Fiber optic sensors for simultaneously detecting different parameters in a single sensing tip

• US 4,523,092 A
• Filed: 07/29/1982
• Issued: 06/11/1985
• Est. Priority Date: 07/29/1982
• Status: Expired due to Fees

• Current Assignee: ADC Telecommunications Incorporated (TE Connectivity Limited)
• Original Assignee: Aetna Telecommunications Laboratories
• Inventors: Nelson, Arthur R.
• Primary Examiner(s): Westin, Edward P.
• Application Number:
  US06/403,125
• Time in Patent Office: 1,048 Days
• Field of Search: 250/227, 250/226, 250/231 R, 250/231 P, 350/96.15, 356/32, 356/35.5, 73/800
• US Class Current: 250/227.23
• CPC Class Codes: G01D 5/268 using optical fibres G01D5/28 - G01D5/38 take precedence
• CPC Class Codes: G01K 11/14 of inorganic materials
• CPC Class Codes: G02B 6/29368 Light guide comprising the filter, e.g. filter deposited on a fibre end G02B6/29359 takes precedence

Abstract

A fiber optic sensor for sensing pressure, temperature, voltage and other environmental parameters. A fiber is terminated in a series of semiconductor layers, each absorbing light as a function of the sensed parameters at a different wavelength. Light is transmitted down the fiber with plural frequencies and reflected by the termination to provide in the reflected light an attenuation representative of the parameters sensed. The reflected light intensity is detected and electronically processed to provide an indication of the magnitude of the parameters being sensed. With each frequency differently attenuated, the sensed parameters are separately detected. In one implementation two discrete frequencies or wavelengths of light are directed down the unitary fiber to its termination containing first and second semiconductor layers and reflective terminations that have an absorption characteristic which is a function of the sensed parameters such that the first frequency is partially absorbed in the first layer and reflected by its termination while the second frequency is transmitted substantially unaffected through to the second layer where it is partially absorbed and reflected. The two reflected wavelengths of radiation are retransmitted through the optical fiber and coupled into receivers which provide an output signal representing the reflected light magnitude. Parameter sensitive reflective layers may be substituted for the absorptive layers. The semiconductive layers may be employed in a detector configuration.

Claims

1. A sensor system for simultaneously sensing at least two different parameters and utilizing selective absorption of a plurality of frequencies by different optical layers comprising:

an optical fiber;

means for applying radiation of a plurality of optical frequencies to said fiber;

said optical fiber having a termination operative to reflect said radiation of plural frequencies back through said optical fiber;

said termination including at least two contiguous and sequential semiconductor layers each having an optical absorption curve at a distinct wavelength wherein the absorption is a function of a parameter being sensed; and

means responsive to reflected radiation in said fiber for analyzing the reflected radiation at said plurality of frequencies to provide an indication of the value of the respective parameters.

2. The system of claim 1, wherein said applying means includes:

means for applying at least two distinct frequencies of radiation to said fiber and further including contiguous reflecting means between the semiconductor layers and at the far end of the last semiconductor layer, said reflecting means respectively reflecting light of increasing wavelength in the direction of the far end of said termination.

3. The system of claim 2, wherein said applying means includes:

means for applying at least two frequencies of radiation to two separate fibers; and

means for coupling said two separate fibers into a unitary fiber.

4. The system of claim 1, wherein said applying means includes a broadband source of radiation.

5. The system of claim 1, wherein said fiber is a single fiber optic fiber having both said applied radiation and reflected radiation travelling therethrough in opposite directions.

6. The sensor of claim 1, wherein said fiber termination includes:

first and second frequency dependent absorbing materials separated by a third frequency dependent absorbing, reflecting medium and terminated by a 100% reflective reflecting layer;

said first layer being absorptive to radiation at said first frequency as a function of said parameter and substantially transmissive to others of said plural frequencies;

said second layer being partially absorptive to the second of said plural frequencies as a function of said sensed parameter;

said third material being substantially reflective to radiation of the first of said plural frequencies and transmissive to radiation of the second of said plural frequencies whereby radiation of the first of said plural frequencies is reflected back through said fiber with an absorption characteristic substantially dependent upon said first layer and the second of said plural frequencies is reflected back through said fiber by said reflecting layer with an absorption characteristic substantially specified by said second layer.

7. The sensor of claim 1, wherein said termination includes:

a first layer reflective at a first frequency of said plural frequencies to a degree representative of the parameter being sensed in said environment and substantially transmissive to others of said plural frequencies;

a second layer located beyond said first layer and reflective to a second frequency of said plural frequencies to a degree representative of the value of the parameter sensed in said environment.

8. The system of claim 6, wherein:

said first and second layers are semiconductor materials selected from the group consisting of direct bandgap semiconductors from group II-VI or III-V, indirect bandgap materials including silicon and germanium, and noncrystalline semiconductors; and

said third layer is a dichroic layer.

9. The sensor system of claim 7, wherein said first and second layers include semiconductor materials selected from the group consisting of direct bandgap materials from group II-VI or III-V semiconductors, indirect bandgap materials including silicon and germanium, and noncrystalline semiconductors.

10. The system of claim 6, wherein said third layer is substantially transmissive at other frequencies than said first frequency.

11. The sensor of claim 1, wherein said means for providing an indication of said parameter includes means for detecting the level of reflected radiation at the first and second frequencies of said plural frequencies.

12. The system of claim 1 or 11, wherein said parameter includes temperature.

13. The system of claims 1 or 11 wherein said parameter includes pressure.

14. The system of claims 1 or 11 wherein:

said parameter includes at least two parameters; and

means are provided for separately indicating said two parameters in response to the amplitudes of the first and second frequencies of reflected radiation.

15. The system of claim 14 wherein said parameters are temperature and pressure.

16. The system of claim 1, wherein said means for indicating said parameter includes means for indicating flow velocity and said fiber termination is adapted for sensing the rate of flow of a flowing medium.

17. The system of claim 16, wherein said termination is adhered to an inner wall of a conduit containing said flowing medium.

18. The system of claims 1, 2, 4, 6, 7, 8, 9, 10, 15 or 16, wherein said fiber is a unitary fiber.