Method of detecting and evaluating photometric signals and device for carrying out the method

• US 4,553,848 A
• Filed: 08/31/1982
• Issued: 11/19/1985
• Est. Priority Date: 09/30/1981
• Status: Expired due to Term

• Current Assignee: Boehringer Mannheim GmbH (Roche Holding AG)
• Original Assignee: Boehringer Mannheim GmbH (Roche Holding AG)
• Inventors: Rosicke, Bernd, Rosenbladt, Rudolf V.
• Primary Examiner(s): ROSENBERGER, RICHARD A
• Application Number:
  US06/413,291
• Time in Patent Office: 1,176 Days
• Field of Search: 356/445, 356/446, 356/447, 356/448, 356/236, 356/215, 356/223, 356/226, 250/228, 250/214 C
• US Class Current: 356/448
• CPC Class Codes: G01J 1/16 using electric radiation detectors G01J1/20 takes precedence
• CPC Class Codes: G01N 21/27 using photo-electric detection G01N21/31 takes precedence; circuits for computing concentration logarithmic circuits G06G7/24; photometric circuits in general G01J
• CPC Class Codes: H03M 1/52 Input signal integrated with linear return to datum

Abstract

A method and device for detecting and evaluating the optical properties of a specimen, utilizing a light source that has alternating light and dark phases, a detector that picks up light from the light source by way of the specimen being examined, and a circuit that integrates and digitalizes the signals received from the detector, that includes an integrator, and that can be connected to the detector. The signals emitted from the detector are integrated both during at least part of the light phase and during at least part of the dark phase. The integral obtained during the dark phase is subtracted from that obtained during the light phase in order to determine the results. The integrator that is used to integrate the signals is used like an analog-to-digital converter of the double-integration type to convert the integral into a digital signal. To achieve maximum precision and simplicity in the integration and digitalization phase, each part of the light or dark phase is followed by a measurement-voltage period during which the signals coming from the detector are applied in sequence and with opposite mathematical signs to a single integrator. Integration is carried out over a whole number of measurement-voltage periods to form a total integral.

Claims

1. In a method for detecting and evaluating the optical properties of a specimen including producing alternating light and dark phases from a light source, detecting light from the light source by way of an analog specimen to produce a signal, integrating and digitalizing the signal from the detector during the light phase and during the dark phase and subtracting the integral obtained during the dark phase from that obtained during the light phase, the improvement wherein the steps of integrating and digitalizing comprise:

forming a first total integral in a first state including a whole number of measurement voltage periods each including one light and one dark phase

comprising the steps in each period of integrating the detected signal during a part of the light phase with a single integrator and integrating the detected signal with the reversed polarity with the same single integrator during a part of the dark phase equal in length to the part of the light phase and digitalizing the total integral with the same single integrator.

2. The method according to claim 1, wherein the steps of integrating the detected signal during the light and dark phases each comprise delaying the start of the integrating by the same predetermined time after the start of the light and dark phases.

3. The method according to claim 1 or 2, wherein the whole number of measurement-voltage periods is greater than 1.

4. The method according to claim 1 or 2, further comprising energizing the light source with an ac power supply and wherein the length of the measurement-voltage period is an even multiple of the period of the power supply frequency.

5. The method according to claim 1, further comprising detecting light from the light source by way of a reference light detector and producing a reference signal and wherein the steps of integrating and digitalizing comprises forming a second total integral of the reference signal in a second stage equivalent to the first stage and using the same single integrator, digitalizing the second total integral of the reference signal with the same single integrator and forming a quotient of the digitalized total integrals from the two stages.

6. The method according to claim 5, further comprising providing a zero signal to the same single integrator and wherein the steps of integrating and digitalizing further comprises forming a third total integral of the zero signal in a third stage equivalent to the first stage and using the same single integrator, digitalizing the third total and correcting the first and second total integrals with the digitalized third total integral before forming the quotient.

7. In a device for detecting and evaluating the optical properties of a specimen having a light source, means for producing alternating light and dark phases from a light source, first means for detecting light from the light source by way of a specimen and produce an analog signal, an integrating and digitalizing circuit receptive of the signal from the detecting means during the light phase and during the dark phase means for subtracting the integral obtained during the dark phase from that obtained during the light phase, the improvement wherein the integrating and digitalizing circuit comprises:

means forming a first total integral during first stage including a whole number of measurement-voltage periods each including one light and one dark phase a single integrator and means synchronized with the means producing the light and dark phases for applying in each period the detected signal during a part of the light phase to the input of the single integrator and for applying the detected signal with the opposite polarity during a part of the dark phase equal in length to the part of the light phase to the input of the single integrator and means for digitalizing the total integral comprising the single integrator.

8. The device according to claim 7, wherein the means for applying the detected signal during the light and dark phases comprises means for delaying the start of the integrating by the same predetermined time after the start of the light and dark phases.

9. The device according to claim 7 or 8, wherein the whole number of measurement-voltage periods is greater than 1.

10. The device according to claim 7 or 8, further comprising means for energizing the light source comprising an ac power supply and wherein the length of the measurement-voltage period is a even multiple of the period of the power supply frequency.

11. The device according to claim 7, further comprising second means for detecting light from the light source as a reference and for producing a reference signal and wherein the integrating and digitalizing circuit further comprises means forming a second total integral of the reference signal during a second stage equivalent to the first stage and comprising the same integrator, means for digitalizing the second total integral of the reference signal with the same single integrator and means forming a quotient of the digitalized total integrals.

12. The device according to claim 11, further comprising means for applying a zero signal to the same single integrator and wherein the integrating and digitalizing circuit further comprises means forming a third total integral of the zero signal during a third stage equivalent to the first stage and comprising the same single integrator, means for digitalizing the third total integral and means for substracting the digitalized third total integral from the digitalized first and second total integrals and forming the quotient of the difference between the first total integral and the third total integral and of the difference between the second total integral and the third total integral.

13. The device according to claim 12, wherein the first and second detecting means comprises photodiodes and wherein the integrating and digitalizing circuit includes a current to voltage converter.