Radiation scatter apparatus and method

• US 4,525,854 A
• Filed: 03/22/1983
• Issued: 06/25/1985
• Est. Priority Date: 03/22/1983
• Status: Expired due to Term

• Current Assignee: Troxler Electronic Laboratories, Inc.
• Original Assignee: Troxler Electronic Laboratories, Inc.
• Inventors: Molbert, John L., Riddle, Eddie R.
• Primary Examiner(s): Smith, Alfred E.
• Assistant Examiner(s): Grigsby, T. N.
• Application Number:
  US06/477,820
• Time in Patent Office: 826 Days
• Field of Search: 378/89, 378/87, 378/5, 378/6, 378/54, 378/51, 378/55, 378/56, 378/90, 250/266
• US Class Current: 378/89
• CPC Class Codes: G01B 15/02 for measuring thickness
• CPC Class Codes: G01N 23/203 Measuring back scattering

Abstract

A radiation scatter gauge includes multiple detector locations for developing separate and independent sets of data from which multiple physical characteristics of a thin material and underlying substrate may be determined. In an illustrated embodiment, the apparatus and method of the invention are directed to determining characteristics of resurfaced pavement by nondestructive testing. More particularly, the density and thickness of a thin asphalt overlay and the density of the underlying pavement may be determined.

Claims

1. A radiation scatter apparatus for use in association with a relatively thin overlay material overlying a substrate material to measure the density of the overlay material, the thickness of the overlay material, and the density of the substrate material, said apparatus comprising:

source means for emitting gamma radiation into the overlay material and the substrate material;

detector means including at least three radiation detectors located in predetermined spaced relation to said source for detecting scattered radiation, each detector being so positioned and having such filtering characteristics so as to measure radiation distinctive from the radiation measured by the other detectors; and

recording means operatively associated with said detector means for separately recording measured radiation information from each said detector for use with derived mathematical relations to determine the density of the overlay material, the thickness of the overlay material, and the density of the substrate material.

2. An apparatus as set forth in claim 1 further comprising:

information storage means for storing at least three derived mathematical equations relating the recorded radiation information to the density of the overlay material, the thickness of the overlay material, and the density of the substrate material;

means for solving the mentioned equations to derive values for the density of the overlay material, the thickness of the overlay material, and the density of the substrate material; and

means for disclosing the derived values.

3. An apparatus as set forth in claim 1 wherein the recorded radiation information is in the form of count rates.

4. A radiation scatter apparatus useful for nondestructively testing an overlay applied in a pavement maintenance or resurfacing operation to determine the following three physical characteristics:

(i) the density of the overlay, (ii) the thickness of the overlay, and (iii) the density of the pavement base directly under the overlay, said apparatus comprising;

a housing having a planar bottom surface;

a source of gamma radiation contained within said housing, said source being positionable to a location proximate to the housing bottom surface to emit gamma radiation into the overlay and underlying pavement base when the apparatus is placed on an overlay;

at least three radiation detectors mounted within said housing for measuring profiles of scattered radiation, said detectors being located proximate to the housing bottom surface and at different distances from said source so that the radiation profile measured by each detector is separate and distinct from the radiation profiles measured by the others detectors; and

recording means operatively associated with said detectors for separately recording measured radiation information from each said detector.

5. An apparatus as set forth in claim 4 including filter means associated with at least certain ones of said detectors for modifying the incident energy spectrum of scattered radiation.

6. An apparatus as set forth in claim 4 including means for entering a known value of one of the physical characteristics (i), (ii), and (iii) and for using the known value in determining values of the other two characteristics.

7. An apparatus as set forth in claim 4 wherein said detectors are three in number for generating three separate and distinct accumulated counts of scattered radiation, and wherein the three accumulated counts are related to three derived mathematical relationships that are solved simultaneously to give values for the three physical characteristics (i), (ii) and (iii).

8. An apparatus as set forth in claim 4 further comprising:

information storage means for storing at least three derived mathematical equations relating the recorded information to (i) the density of the overlay, (ii) the thickness of the overlay, and (iii) the density of the underlying pavement base;

means for solving the mentioned equations to determine values for (i), (ii) and (iii) above; and

means for disclosing the derived values.

9. An apparatus as claimed in claim 8 wherein the recorded information is in the form of total radiation counts.

10. A method of testing an overlay applied in a pavement maintenance or resurfacing operation to determine values for the following three physical characteristics:

(i) the density of the overlay, (ii) the thickness of the overlay, and (iii) the density of the pavement base directly under the overlay, said method comprising the steps of;

placing a nuclear gauge over the overlay;

directing gamma radiation from a source in the gauge into the overlay and pavement base;

detecting scattered radiation counts at at least three detection points inside the gauge;

separately recording the radiation count information from each detection point; and

calculating values for the physical characteristics (i), (ii) and (iii) by solving three derived simultaneous equations, each of which functionally relates the count information associated with a respective detection point to the three values.

