therein.

4. An apparatus according to claim 1 wherein the transparent partition comprises a window, door and other like partition of the sealable chamber positioned to allow viewing the surface of an item under test and the movable probe has a very small mass so as not to obscure the view of an item under test while being viewed through the transparent partition.

5. An apparatus according to claim 1 wherein the transparent partition in cross section comprises three layers including a transparent insulating cover layer, a transpartent, low resistance, high conductivity intermediate layer, and a low conctivity, high resistivity inner layer that is exposed to the gaseous atmosphere in the in the interior of the sealed chamber.

6. An apparatus according to claim 1 wherein the transparent portion comprises a conventional inulating transparent plate which has supported on its underside exposed to the gaseous atmosphere a plurality of very thin, closely spaced conductive ires with each conductive wire having an individual current limiting resistance connected in series circuit relationship with it.

7. An apparatus according to claim 5 wherein the outer insulating cover layer comprises a glass plate about 1/4 of an inch thick, the inermediate low resistance, high conductivity transparent layer comprises a tin oxide, or a gold metallization layer, or other similar material having a thickness of approximately 2000 Angstrom units and the low conductivity, high resistivity inner layer is comprised of a high resistance, water inpregnated polymer coating of about 0.2 mils thick.

8. An apparatus according to claim 1 wherein the movable probe has an extremely low mass in the form of a conductive tip formed on a fine wire and is movable at a high velocity over the x-y plane of a rinted circuit board, ceramic substrate, or other similar item under test within the sealable chamber and dos not substantially impair the view of the item under test through the transparent partition.

9. An apparatus according to claim 1 further including an electro-optical sensing unit for observing the surface of an item under test through the transparent partition and for producing an output display for ready viewing by an operator of the apparatus.

10. An apparatus according to claim 1 wherein the movable probe has an extremely small mass in the form of a dot of conductive material secured to a fine wire and moves at high velocity over the x-y plane of a printed circuit board, ceramic substrate or other similar item under test, and the apparatus further includes an electro-optical sensing unit for examining the surface of the item under test through the transparent partition and for producing a display that may be readily viewed by an operator of the apparatus.

11. An apparatus according to either claim 9 or 10 further including a control computer for automatically controlling the positioning in the x-y plane of the movable probe in accordance with a predetermined program and wherein said electrooptical sensing unit provides an electronic readout signal for supply back to the control computer for comparison to a known standard.

12. An apparatus according to either of claims 1, 2 or 3 further including a gas supply for reestablishing the gaseous atmosphere within the sealable chamber after each opening of the chamber and removal and insertion of a new test item therein, and automatically operable valving means for disconnecting the supply of gaseous atmopshere upon opening of the sealable chamber and automatically valving in a new supply in the correct quantity and pressure of gaseous atmosphere after insertion of the new test item and closure of the sealable chamber.

13. An apparatus according to claim 2 wherein the sealable chamber is substantially airtight and includes a sealable and easily opened and closed door through which items under test may be inserted and removed readily from the interior of the sealable chamber without impairing its substantial airtight character.

14. An apparatus according to claim 13 wherein a transparent partition comprises a window, door and other like partition of the sealable chamber positioned to allow viewing the surface of an item under test and the movable probe has very small mass so as not to obscure the view of an item under test while being viewed through the transparent partition.

15. An apparatus according to claim 14 wherein the transparent partition in cross section comprises a conventional transparent insulating plate which has attached to its underside exposed to the gaseous atmosphere a plurality of very thin, closely spaced electrical conductors with each conductor having an individual current limiting resistance connected in series with it.

16. An apparatus according to claim 15 where in the movable probe has an extremely low mass in the form of a conductive tip formed on a fine wire which is movable at a high velocity over the x-y plane of a printed circuit board, ceramic substrate, or other similar item under test within the sealable chamber and which does not substantially impair the view of the item under test through the transparent partition.

17. An apparatus according to claim 16 further including an electro-optical sensing unit for observing surface of an item under test through the transparent partition and for producing an output display for ready viewing by an operator of the apparatus.

18. An apparatus according to claim 17 further including a control computer for automatically controlling the positioning in the x-y plane of the movable probe in accordance with a predetermined program and wherein said electrooptical sensing unit provides an electronic readout signal for supply back to the control computer for comparison to a known standard.

19. An apparatus according to either of claims 14, 16 or 18 further including a gas supply for reestablishing the gaseous atmosphere within the sealable chamber after each opening of the chamber and removal and insertion of a new test item therein, and automatically operable valving means for disconnecting the supply of gaseous atmosphere upon opening of the sealable chamber and automatically valving in a new supply in the correct quantity and pressure of gaseous atmosphere after insertion of the new test item and closure of the sealable chamber.

