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Multiple aptitude testing device

  • US 4,541,806 A
  • Filed: 09/10/1982
  • Issued: 09/17/1985
  • Est. Priority Date: 09/10/1982
  • Status: Expired due to Term
First Claim
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1. An electronic testing device which utilizes a plurality of objectives test questions to evaluate an examine wherein said device comprises a housing, overlay means which is releasably secured to said housing, said overlay means containing indicia forming a plurality of questions and a plurality of possible answers corresponding to each of said questions, said overlay means further including coding means which communicates with corresponding means on said housing to specify a set of correct answers to said questions, selector means for enabling said examinee to select an answer for each of said questions, answer storage means for storing answers selected by the examinee, answer pattern memory means for storing the set of correct answers for particular test and comparison means for comparing said selected answers with said set of correct answers following completion of said test and producing a signal which is transmitted to an indicator means, resulting in the indicator means producing a test score signal indicative of the degree of correspondence between said correct set of answers and said selected answers, to evaluate the examinee'"'"'s level of performance on said test.

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