Reconstruction system and methods for impedance imaging

• US 4,539,640 A
• Filed: 08/10/1982
• Issued: 09/03/1985
• Est. Priority Date: 01/12/1982
• Status: Expired due to Term

• Current Assignee: TASC Incorporated
• Original Assignee: TASC Incorporated
• Inventors: Wexler, Alvin, Fry, Bradley
• Primary Examiner(s): Smith, Jerry
• Assistant Examiner(s): Woo, Louis
• Application Number:
  US06/407,275
• Time in Patent Office: 1,120 Days
• Field of Search: 364/414, 128/734, 128/644, 128/639
• US Class Current: 600/547
• CPC Class Codes: A61B 5/0536 Impedance imaging, e.g. by tomography
• CPC Class Codes: G01N 27/041 of a solid body

Abstract

A method and apparatus for imaging the interior of a structure, such as a mineral or human body, having regions therein which differentially affect particular characteristics of electrical signals transmitted through the body. The method involves injecting a plurality of electrical signals into the body, measuring at least one characteristic of each such signal at a plurality of locations, comparing the measured characteristic with the corresponding characteristic measured at at least one reference point of the structure and generating comparison signals, iteratively reconstructing the impedance spatial relationships between the regions within the structure by utilizing the comparison signals, and providing an image of the interior of the structure from the reconstruction of such impedance spatial relationships.

Claims

1. A method of displaying an image of the interior of a structure having a plurality of surfaces and comprising regions of different conductivities which differentially affect electrical signals transmitted therethrough, said method comprising the steps of:

(a) applying electrical input currents at a plurality of selected current input sites of said structures, each of said electrical input currents flowing within at least one of said regions and exiting from said structure at a selected current output site thereof;

(b) measuring the voltages generated by each of said applied currents at a plurality of selected voltage measuring sites of said structure with respect to a voltage reference point, each of said selected voltage measuring sites being remote from the current input and output sites through which flows the current generating said voltages;

(c) calculating the voltages φ

at a plurality of locations within said structure, including said selected voltage measuring sites, with respect to said voltage reference point from the equation

space="preserve" listing-type="equation">-∇

·

κ

∇

φ

=f,

where κ

is a value of conductivity assumed for each of said locations and f is the density of each of the electrical input currents at said current input and output sites, the current traversing the surfaces of said structure except at said current input and output sites being assumed equal to zero;

(d) calculating the electrical current flux density J at each of the locations for which the voltage was calculated in step (c) from the equation

space="preserve" listing-type="equation">J=-κ

∇

φ

;

(e) comparing the voltages calculated in step (c) for each of said selected voltage measuring sites of said structure and the corresponding voltages measured at said selected sites in step (b);

(f) repeating steps (c) and (d) when the difference between the voltages compared in step (e) are greater than a predetermined amount, the voltages measured in step (b) then being substituted at said selected voltage measuring sites for the voltages calculated in step (c);

(g) calculating new values for κ

for each of said locations when the squared residual sum R equals ##EQU7## where V is the region over which the imaging is being performed and X represents the excitations over which the sum is taken, by determining the values of κ

which minimize R throughout said structure;

(h) repeating steps (f) and (g) until the voltages compared in step (e) do not exceed said predetermined amount; and

(i) displaying the values of κ

calculating in step (h) thereby providing an image of the interior of said structure.

2. The method of claim 1, wherein said electrical input currents are applied in time sequence.

3. The method of claim 1, wherein said electrical input currents are applied in parallel by frequency multiplexing.

4. The method of claim 1, wherein the amplitude of each voltage is measured.

5. The method of claim 4, wherein the phase of each voltage is also measured.

6. Apparatus for displaying an image of the interior of a structure having a plurality of surfaces and comprising regions of different conductivities which differentially affect electrical signals transmitted therethrough, comprising

a plurality of unguarded electrodes located at selected sites of said structure, a first group of said electrodes functioning as input electrodes during a given interval of time and a second group of said electrodes functioning as output electrodes during said given interval;

