Spectrometer with selectable area detector

• US 4,542,295 A
• Filed: 09/29/1983
• Issued: 09/17/1985
• Est. Priority Date: 09/29/1983
• Status: Expired due to Fees

• Current Assignee: David R. Mattson, Patrick J. Coffey
• Original Assignee: David R. Mattson, Patrick J. Coffey
• Inventors: Mattson, David R., Coffey, Patrick J.
• Primary Examiner(s): Smith, Alfred E.
• Assistant Examiner(s): Hannaher, Constantine
• Application Number:
  US06/537,111
• Time in Patent Office: 719 Days
• Field of Search: 250/338 SE, 250/338 R, 250/349, 250/350, 250/351, 250/352, 250/370 JX, 250/370 K, 250/370 R, 250/370 H, 250/370 G, 250/358.1, 250/372, 250/394, 357/29, 356/222, 356/346, 378/116
• US Class Current: 250/352
• CPC Class Codes: G01J 1/42 using electric radiation detectors optical or mechanical part G01J1/04; by comparison with a reference light or electric value G01J1/10
• CPC Class Codes: G01J 3/02 Details
• CPC Class Codes: G01J 3/0289 Field-of-view determination; Aiming or pointing of a spectrometer; Adjusting alignment; Encoding angular position; Size of measurement area; Position tracking
• CPC Class Codes: G01J 3/2803 using photoelectric array detector
• CPC Class Codes: G01J 3/453 by correlation of the amplitudes
• CPC Class Codes: H01L 25/042 the devices being arranged next to each other solar cells H01L31/042
• CPC Class Codes: H01L 2924/00 Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
• CPC Class Codes: H01L 2924/0002 Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
• CPC Class Codes: H01L 31/035281 Shape of the body
• CPC Class Codes: Y02E 10/50 Photovoltaic [PV] energy

Abstract

A Fourier transform infrared spectrometer utilizes a selectable area infrared detector to optimize performance of the instrument depending upon the nature of the sample being analyzed. The detector includes an inner detecting segment and one or more outer detecting segments which extend at least partially around the inner segment and are electrically isolated therefrom. In those cases where a small area detector provides optimal sensitivity and performance, only the inner detecting segment is enabled to contribute to the output of the detector. In those cases where a larger area detector provides optimal sensitivity and performance, one or more of the outer detecting segments are enabled to contribute to the output of the detector, either alone or in combination with the inner segment. Thus, a single detector in the instrument provides optimal sensitivity and performance for a wide range of applications.

Claims

1. Apparatus for analyzing a sample by interacting a beam of radiant energy with the sample, said apparatus including means for detecting the beam of radiant energy after interaction with the sample and for producing an electrical output corresponding thereto, said detecting means comprising:

A. a first detecting segment for producing an electrical signal in response to radiant energy incident thereon;

B. a second detecting segment for producing an electrical signal in response to radiant energy incident thereon, said second detecting segment extending at least partially around said first detecting segment and being electrically isolated from said first detecting segment; and

C. output selection means operable in a first mode for enabling the electrical signal only from said first detecting segment to contribute to the output of said detecting means, and in a second mode for enabling the electrical signal from at least said second detecting segment to contribute to the output of said detecting means.

2. The apparatus of claim 1 in which said second detecting segment has a substantially annular shape with inner and outer boundaries, and in which said first detecting segment is spaced from and positioned within the inner boundary of said second detecting segment, the area within the outer boundary of said second detecting segment thereby being greater than the area defined by said first detecting segment.

3. The apparatus of claim 2 in which said second detecting segment has a substantially circular annular shape with a substantially circular inner boundary, and in which said first detecting segment has a substantially circular shape of diameter slightly less than the diameter of the inner boundary of said second detecting segment.

4. The apparatus of claim 3 in which the outer boundary of said second detecting segment has a diameter of about three millimeters and in which said first detecting segment has a diameter of about one millimeter.

5. The apparatus of claim 2 in which said second detecting segment has a substantially square annular shape with a substantially square inner boundary, and in which said first detecting segment has a substantially square shape of height and width slightly less than the height and width of the inner boundary of said second detecting segment.

6. The apparatus of claim 2 in which each of said first and second detecting segments has at least one lead electrically connected thereto and extending therefrom for carrying the electrical signals produced thereby, and in which said second detecting segment extends only partially around said first detecting segment, thereby defining an opening of sufficient size to receive said lead extending from said first detecting segment.

7. The apparatus of claim 1 in which said output selection means includes means operable in said second mode for selecting the electrical signal only from said second detecting segment as the output of said detecting means.

8. The apparatus of claim 1 in which said output selection means includes means operable in said second mode for summing the electrical signals from both said first and said second detecting segments as the output of said detecting means.

9. The apparatus of claim 8 in which said output selection means further includes means for independently amplifying the respective electrical signals from said first and second detecting segments, whereby the gain of the respective electrical signals may be balanced relative to one another.

10. The apparatus of claim 1 in which said output selection means comprises switch means for receiving the electrical signals from said first and second detecting segments, said switch means in said first mode passing the electrical signal only from said first detecting segment, and in said second mode passing the electrical signal from at least said second detecting segment.

11. The apparatus of claim 1 in which said output selection means comprises means for supplying bias current to each of said first and second detecting segments, said segments being rendered responsive to the radiant energy when bias current is supplied thereto, said bias current supplying means in said first mode supplying bias current only to said first detecting segment and in said second mode supplying bias current to at least said second detecting segment.

12. The apparatus of claim 1 in which said detecting means further includes a third detecting segment for producing an electrical signal in response to radiant energy incident thereon, said third detecting segment being electrically isolated from said first and second detecting segments and extending at least partially around said second detecting segment, and in which said output selection means is further operable in a third mode for enabling the electrical signal from at least the third detecting segment to contribute to the output of said detecting means.

13. The apparatus of claim 1 further including a source of said beam of radiant energy, said radiant energy being in the infrared region of the electromagnetic spectrum.

14. Tne apparatus of claim 13 in which said first and second detecting segments are fabricated from mercury cadmium telluride.

15. The apparatus of claim 14 in which said detecting means further includes means for cooling said first and second segments to a cryogenic temperature.

16. Apparatus for analyzing a sample by interacting a beam of infrared radiation with the sample, said apparatus comprising:

A. a source for producing a beam of infrared radiation;

B. means for varying the intensity of said beam of infrared radiation;

C. means for directing said beam of infrared radiation for interaction with the sample;

D. means for detecting the beam of infrared radiation after interaction with the sample and for producing an electrical output corresponding thereto, said detecting means comprising;

i. a first detecting segment for producing an electrical signal in response to infrared radiation incident thereon; and

ii. a second detecting segment for producing an electrical signal in response to infrared radiation incident thereon, said second detecting segment extending at least partially around said first detecting segment and being electrically isolated from said first detecting segment; and

E. output selection means operable in a first mode for enabling the electrical signal only from said first detecting segment to contribute to the output of said detecting means, and in a second mode for enabling the electrical signal from at least said second detecting segment to contribute to the output of said detecting means.

17. The apparatus of claim 16 in which said intensity varying means comprises an interferometer.

18. The apparatus of claim 16 further including:

F. means for performing Fourier transform analysis on the output of said detecting means.

19. The apparatus of claim 16 further including:

G. means for varying the beam size of said beam of infrared radiation emitted by said source.

20. The apparatus of claim 16 in which said intensity varying means includes means for controlling the rate of change of the intensity of said beam of infrared radiation.