Piezoelectric contamination detector

• US 4,561,286 A
• Filed: 06/28/1984
• Issued: 12/31/1985
• Est. Priority Date: 07/13/1983
• Status: Expired due to Term

• Current Assignee: Laboratoire Suisse De Recherches Horlogeres
• Original Assignee: Laboratoire Suisse De Recherches Horlogeres
• Inventors: Sekler, Jorg, Hintermann, Hans Erich, Zumsteg, Alphonse E.
• Primary Examiner(s): Kreitman, Stephen A.
• Application Number:
  US06/625,550
• Time in Patent Office: 551 Days
• Field of Search: 73/23, 73/28, 73/29, 310/315, 310/341
• US Class Current: 73/24.06
• CPC Class Codes: G01B 7/066 for measuring thickness of coating apparatus or processes for the manufacture of piezoelectric or electrostrictive resonators for obtaining desired frequency H03H3/04
• CPC Class Codes: G01N 2291/02881 Temperature

Abstract

A piezoelectric detector for determination of the mass or film thickness of gaseous, liquid or solid substances being adsorbed or condensed on the surface of a piezoelectric resonator, having at least one measuring resonator with at least one integrated thin-film sensor, one discrete or integrated on the resonator re-evaporation heating element, and a reference resonator separated from the measuring resonator with a contamination shield, and protected from contamination, but not from heat radiation, with an optical window, which all allow correction by electronic or numerical means of influences of temperature changes on the resonant frequency and of cut-angle deviations and the temperature differences between the resonators.

Claims

1. A piezoelectric contamination detector comprising:

a piezoelectric mesuring resonator having at least one thin-film temperature sensor integrated therewith;

a reference resonator;

a cooling/heting chamber housing said resonators;

a contamination shield separating said reference resonator from said measuring resonator;

an optical window in a wall of said cooling/heating chamber protecting said reference resonator from external contamination, said optical window being substantially transparent to heat radiation; and

a detector housing enclosing said cooling/heating chamber;

wherein exterior surfaces of the cooling/heating chamber and interior surfaces of the detector housing are at least partially treated with a thermal control coating having low thermo-optical emissivity but high reflectivity, thereby minimizing heat loss between the cooling/heating chamber and the detector housing.

2. The piezoelectric contamination detector of claim 1, wherein said integrated thin-film temperature sensor comprises a resistive element.

3. The piezoelectric contamination detector of claim 1, wherein said integrated thin-film temperature sensor comprises a semiconductor material.

4. The piezoelectric contamination detector of claim 1, wherein said integrated thin-film temperature sensor comprises a thermocouple.

5. The piezoelectric contamination detector of claim 1, wherein said measuring resonator has at least one electrode, which electrode comprising a thin-film temperature sensor.

6. The piezoelectric contamination detector of claim 1, additionally comprising a resistive heater separate from the measuring resonator for outbaking the measuring resonator.

7. The piezoelectric contamination detector of claim 6, the integrated thin-film temperature sensor and heating element have a resistivity-increasing geometrical structure.

8. The piezoelectric contamination detector of claim 7, wherein the sensor and heating element have a zig-zag or meandering shape.

9. The piezoelectric contamination detector of claim 1, additionally comprising a resistive heating element for out-baking the measuring resonator, which element is integrated on the surface of the measuring resonator separately from the thin-film temperature sensor.

10. The piezoelectric contamination detector of claim 1, wherein the thin-film temperature sensor is also formed to perform as a resistive heating element for outbaking the measuring resonator.

11. The piezoelectric contamination detector of claim 1, wherein said measuring resonator has at least one electrode formed to perform both as a thin-film temperature sensor and as a resistive heating element for outbaking the measuring resonator.

12. The piezoelectric contamination detector of claim 1, wherein the reference resonator is also provided with at least one integrated thin-film temperature sensor.

13. The piezoelectric contamination detector of claim 1, additionally comprising a thermoelectric element for heating or cooling the cooling/heating chamber.

14. A piezoelectric contamination detector comprising:

a piezoelectric measuring resonator having at least one thin-film temperature sensor integrated therewith;

a reference resonator;

a cooling/heating chamber housing said resonators;

a contamination shield separating said reference resonator from said measuring resonator;

an optical window in a wall of said cooling/heating chamber protecting said reference resonator from external contamination, said optical window being substantially transparent to heat radiation; and

a detector housing enclosing said cooling/heating chamber;

wherein interior surfaces of the cooling/heating chamber are at least partially treated with a thermal control coating having thermo-optical emissivity and absorption values close to those of a black body, thereby providing high heat exchange between the cooling/heating chamber and the resonators.

15. A small, low weight, low energy consumption piezoelectric contamination detector providing improved fast-transient thermal measurement capabilities for outgassing control in a vacuum, comprising:

a detector housing having interior surfaces at least partially treated with a thermal coating having low thermal-optical emissivity but high reflectivity;

a heating/cooling chamber within said housing having exterior surfaces at least partially treated with a thermal coating having low thermo-optical emissivity but high reflectivity and interior surfaces at least partially treated with a thermal coating having a thermo-optical emissivity similar to that of a black body;

a thermo-electric element for heating or cooling said heating/cooling chamber;

a measurement resonator and a reference resonator mounted side by side inside of said heating/cooling chamber, each said resonator having at least one thin-film temperature sensor integrated therewith;

a contamination shield separating said reference resonator from said measurement resonator and from external contamination;

a heat-transmitting optical window in a wall of at least one of said detector housing and said heating/cooling chamber for protecting said reference resonator from external contamination but not from thermal radiation; and

heater means in said heating/cooling chamber for outbaking said measurement resonator.

16. The piezoelectric contamination detector of claim 15, wherein the electrodes and the integrated thin-film temperature sensors and heating elements are produced by a process selected from the group consisting of physical, chemical and galvanic deposition methods using gas, liquid or solid state reactions.

17. The piezoelectric contamination detector of claim 15, wherein said sensor and heating elements are produced by a process selected from the group consisting of evaporation, sputtering, chemical deposition and electrochemical deposition.

18. A piezoelectric contamination detector of claim 15, wherein said heater is integrated on a surface of the measuring resonator.

19. The piezoelectric contamination detector of claim 18, wherein the electrodes and the integrated thin-film temperature sensors and heating elements are produced by a process selected from the group consisting of physical, chemical and galvanic deposition methods using gas, liquid or solid state reactions.

20. The piezoelectric contamination detector of claim 19, wherein said electrodes, sensor and heating elements are produced by a process selected from the group consisting of evaporation, sputtering, chemical deposition and electrochemical deposition.