Automatic throat height control for film heads

• US 4,511,942 A
• Filed: 05/07/1982
• Issued: 04/16/1985
• Est. Priority Date: 05/07/1982
• Status: Expired due to Term

• Current Assignee: Western Digital Technologies Incorporated (Western Digital Corporation)
• Original Assignee: Hitachi Communication Technologies Limited (Hitachi, Ltd.)
• Inventors: Valstyn, Erich P.
• Primary Examiner(s): Wolff, John H.
• Application Number:
  US06/375,714
• Time in Patent Office: 1,075 Days
• Field of Search: 360/126, 360/125, 360/127, 360/119-120, 360/110, 360/122, 57/281 R, 57/165.75-165.77, 29/603
• US Class Current: 360/125.71
• CPC Class Codes: B23Q 17/20 for indicating or measuring workpiece characteristics, e.g. contour, dimension, hardness
• CPC Class Codes: G11B 5/1871 Shaping or contouring of the transducing or guiding surface
• CPC Class Codes: G11B 5/3166 Testing or indicating in relation thereto, e.g. before the fabrication is completed
• CPC Class Codes: Y10T 29/49036 including measuring or testing
• CPC Class Codes: Y10T 29/49037 Using reference point/surface to facilitate measuring

Abstract

A lapping guide is provided to determine the position at which lapping of a thin film head to define pole faces should be terminated. Accurate positioning of the lapping guide with respect to the head is insured by forming various elements of the lapping guide during the same photolithographic process steps as those used to form elements of the head. The lapping guide may be used either as an electrical or optical guide. When used as an optical guide, a second lapping guide may be provided as an indicator that more frequent inspection is necessary.

Claims

1. In a thin film magnetic head module of the type having one or more head elements, each of which is formed of a pair of magnetic film pole pieces separated by a first insulating film at the tip of the head element and the first insulating film and one or more additional insulating films along a remaining portion of the head element, wherein the tip extends from an edge of the additional film to a pole face established by lapping, wherein the head module includes at least one lapping guide offset from the edge of the additional film to indicate when lapping of the tip should terminate, the improvement wherein the position of the lapping guide is determined by one or more films which are formed during the same processing steps as the additional insulating films of the head, thereby increasing the precision of the lapping of the head.

2. The head module of claim 1 including first and second additional insulating films in each head element and the lapping guide includes a pair of sensor films separated by first and second insulating films in which the second insulating film has an edge which is offset from the edge of the additional film of the head element by a predetermined amount, wherein the first and second insulating films in the lapping guide are formed during separate processing steps and the pair of sensor films separate at the edge of the second film.

3. The head module of claim 2 wherein the sensor films are conductive films and form an electrical circuit which is broken when the films are separated during lapping.

4. The head module of claims 2 or 3 wherein the sensor films are formed in the same processing steps and of the same material as the magnetic films of the head element.

5. A head module according to claim 1 comprising a pair of lapping guides and a plurality of head elements located therebetween.

6. A head module according to claim 1 comprising a plurality of head elements and an equal plurality of lapping guides, one located adjacent each head element.

7. A head module according to claim 1 including a secondary lapping guide which is offset below the other lapping guide, wherein during lapping the secondary lapping guide provides an indication that the lapping process is near completion.