means for applying electrical currents during said given interval to said first group of electrodes, said electrical currents flowing within at least one of said regions;

means for withdrawing said electrical currents from said structure during said given interval at said second group of electrodes;

means for selecting during said given interval a plurality of voltages measuring sites of said structure, said voltage measuring sites being remote from the sites selected during said interval for said first and second groups of electrodes;

means for measuring the voltages at said selected plurality of voltages measuring sites with respect to a voltage reference point, said measurements being made during said given interval;

computer means for

(1) calculating the voltages φ

at a plurality of locations within said structure, including said selected voltage measuring sites, with respect to said voltage reference point from the equation

space="preserve" listing-type="equation">-∇

·

κ

∇

φ

=f,

where κ

is a value of conductivity assumed for each of said locations and f is the density of each of the electrical input currents at said current input and output sites, the current traversing the surfaces of said structure except at said current input and output sites being assumed equal to zero;

(2) calculating the electrical current flux density J at each of the locations for which the voltage was calculated from the equation

space="preserve" listing-type="equation">J=-κ

∇

φ

;

(3) comparing the calculated voltages with the voltages measured at said plurality of selected voltage measuring sites; and

(4) iteratively calculating new values of the conductivity κ

for each of said locations when the squared residual sum R equals ##EQU8## where V is the region over which the imaging is being performed and X represents the excitations over which the sum is taken, by determining the values of κ

which minimize R throughout said structure; and

display means for displaying the values of conductivity κ

thereby producing an image of the interior of said structure.

7. Apparatus as claimed in claim 6, wherein said means for measuring the voltages at said selected plurality of voltage measuring sites measures the amplitudes of said voltages.

8. Apparatus as claimed in claim 7, wherein said means for measuring the voltages at said selected plurality of voltage measuring sites also measures the phase of each of said voltages.

9. Apparatus as claimed in claim 6 wherein said means for applying and withdrawing electrical currents comprises

a signal generating source;

a voltage-controlled current source having its input coupled to the output of said signal generating source, and

input and output current multiplexers coupling the output of said voltage-controlled current source to said first and second groups of electrodes.

10. Apparatus as claimed in claim 9 wherein said means for selecting said voltage measuring sites and measuring the voltages at said sites comprises at least one voltage multiplexer and a differential amplifier, respectively, said voltage multiplexer coupling electrodes at said voltage measuring sites to the input of said differential amplifier for measurement of the amplitudes of the voltages at said voltage measuring sites with respect to said voltage reference point.

11. Apparatus as claimed in claim 10 which further comprises a band-pass filter coupled to the output of said band-pass filter, and a storage means coupled to the output of said differential amplifier for storing said measured voltage.

12. Apparatus as claimed in claim 11 which further comprises an analog-to-digital converter for receiving the contents of said storage means.

13. Apparatus as claimed in claim 12 which further comprises a comparator, the output of said band-pass filter being connected to said comparator for determining the polarity of the output signal from said filter relative to a reference ground potential.

14. Apparatus as claimed in claim 13 which further comprises tri-state latches, said tri-state latches being connected to the respective outputs of said comparator and said analog-to-digital converter for storage of said determined polarity voltage and the converted voltage from said converter.

15. Apparatus as claimed in claim 14 wherein said computer means reads the contents of said tri-state latches, processes said contents and generates an output therefrom to drive said display device.

16. Apparatus as claimed in claim 15 which further comprises logic decoding and buffer means, said computer means controlling said input and output current multiplexers and said voltage multiplexer through said logic decoding and buffer means for selection of said electrodes for current injection, current withdrawal and voltage measurement.

17. Apparatus as claimed in claim 6 wherein said means for selecting said voltage measuring sites and measuring the voltages at said sites comprises at least one voltage multiplexer and a differential amplifier, respectively, said voltage multiplexer coupling electrodes at said voltage measuring sites to the input of said differential amplifier for measurement of the amplitudes of the voltages at said voltage measuring sites with respect to said voltage reference point.

18. Apparatus as claimed in claim 17 which further comprises means for measuring the phase of each of said voltages.