Method and apparatus for correcting image distortions

• US 4,518,898 A
• Filed: 02/22/1983
• Issued: 05/21/1985
• Est. Priority Date: 02/22/1983
• Status: Expired due to Term

• Current Assignee: Fleet Bank, NA (Hartford, Connecticut) (Bank of America Corp.)
• Original Assignee: Image Graphics, Inc.
• Inventors: Anderson, Brian G., Tarnowski, Andrew A.
• Primary Examiner(s): Blum, Theodore M.
• Application Number:
  US06/468,045
• Time in Patent Office: 819 Days
• Field of Search: 315/370, 315/371, 315/382, 315/393, 315/394, 315/395
• US Class Current: 315/371
• CPC Class Codes: H04N 1/047 Detection, control or error compensation of scanning velocity or position H04N1/0402 and H04N1/17 take precedence
• CPC Class Codes: H04N 1/1004 using two-dimensional electrical scanning, e.g. cathode-ray tubes using two-dimensional arrays H04N1/195
• CPC Class Codes: H04N 17/04 for receivers
• CPC Class Codes: H04N 2201/02425 Self-adjusting arrangements, e.g. compensating for temperature fluctuations
• CPC Class Codes: H04N 2201/0315 Details of integral heads not otherwise provided for
• CPC Class Codes: H04N 2201/04717 on the scanned sheet, e.g. a reference sheet
• CPC Class Codes: H04N 2201/04729 in the main-scan direction
• CPC Class Codes: H04N 2201/04731 in the sub-scan direction
• CPC Class Codes: H04N 2201/04732 Detecting at infrequent intervals, e.g. once or twice per line for main-scan control
• CPC Class Codes: H04N 2201/04758 by controlling the position of the scanned image area H04N2201/04755, H04N2201/04756 take precedence
• CPC Class Codes: H04N 2201/04789 in the main-scan direction
• CPC Class Codes: H04N 2201/04791 in the sub-scan direction

Abstract

A method and apparatus are described for improving the geometric fidelity of images reproduced in a charged particle beam device. The beam is deflected across a sensitive medium to form a test image of predetermined configuration. The test image is compared with a reference image and geometric deviations measured, at a number of points, are used to calculate correction signals required to modify the beam deflection to offset the deviations. Circuit adjustments are then made to provide the calculated correction signals. The correction signal adjustments are accomplished in separate non-interactive circuits for each of a plurality of predetermined corrections which only require a one time adjustment.

Claims

1. In an electron beam recording apparatus having means for deflecting a charged particle beam in the X and Y direction therein, the method for improving the geometric fidelity of the reproduced image comprising the steps of:

(a) positioning a charged particle sensitive medium in the path of a charged particle beam to retain a permanent image on said medium,

(b) projecting the particle beam to form on said medium a test pattern having a predetermined configuration,

(c) providing a reference alignment image,

(d) dividing each of the X_in and Y_in signals into a plurality of non-interactive parallel correction circuits with each arranged to produce a correction signal for a predetermined spatial deviation shown on said medium,

(e) comparing the deviation of the test pattern image with the reference alignment image for each of said predetermined spatial deviations, by measuring the deviations for a particular deflection distortion at a plurality of predetermined corresponding locations on said images,

(f) adjusting each of the X_in and Y_in deflection signal functions in each of said circuits so that the correction signal from each circuit is that for which it was determined, and

(g) combining the sum of the signals from each of said plurality of correction circuits and summing the same with the X_in and Y_in signal to produce total correction signals (X_c,Y_c) to the X and Y deflection means whereby the test pattern image aligns with said reference alignment image.

2. The method of claim 1 wherein said plurality of non-interactive adjustable correction circuits comprise potentiometers which are associated with correction signal components corresponding to predetermined deflection deviations which are corrected to adjusting the amplitude of the corresponding signal component by adjusting a particular potentiometer to provide a calculated correction signal, and monitoring the amplitude of change of the correction signal component while adjusting said potentiometer.

3. The method of claim 2 wherein said potentiometers are adjusted while providing means for precisely determining the magnitude of the change in the correction signal, and, adjusting the determination of the potentiometer until the magnitude of change corresponds to the correct value.

4. The method of claim 3 wherein a charged particle beam deflection circuit means is provided and the amplitude of the deflection drive signal is measured by a precision digital voltmeter while making said adjustment until said calculated correction value is attained.

5. The method of claim 1 wherein said beam is deflected to form a test pattern configuration having a plurality of precisely definable reference points to form said predetermined corresponding locations.

