Method and device for analyzing a very high frequency radiation beam of electromagnetic waves

• US 4,531,126 A
• Filed: 05/17/1982
• Issued: 07/23/1985
• Est. Priority Date: 05/18/1981
• Status: Expired due to Fees

• Current Assignee: Societe D'Etude Du Radant
• Original Assignee: Societe D'Etude Du Radant
• Inventors: Sadones, Henri
• Primary Examiner(s): Tubbesing, T. H.
• Assistant Examiner(s): Sotomayor, John B.
• Application Number:
  US06/379,194
• Time in Patent Office: 1,163 Days
• Field of Search: 333/21 A, 333/21 R, 343/786, 343/754, 343/909, 343/17.7, 343/17.1 R, 340/825.77
• US Class Current: 342/173
• CPC Class Codes: G01R 29/10 Radiation diagrams of antennas

Abstract

The invention refers to the analysis of a very high frequency radiation beam of electromagnetic waves. According to the invention, a network of conductor wires is placed in the path of a beam to be analyzed, the wires being interrupted at intervals by switches. One controls the conducting state of a diode and one blocks the others and one makes the position of the diode vary electronically and sequentially in the conducting state. The return signal received on a sensor R is used by detecting the significant characteristics of that return according to the position of the diodes in the conducting state.

Claims

1. In an antenna beam analyzing system, a selectively reflective structure positioned in confronting relation to an antenna and comprising:

a first plurality of coplanar conductors disposed in parallel spaced relation;

a second plurality of coplanar conductors disposed in parallel spaced relation to each other and respectively orthogonal to the first conductor plurality so that the conductors form a matrix configuration having individual contiguous mesh-like units;

means mounting the planes of the first and second conductor pluralities in spaced non-contacting relation;

a diode array including individual diodes uniquely connected between a conductor of the first plurality and a conductor of the second plurality, each diode oriented parallel to the electric field of the antenna beam; and

means for individually switching a small number of adjacent diodes to a first state while switching the remaining diodes to a second state, the switching means further addressing a different small number of diodes during sequential intervals in a predetermined pattern causing changing corresponding return signals to the antenna.

2. The structure set forth in claim 1 wherein the first and second conductor pluralities are printed on opposite sides of a circuit board, and further wherein "feed-thru" conductor means are provided for connecting individual diodes to respective conductors of the first and second conductor pluralities

3. A method for analyzing a radar beam comprising the steps:

forming a first plurality of coplanar conductors disposed in parallel spaced relation;

forming a second plurality of coplanar conductors disposed in parallel spaced relation to each other and respectively orthogonal to the first conductor plurality so that the conductors form a matrix configuration having individual contiguous mesh-like units;

mounting the planes of the first and second conductor pluralities in spaced non-contacting relation;

forming a diode array including individual diodes uniquely connected between a conductor of the first plurality and a conductor of the second plurality, each diode oriented parallel to the electric field of the antenna beam;

individually switching a small number of adjacent diodes to a first state while switching the remaining diodes to a second state; and

addressing a different small number of diodes during sequential intervals in a predetermined pattern causing changing corresponding return signals to the antenna.

4. The method set forth in claim 3 together with the step of

printing the first and second conductor pluralities on opposite sides of a circuit board;

and

forming "feed-thru" conductor means through the board for connecting individual diodes to respective conductors of the first and second pluralities.

5. The method set forth in claim 3 together with the steps of:

receiving return signals from the interconnected conductors and diodes; and

storing the returned signals for analysis of each return as a function of the correspondingly addressed diodes.

6. The method set forth in claim 3 together with the step of modulating a current through addressed diodes to obtain correspondingly modulated return signals.

7. The method set forth in claim 4 together with the steps of:

receiving return signals from the interconnected conductors and diodes;

storing the returned signals for analysis of each return as a function of the correspondingly addressed diodes;

modulating a current through addressed diodes to obtain correspondingly modulated returns; and

wherein the dimension between adjacent conductors of the first plurality is smaller than the wavelength of the antenna beam undergoing analysis.