Laser activated mass spectrometer for the selective analysis of individual trace-like components in gases and liquids

• US 4,527,059 A
• Filed: 03/30/1984
• Issued: 07/02/1985
• Est. Priority Date: 06/27/1981
• Status: Expired due to Fees

• Current Assignee: Bayer AG
• Original Assignee: Bayer AG
• Inventors: Holm, Reimer, Kampf, Gunther, Benninghoven, Alfred
• Primary Examiner(s): Anderson, Bruce C.
• Application Number:
  US06/595,084
• Time in Patent Office: 459 Days
• Field of Search: 250/282, 250/287, 250/288, 250/289, 250/423 P
• US Class Current: 250/288
• CPC Class Codes: H01J 49/164 Laser desorption/ionisation, e.g. matrix-assisted laser desorption/ionisation [MALDI] sample holders H01J49/0418
• CPC Class Codes: Y10T 436/24 Nuclear magnetic resonance, electron spin resonance or other spin effects or mass spectrometry
• CPC Class Codes: Y10T 436/255 including use of a solid sorbent, semipermeable membrane, or liquid extraction

Abstract

A laser activated mass spectrometer having a sample holder for holding a given component to be investigated, a laser source for producing a laser beam to evaporate the given component and a vacuum chamber in which the evaporated component is analyzed, has the sample holder and the given component mounted outside the vacuum chamber of the mass spectrometer under atmospheric pressure or in an inert gas atmosphere. The sample holder comprises a polymer carrier film for depositing the component thereon with the carrier film forming part of a wall of the vacuum chamber of the mass spectrometer. The laser beam is directed onto the deposited component for evaporating the given component and simultaneously forming a hole in the carrier film through which the given component is transferred into the vacuum chamber of the mass spectrometer simultaneously with evaporation.

Claims

1. In a laser activated mass spectrometer having a sample holder for holding a given component to be investigated, a laser source for producing a laser beam to evaporate the given component and a vacuum chamber in which the evaporated component is analyzed, the improvement comprising:

means for mounting the sample holder and the given component outside the vacuum chamber of the mass spectrometer under atmospheric pressure or in an inert gas atmosphere, wherein the sample holder comprises a polymer carrier film for depositing the component thereon, the carrier film forming part of a wall of the vacuum chamber of the mass spectrometer and means for directing the laser beam onto the deposited component for evaporating the given component and simultaneously forming a hole in the carrier film through which the given component is transferred into the vacuum chamber of the mass spectrometer simultaneously with evaporation.

2. The mass spectrometer according to claim 1, wherein the means for mounting the sample holder comprises a support for the polymer carrier film forming a grid or diaphragm and which is built into the wall of the vacuum chamber of the mass spectrometer.

3. The mass spectrometer apparatus according to claim 2, wherein the mass spectrometer is a time flight mass spectrometer.