6. The method of claim 5 wherein said reference points are represented by a rectangular array of intersecting grid lines.

7. A method according to any one of the claims 1-6 wherein said adjusting step (f) includes a computer or other automated machine for calculating the correction signal for each of said predetermined spatial deviations.

8. A circuit arrangement for providing in a charged particle beam deflection apparatus having beam deflection means for deflecting a single charged particle beam upon the application of X_in and Y_in deflection signals thereto comprising:

(a) a source of X_in and Y_in deflection signals,

(b) circuit means coupling said X_in and Y_in signals to said beam deflection means for causing deflection of said charged particle beam,

(c) a correction cirucit means for deriving C_x and C_y correction signals from X_in and Y_in input signals coupled thereto, said correction signals each having a plurality of individually generated correction signal components, each of said components corresponding to a predetermined deflection distortion function not limited to KX^m Yⁿ on a recorded image from said beam,

(d) means for coupling said X_in and Y_in deflection signals to said correction circuit means,

(e) said correction circuit means including separate and single function generating multiplier circuits means for deriving second and higher order signal components from said input (X_in, Y_in) signals and means for combining the derived multiplier signals to provide a plurality of correction signal components,

(f) said correction signal components each further including a plurality of individual adjustable circuit members for varying the amplitudes of associated correction signal component,

(g) said adjustable circuit members each coupled in the circuit at a location for varying the amplitude of said correction signal component after signal multiplication, and

(h) means for combining said C_x and C_y correction signals respectively and said deflection signals.

9. The circuit arrangement of claim 8 wherein said correction circuit means comprises:

(a) circuit means for providing first and higher order signal components from said first and second input signals X_in and Y_in respectively;

(b) a first multiplier circuit means;

(c) means coupling said first and higher order components to each of said first separate and single function generating multiplier circuit means for providing a plurality of output correction signal components from each of said multipliers each component associated with a scanning distortion not limited to KX^m Yⁿ

(d) (e) means for combining said plurality of correction signal components to provide said composite correction signals X_c and Y_c, and

(e) (f) adjustable circuit means coupled between said first multiplier circuit means and said signal combining means for adjusting the amplitude of said signal to the signal combining means.

10. The circuit arrangement of claim 9 wherein said correction circuit means comprises:

(a) a second multiplier circuit means;

(b) means for coupling said first and high order components and said output correction signals of said first multiplier means to each of said second separate and single function generating multiplier circuit means wherein said second multiplier circuit means multiplies single function terms together for providing higher order output correction signal components from each of said multipliers than is provided by said first multiplier circuit means; and

(c) circuit means for coupling an output signal from said second multiplier circuit means to said signal combining means.

11. The apparatus of claim 8 including means coupled between said first multiplier circuit means and said signal combining means for applying correction signal components of fixed amplitudes to said signal combining means.

12. The circuit arrangement of claim 8 wherein said X and Y beam deflection signals deflect said particle beam respectively, said correction circuit means provides greater than third order correction signal components not limited to KX^m Yⁿ in said X and in said Y.

13. The circuit arrangement of claim 12 wherein said correction circuit means provides seventh order correction signal components not limited to KX^m Yⁿ in each of the X and Y directions.

14. The arrangement of claim 12 including a support surface for positioning said beam sensitive medium in the path of said deflected electron beam, said surface having a curvature thereof, and said circuit arrangement compensates for distortion introduced in an image formed on said medium as a result of the curvature in said support surface.

15. The arrangement of claim 14 wherein said curvature is generally convex.

16. In an electron beam recording apparatus having means for deflecting a charged particle beam in one direction therein, the method for improving the geometric fidelity of the reproduced image comprising the steps of:

(a) positioning a charged particle sensitive medium in the path of a charged particle beam to retain a permanent image on said medium,

(b) projecting the particle beam to form on said medium a test pattern having a predetermined configuration,

(c) providing a reference alignment image,

(d) dividing the deflection signal into a plurality of non-interactive parallel correction circuits with each arranged to produce a correction signal for a predetermined spatial deviation shown on said medium,

(e) comparing the deviation of the test pattern image with the reference alignment image for each of said predetermined spatial deviations, by measuring the deviations for a particular deflection distortion at a plurality of predetermined corresponding locations on said images,

(f) adjusting the deflection signal functions in each of said circuits so that the correction signal from each circuit is that for which it was determined, and

(g) combining the sum of the signals from each of said plurality of correction circuits and summing the same with the deflection signal to produce a total correction signal to the deflection means whereby the test pattern image aligns with said reference alignment image.