11. A method as set forth in claim 10 wherein the recording and calculating steps are performed by an electronic computing device that incorporates a fixed set of instructions functionally corresponding to the three mentioned equations.

12. A method of measuring the density and thickness of an overlay applied in a pavement maintenance or resurfacing operation, said method comprising the steps of:

obtaining a value for the density of the pavement base that is directly under the overlay;

directing gamma radiation from a source into the overlay and pavement base;

detecting radiation scattered therefrom with at least two detectors, each detector being so positioned and having such filtering characteristics as to measure radiation distinctive from the radiation measured by any other detector;

simultaneously solving at least two derived mathematical equations, each equation relating one of the radiation measurements to the density of the pavement base and the two unknown values for the density and thickness of the overlay; and

disclosing the calculated values.

13. A method as set forth in claim 12 wherein the values are calculated by an electronic calculating device and including the steps of entering the value of the pavement base density into the device, entering the radiation measurements into the device and simultaneously solving the equations by the device.

14. A method of testing a relatively thin material to derive values for the density of the thin material, the thickness of the thin material and the density of a substrate material underlying the thin material, said method comprising:

directing nuclear radiation from a source into the thin material and the substrate material;

detecting radiation scattered therefrom with at least three spaced detectors, each detector being so positioned and having such filtering characteristics as to measure radiation distinctive from the radiation measured by the other detectors; and

determining the three mentioned values by solving at least three simultaneous mathematical equations, each equation relating one of the radiation measurements to the three values.

15. A method of testing an overlay applied in a pavement maintenance or resurfacing operation to determine values for two of the following physical characteristics:

(i) the density of the overlay, (ii) the thickness of the overlay, and (iii) the density of the pavement base directly under the overlay, where the value for one of the three characteristics is already known, said method comprising the steps of;

directing gamma radiation from a source into the overlay and the pavement base;

making at least two measurements of scattered radiation at at least two detector locations that are in predetermined geometrical relation with respect to the source;

recording the measurements in an electronic computing device to provide discrete sets of data corresponding to the respective detector locations;

entering the known value for one of the three characteristics in the electronic computing device; and

calculating the two unknown values by simultaneously solving at least two derived equations, each of which functionally relates one of the discrete sets of data to the two unknown values and the one known value.

16. A radiation scatter apparatus useful for nondestructively testing an overlay applied in a pavement maintenance or resurfacing operation to determine values for two of the following physical characteristics:

(i) the density of the overlay, (ii) the thickness of the overlay, and (iii) the density of the pavement base directly under the overlay, where the value for one of the three characteristics is already known, said apparatus comprising;

a housing having a bottom surface;

a source of gamma radiation contained within said housing, said source being positionable to a location proximate to the housing bottom surface to emit gamma radiation into the overlay and underlying pavement base when the apparatus is placed on an overlay;

at least two radiation detectors mounted within said housing in predetermined geometrical relation with respect to the source for making respective measurements of scattered radiation; and

electronic computing means cooperating with said detectors, said computing means including means for recording the measurements from said at least two detector locations as respective discrete sets of data corresponding to the respective detector locations, means for entering the known value for one of the three characteristics, and means for calculating the two unknown values by solving at least two derived equations, each of which functionally relates one of the discrete sets of data to the two unknown values and the one known value.

17. An apparatus for measuring the density and thickness of an overlay applied in a pavement maintenance or resurfacing operation, said apparatus comprising:

a housing having a bottom surface;

a source of gamma radiation contained within said housing for emitting gamma radiation into the overlay and underlying pavement base when the apparatus is placed on an overlay;

at least two radiation detectors mounted within said housing for measuring profiles of scattered radiation, each detector being so positioned and having such filtering characteristics as to measure radiation distinctive from radiation measured by any other detector; and

electronic computing means operatively associated with said detectors, said computing means including means for solving at least two derived mathematical equations, each equation relating one of the radiation measurements to the density of the pavement base and the two unknown values for the density and thickness of the overlay, and

means for disclosing the calculated values.

18. A radiation scatter apparatus useful for nondestructively testing an overlay applied in a pavement maintenance or resurfacing operation to determine the density of the overlay, where the thickness of the overlay is already known, said apparatus comprising:

a housing having a bottom surface;

a source of gamma radiation contained within said housing, said source being positionable to a location proximate to the housing bottom surface to emit gamma radiation into the overlay and underlying pavement base when the apparatus is placed on an overlay;

at least two radiation detectors mounted within said housing in predetermined geometrical relation with respect to the source for making respective measurements of scattered radiation; and

electronic computing means cooperating with said detectors, said computing means including means for recording the measurements from said at least two detector locations as respective discrete sets of data corresponding to the respective detector locations, means for entering the known thickness of the overlay, and means for calculating the density of the overlay by solving at least two derived equations, each of which functionally relates one of the discrete sets of data to the density of the overlay, the density of the pavement base directly under the overlay, and the thickness of the overlay.