High sensitivity millimeter-wave measurement apparatus
First Claim
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1. A high sensitivity millimeter wave measurement apparatus comprising in combination:
- means for transmitting a millimeter wave at a predetermined operating frequency, said transmitting means including a crystal oscillator to provide a phase-locked transmitter, said transmitting means providing a transmitter signal;
means for receiving a millimeter wave, said receiving means including a phase-locked local oscillator and a fundamental mixer unit;
a harmonic mixer unit operatively connected to said phase-locked transmitter to sample transmitter frequency deviations; and
,a microwave receiver unit operatively connected to said harmonic mixer unit to receive said transmitter frequency deviations, said microwave receiver unit including a phase-locked oscillator to track said transmitter frequency deviations, said phase-locked oscillator providing a reference signal to both said harmonic mixer unit and said phase-locked local oscillator of said receiving means, said microwave receiver unit generating an internal 45 MHz reference signal, said 45 MHz reference signal being applied to said phase-locked oscillator in said microwave receiver unit, said 45 MHz reference signal being doubled by a times 2 multiplier unit and applied as a reference signal to said phase-locked local oscillator in said receiving means, said phase-locked local oscillator providing a local oscillator signal to said fundamental mixer unit, said receiving means receiving and applying said millimeter wave to said fundamental mixer unit, said fundamental mixer unit mixing said local oscillator signal and said said millimeter wave to provide a first IF signal to said microwave receiver unit for detection and measurement.
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Abstract
A millimeter wave measurement apparatus utilizing a phase-locked transmitter to generate a millimeter wave-signal and a phase-locked local oscillator receiver to receive the transmitted millimeter wave signal. A conventional microwave receiver unit receives the IF signal from the millimeter wave receiver and downconverts the IF signal for detection and measurement.
15 Citations
4 Claims
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1. A high sensitivity millimeter wave measurement apparatus comprising in combination:
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means for transmitting a millimeter wave at a predetermined operating frequency, said transmitting means including a crystal oscillator to provide a phase-locked transmitter, said transmitting means providing a transmitter signal; means for receiving a millimeter wave, said receiving means including a phase-locked local oscillator and a fundamental mixer unit; a harmonic mixer unit operatively connected to said phase-locked transmitter to sample transmitter frequency deviations; and
,a microwave receiver unit operatively connected to said harmonic mixer unit to receive said transmitter frequency deviations, said microwave receiver unit including a phase-locked oscillator to track said transmitter frequency deviations, said phase-locked oscillator providing a reference signal to both said harmonic mixer unit and said phase-locked local oscillator of said receiving means, said microwave receiver unit generating an internal 45 MHz reference signal, said 45 MHz reference signal being applied to said phase-locked oscillator in said microwave receiver unit, said 45 MHz reference signal being doubled by a times 2 multiplier unit and applied as a reference signal to said phase-locked local oscillator in said receiving means, said phase-locked local oscillator providing a local oscillator signal to said fundamental mixer unit, said receiving means receiving and applying said millimeter wave to said fundamental mixer unit, said fundamental mixer unit mixing said local oscillator signal and said said millimeter wave to provide a first IF signal to said microwave receiver unit for detection and measurement. - View Dependent Claims (2, 3, 4)
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Current AssigneeUnited States Of America As Represented By The Secretary Of The Air Force
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Original AssigneeUnited States Of America As Represented By The Secretary Of The Air Force
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InventorsDybdal, Robert B., Mori, Tsutomu T., Etcheverry, Robert D.
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Primary Examiner(s)Ng, Jin F.
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Application NumberUS06/388,327Time in Patent Office1,030 DaysField of Search455/67, 455/75, 455/76, 455/84, 455/85, 455/86, 343/17.7, 343/703, 343/5 AF, 343/6.8 R, 343/6.8 LC, 343/7 A, 343/7 PLUS Class Current455/67.15CPC Class CodesG01R 23/04 adapted for measuring in ci...
