Dual level pattern recognition system
First Claim
1. Apparatus for generating a machine readable signal indicating which one of a set of reference characters corresponds to a visible pattern, includingmeans for storing signals indicative of a set of reference fine n-dimensional array values, each reference fine array value corresponding to one of the reference characters,means for storing signals indicative of a set of reference coarse m-dimensional array values, where m is less than n, each reference coarse array value being derived either from a signal one only of said reference fine array values (in which case it will be designated an unambiguous value), or from any one of a plurality of said reference fine array values (in which case it will be designated an ambiguous value),means for measuring with an optical instrument a workpiece visible pattern in each of n fields to provide a signal indicative of a workpiece fine n-dimensional array value and means for storing said last named signal,means for forming a signal indicative of a workpiece coarse m-dimensional array value from said workpiece fine array value signal, first comparing means for comparing the signal of the workpiece coarse array value with the signals of the set of reference coarse array values to produce a signal indicating the identification of the workpiece pattern with either an unambiguous reference coarse array value or an ambiguous reference coarse array value, means responsive to a signal from said first comparing means indicative of identification with an unambiguous array value to generate a signal indicative of the reference character associated with the identified unambiguous array value, second comparing means responsive to a signal from said first comparing means indicative of identification with an ambiguous array value to compare signals indicative of values of a preselected subset of elements from the plurality of reference fine array values associated with the identified ambiguous coarse array value with the signals indicative of values of corresponding elements of the workpiece fine array, to generate a signal indicative of identification of the workpiece pattern with a particular one of the reference characters associated with the identified ambiguous value.
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Accused Products
Abstract
A pattern recognition system has both coarse and fine levels of analysis in which a coarse array representation of a workpiece pattern is formed and used to identify the workpiece pattern as either a referench character or as a member of an ambiguous set of reference characters which are represented by identical coarse array representations. At least portions of a fine array representation of a workpiece pattern which has been classified as a member of a set of reference characters are compared to corresponding portions of fine array representations of reference characters in the set identified by the classification. The pattern recognition system has a learning system through which reference characters may be introduced into the recognition system and through which a representation of a workpiece pattern which was not identified may be incorporated into an existing set of reference characters of the recognition system.
37 Citations
2 Claims
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1. Apparatus for generating a machine readable signal indicating which one of a set of reference characters corresponds to a visible pattern, including
means for storing signals indicative of a set of reference fine n-dimensional array values, each reference fine array value corresponding to one of the reference characters, means for storing signals indicative of a set of reference coarse m-dimensional array values, where m is less than n, each reference coarse array value being derived either from a signal one only of said reference fine array values (in which case it will be designated an unambiguous value), or from any one of a plurality of said reference fine array values (in which case it will be designated an ambiguous value), means for measuring with an optical instrument a workpiece visible pattern in each of n fields to provide a signal indicative of a workpiece fine n-dimensional array value and means for storing said last named signal, means for forming a signal indicative of a workpiece coarse m-dimensional array value from said workpiece fine array value signal, first comparing means for comparing the signal of the workpiece coarse array value with the signals of the set of reference coarse array values to produce a signal indicating the identification of the workpiece pattern with either an unambiguous reference coarse array value or an ambiguous reference coarse array value, means responsive to a signal from said first comparing means indicative of identification with an unambiguous array value to generate a signal indicative of the reference character associated with the identified unambiguous array value, second comparing means responsive to a signal from said first comparing means indicative of identification with an ambiguous array value to compare signals indicative of values of a preselected subset of elements from the plurality of reference fine array values associated with the identified ambiguous coarse array value with the signals indicative of values of corresponding elements of the workpiece fine array, to generate a signal indicative of identification of the workpiece pattern with a particular one of the reference characters associated with the identified ambiguous value.
Specification
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- Resources
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Current AssigneeWang Laboratories Incorporated
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Original AssigneeWang Laboratories Incorporated
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InventorsWang, Patrick S.
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Primary Examiner(s)Boudreau, Leo H.
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Application NumberUS06/538,858Time in Patent Office609 DaysField of Search382/14, 382/15, 382/34, 382/37, 382/38, 358/101, 358/107, 364/513, 356/388, 356/394US Class Current382/227CPC Class CodesG06V 30/2504 Coarse or fine approaches, ...
