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Signature analysis system for testing digital circuits

  • US 4,510,572 A
  • Filed: 12/28/1981
  • Issued: 04/09/1985
  • Est. Priority Date: 12/28/1981
  • Status: Expired due to Fees
First Claim
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1. A system for testing a digital circuit, comprising:

  • signature generation means receiving a digital signal from a node of said circuit for generating a signature word from said digital signal by combining each of a selected plurality of bits of said digital signature with preselected other ones of the selected plurality of bits of said digital signal;

    control means for allowing said signature generation means to respond to said digital signal during a gate period which is synchronized to the operation of said digital circuit so that, at the conclusion of said gate period, said signature generation means provides a signature which characterizes said digital signal during said gate period;

    signature memory means for storing respective signatures from a plurality of nodes of said digital circuit indicative of the digital signals on the nodes of said digital circuit when it is operating correctly during said gate period; and

    signature comparator means comparing the signature from said signature generation means with the signatures stored in said memory means until either a positive comparison is found or no positive comparison has been found after all of the signatures stored in said memory means have been compared, said signature comparator means generating a signature found indication in response to said positive comparison in response to all of said signatures being compared without a positive comparison.

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