20. A method using the electrical and photo-emissive properties of a gaseous atmosphere for electrical and physical inspection and testing by optical means of items such as electronic printed circuit boards, ceramic substrates, and other like items which contain or include electrically conductive parts, paths and surfaces for detection of discontinuities, (breaks), undesired conductive areas (shorts), or irregularities in the size or shape of such item and being implement with an apparatus comprising a sealable substantially airtight chamber having a transparent partition disposed over the location of an item under test for allowing viewing of the item being tested;

said method comprising introducing an item to be tested into the interior of the chamber and sealing it closed in a substantially airtight manner, introducing a gaseous atmosphere capable of cathode luminescence at a location pressure into the interior of the chamber along with an item under test, coupling one terminal of a source of excitation electric potential with a movable probe to selected test points located within an x-y plane on the surface of an item being tested, and coupling a remaining terminal of said source of excitation electric potential to a conductive surface in said sealable chamber substantially opposite the surface of an item under test whereby cathode luminescence is produced within the sealable chamber around test points excited by the movable probe and around all points having electrical continuity therewith which is observed through the transparent partition.

21. The method according to claim 20 wherein the gaseous atmosphere introduced into the sealable chamber is at a pressure on the order of 10-100 millimeters absolute and comprises one of the inert elements namely helium, neon, argon and mixtures thereof and further includes evacuating the interior of the chamber to a low pressure in the range of 10 to 100 millimeters absolute pressure prior to the introduction of the low pressure gaseous atmosphere into the sealable chamber.

22. The method according to claim 21 further including connecting a large value electrical resistance in the series electrical circuit including the source of excitation electric potential, the movable probe, the gaseous composition and the conductive surface within the sealable chamber to which one terminal of the source of excitation electric potential is connected.

23. The method according to claim 22 further including providing the sealable substantially airtight chamber with a movable, readily sealed opening through which items to be tested may be inserted into and removed easily from the interior of the chamber.

24. The method according to claim 23 wherein the transparent partition comprises a conventional transparent insulating plate which has attached to its underside a plurality of very thin closely spaced conductors with each conductor having an individual current limiting resistance connected in series with it and the source of excitation electric potential is connected to the individual series connected limiting resistances.

25. The method according to claim 23 wherein the transparent partition comprises a transparent insulating cover layer that has a resistivity of the order of 100 ohms per square and a high resistivity inner layer exposed to the gaseous atmosphere within the interior of the sealed chamber that has a resistivity of the order of 10⁴ to 10⁸ ohm-centimeters.

26. The method according to claim 25 wherein the outer transparent insulating layer comprises a glass plate about 1/4 of an inch thick, the intermediate low resistance, high conductivity transparent layer comprises tin oxide, or a gold metalization layer, or other similar material having a thickness of approximately 2000 Angstrom units formed on the glass plate and the low conductivity, high resistivity inner layer is comprised of a high resistance, water impregnated polymer coating about 0.2 mills thick.

27. The method according to claim 24 wherein the movable probe has an extremely small mass and is formed by a small conductive tip attached to a fine wire so that it can be moved at a relatively high velocity to different points located within the x-y plane of a printed circuit board, ceramic substrate or other item under test and does not substantially obscure the view of an item under test being observed through the transparent partition.

28. The method according to claim 27 further including providing an electro-optical sensing unit for observing the surface of a printed circuit board, ceramic substrate or other item under test through the transparent partition in the sealable chamber and for producing a display that may be readily viewed by an operator.

29. The method according to claim 26 further including providing an electro-optical sensing unit for observing the surface of a printed circuit board, ceramic substrate or other item under test through the transparent partition in the sealable chamber and for producing a display that may be readily viewed by an operator.

30. The method according to claim 20 further including providing a control computer for controlling operation of the movable probe automatically in accordance with a predesigned test routine.

31. The method according to claim 28 further including a control computer for controlling automatically the positioning of the movable probe in accordance with a predetermined test routine and wherein the electro-optical sensing unit provides an electronic readout indicative of the cathode luminescent image of the test points of an item under test with the electronic readout being supplied back to the control computer for automatic comparison to predetermined standards for a particular test point under observation.

32. The method according to claim 20 further including automatically reestablishing the gaseous atmosphere following each opening and reclosure of the sealed chamber and removal and insertion of a new test item therein.

33. The method according to claim 31 further including automatically replenishing the gaseous atmosphere following each openiang and reclosure of the sealed chamber and removal and insertion of a new test item therein.