17. The method of claim 16 wherein said plurality of non interactive adjustable correction circuit comprise potentiometers which are associated with correction signal components corresponding to predetermined deflection deviations which are corrected by adjusting the amplitude of the corresponding signal component by adjusting a particular potentiometer to provide a calculated correction signal, and monitoring the amplitude of change of the correction signal component while adjusting said potentiometer.

18. A method according to claim 17 wherein said adjusting step (f) includes a computer or other automated machine for calculating the correction signal for each of said predetermined spatial deviations.

19. A circuit arrangement for providing in a charged particle beam deflecting apparatus having single beam deflection means for deflecting a charged particle beam upon the application of a deflection signal thereto comprising;

(a) a source of the deflection signal,

(b) circuit means coupling said deflection signal to said beam deflection means for causing deflection of said charged particle beam,

(c) a correction circuit means for deriving a correction signal from the input signal coupled thereto, said correction signal each having a plurality of individually generated correction signal components, each of said components corresponding to a predetermined deflection distortion function not limited to KX^m Yⁿ on a recorder image from said beam,

(d) means for coupling said deflection signal to said correction circuit means,

(e) said correction circuit means including separate and single function generating multiplier circuits means for deriving second and higher order signal components from said input signal and means for combining the derived multiplier signals to provide a plurality of correction signal components,

(f) said correction signal components each further including a plurality of individual adjustable circuit members for varying the amplitudes of associated correction signal component,

(g) said adjustable circuit members each coupled in the circuit at a location for varying the amplitude of said correction signal component after signal multiplication, and,

(h) means for combining said correction signals respectively and said deflection signal.

20. The circuit arrangement of claim 19 wherein said correction circuit means comprises:

(a) circuit means for providing first and higher order signal components from said input signal;

(b) a first multiplier circuit means;

(c) means coupling said first and higher order components to each of said first separate and single function generating multiplier circuit means for providing a plurality of output correction signal components from each of said multipliers each component associated with a scanning distortion not limited to KX^m Yⁿ

(d) means for combining said plurality of correction signal components to provide a composite correction signal; and

(e) adjustable circuit means coupled between said first multiplier circuit means and said signal combining means for adjusting the amplitude of said signal to the signal combining means.

21. The circuit arrangement of claim 20 wherein said correction circuit means comprises:

(a) a second multiplier circuit means;

(b) means for coupling said first and higher order components and said output correction signals of said first multiplier means to each of said second separate and single function generating multiplier circuit means wherein said second multiplier circuit means multiplies single function terms together for providing higher order output correction signal components from each of said multipliers than is provided by said first multiplier circuit means; and

(c) circuit means for coupling an output signal from said second multiplier circuit means to said signal combining means.

22. The apparatus of claim 19 including means coupled between said first multiplier circuit means and said signal combining means for applying correction signal components of fixed amplitudes to said signal combining means.

23. In a correction circuit arrangement for providing in a charged particle beam deflection apparatus having a single source of deflection signals X_in and Y_in and deflection means for deflecting a charged particle beam upon the application for these deflection signals with circuit means for coupling said X_in and Y_in signals to said correction circuit and to said beam deflection means and an additional means for combining correction signals C_x and C_y respectively with X_in and Y_in for a composite correction deflection signal the improvement comprising:

(a) means for deriving C_x and C_y correction signals from X_in and Y_in input signals coupled thereto, said correction signals each having a plurality of individually generated correction signal components, each of said components corresponding to a predetermined deflection distortion function not limited to KX^m Yⁿ on a recorded image from said beam, said means including;

(b) a first multiplier circuit means;

(c) means coupling said first and higher order components to each of said first separate and single function generating multiplier circuit means for providing a plurality of output correction signal components from each of said multipliers each component associated with a scanning distortion not limited to KX^m Yⁿ ;

(d) means for combining said plurality of correction signal components to provide said composite correction signals X_c and Y_c,

(e) adjustable circuit means coupled between said multiplier circuit means and said signal combining means for adjusting the amplitude of said signal to the signal combining means;

(f) a second multiplier circuit means;

(g) means for coupling said first and higher order components and said output correction signals of said first multiplier means to each of said second separate and single function generating multiplier circuit means wherein said second multiplier circuit means multiplies single function terms together for providing higher order output correction signal components from each of said multipliers than is provided by said first multiplier circuit means;

(h) circuit means for coupling an output signal from said second multiplier circuit means to said signal combining means; and

(i) means coupled between said first multiplier circuit means and said signal combining means for applying correction signal components of fixed amplitude to said signal combining means.