Distance-independent optical reflectance instrument

• US 4,568,191 A
• Filed: 07/01/1983
• Issued: 02/04/1986
• Est. Priority Date: 07/14/1982
• Status: Expired due to Term

• Current Assignee: Compur-Electronic GmbH
• Original Assignee: Compur-Electronic GmbH
• Inventors: Barry, Jurgen
• Primary Examiner(s): McGraw, Vincent P.
• Application Number:
  US06/510,454
• Time in Patent Office: 949 Days
• Field of Search: 356/445, 356/446
• US Class Current: 356/446
• CPC Class Codes: G01N 2021/478 Application in testing analytical test strips
• CPC Class Codes: G01N 21/474 Details of optical heads therefor, e.g. using optical fibres

Abstract

In known apparatus for taking reflectance readings the accuracy is very highly dependent on the distance between the transmitter and/or receiver area, on the one hand, from the surface whose reflectance is to be measured on the other. In the invention, in the field of measurement, the beam from a transmitter has superimposed on it the beam of at least one further transmitter so that within a wide range of operation readings are made independent of the distance between the said field on the one hand and the transmitter and/or receiver plane on the other and for this reason there is a deep range of measurement, that is to say compensation of depth. Preferably the transmitters are placed axially symmetrically with respect to the axis of the received beam (beam coming from the sample) or planarly symmetrical with respect to a plane containing the axis of the said beam.

Claims

1. A process for measuring reflectance at the surface of a plurality of samples using a transmitted beam from a transmitter and using a receiver receiving a reflected beam from said sample comprising:

transmitting beams from at least two transmitters to one of said samples;

arranging said transmitters so that said beams are at least partially superimposed on a surface of said sample where said beams impinge;

receiving a reflected beam from said sample with said receiver; and

positioning said samples so that the distance from each said sample to said receiver varies substantially from sample to sample.

2. The process of measurement as claimed in claim 1 wherein the beams that are superimposed on each other are in substance symmetrical in relation to an axis of the received beam.

3. The process of claim 1 wherein said distance from said sample to said receiver varies from an optimum distance at which the intensity of said reflected beam at said receiver is a maximum by a maximum of 15% of said optimum distance.

4. An apparatus for the measurement of reflectance at the surface of a sample, comprising:

a transmitter for directing a transmitted beam towards said sample;

a receiver for receiving radiation coming from said sample after undergoing reflectance on a surface thereof;

a further transmitter placed generally axially symmetrically with respect to an axis of said received beam such that beams from said transmitters are superimposed on a portion of said surface of said sample; and

means for passing a plurality of said samples past said transmitters such that a distance from said receiver to said surface of said sample varies substantially from sample to sample.

5. The apparatus as claimed in claim 4 wherein the axes of said transmitted beams are at an angle α

to the axis of said received beam, said angle α

being greater than 0° and

not greater than 90°

.

6. The apparatus as claimed in claim 4 wherein said transmitters are placed on a ring running round said axis of said received beam.

7. The apparatus as claimed in claim 4 comprising a ring-like transmitter placed round said axis of said received beam.

8. The apparatus as claimed in claim 4 wherein the transmitters are changed over in position to be in the position of the receiver and the receiver and changed over so as to be in the positions of the transmitters.

9. An apparatus for measuring reflectance at the surface of a sample comprising:

a transmitter for directing radiation onto said sample;

a receiver for receiving a beam of such radiation after reflectance at said sample;

at least one further transmitter placed generally symmetrically in a plane containing an axis of said received beam, said further transmitter being placed such that beams from said transmitters are superimposed on a portion of a surface of said sample; and

means for passing a plurality of said samples past said transmitters such that a distance from said receiver to said surface of a sample passing said transmitters varies substantially from sample to sample.

10. The apparatus as claimed in claim 9 wherein axes of said transmitted beams are each at an angle α

to the axis of the received beam, said angle α

being greater than 0° and

not greater than 90°

.

11. The apparatus as claimed in claim 9 wherein the axes of the transmitted beams are generally parallel to each other and are at an angle α

to the axis of the received beam, the angle α

being greater than 0° and

not greater than 90°

.

12. The apparatus as claimed in claim 9 comprising at least two such receivers placed in a row.

13. The apparatus of claim 9 wherein said distance from said sample to said receiver varies from an optimum distance at which the intensity of said beam at said receiver is a maximum by a maximum of 15% of said optimum distance.

14. A process for measuring reflectance at the surface of a plurality of samples using a transmitted light beam from a plurality of transmitters and using a receiver receiving a reflected beam from a surface of each said sample such that said measured reflectance is substantially insensitive to variations in a distance between said receiver and said sample surface, comprising:

transmitting light beams from at least two transmitters to one of said samples;

arranging said transmitters so that said beams are superimposed over at least a portion of said surface of said sample;

receiving a reflected beam from said sample with said receiver;

moving said samples past said transmitters and receivers such that said surface of said samples is near an optimum distance from said receiver where said reflected beam has a maximum intensity; and

permitting the distance from said receiver to said surface of said samples to vary relative to said optimum distance over a range of up to 15% of said optimum distance.