Method and apparatus for time-aligning data

• US 4,574,354 A
• Filed: 11/19/1982
• Issued: 03/04/1986
• Est. Priority Date: 11/19/1982
• Status: Expired due to Fees

• Current Assignee: Tektronix Incorporated (Fortive Corp.)
• Original Assignee: Tektronix Incorporated (Fortive Corp.)
• Inventors: Mihalik, Michael A., Hoeren, Gerd H., Palmquist, Steven R., Reiney, Michael G., Besemer, James J.
• Primary Examiner(s): Krass, Errol A.
• Assistant Examiner(s): NOT, DEFINED
• Application Number:
  US06/442,948
• Time in Patent Office: 1,201 Days
• Field of Search: 364/550, 364/551, 364/900, 364/480, 364/481, 364/484, 364/486, 364/487, 371/20, 371/25, 371/23, 324/73 R, 324/73 AT, 324/73 PC
• US Class Current: 702/189
• CPC Class Codes: G06F 11/322 Display of waveforms, e.g. of logic analysers G06F11/323 takes precedence

Abstract

An apparatus for time aligning data acquired by one test instrument with corresponding data acquired by another test instrument is disclosed. A set of binary codes, representative of a set of instructions executed by a microprocessor disposed within a user'"'"'s prototype circuit, are acquired by said one test instrument. With the acquisition of each of said binary codes, a count is developed in a counter indicative of each said acquisition. A multitude of binary data is acquired, independently of the acquisition of the set of binary codes, by said another test instrument, the multitude of binary data being representative of the functions performed by a set of components present within said user'"'"'s prototype circuit. The binary codes acquired by said one test instrument and the binary data acquired by said another test instrument each have associated therewith a count developed from said counter. A mini-computer receives the binary codes acquired by said one test instrument, the binary data acquired by said another test instrument, and the counts corresponding thereto. The mini-computer time-aligns the binary data acquired by said another test instrument with the binary codes acquired by said one test instrument, using the counts associated therewith. A display of the time-aligned data is developed on a display device. As a result, when an instruction is executed by the microprocessor of the user'"'"'s prototype circuit, using said display, it is possible to easily analyze the activity which took place among the components present within the user'"'"'s prototype circuit as a result of the execution of said instruction by said microprocessor.

Claims

1. A method of time aligning in chronological order a second set of data with a corresponding separately-generated first set of data, comprising the steps of:

acquiring by separate means said first set of data and said second set of data;

producing a series of identifiers wherein an identifier is produced in response to each acquisition of said first set of data;

associating each of said identifiers with said each acquisition of said first set of data and with acquisitions of said second set of data which correspond with said each acquisition of said first set of data; and

grouping said corresponding acquisitions of said first and second sets of data in chronological order in accordance with said series of identifiers.

2. A method in accordance with claim 1 wherein said first set of data is a set of binary codes representative of a set of instructions executed by a microprocessor, and said second set of data is binary data produced by a monitored system.

3. A method in accordance with claim 2 wherein said identifiers are counts produced by a counter in response to each of said binary codes, and wherein said associating step comprises labeling each of said binary codes and binary data corresponding with each of said binary codes with a count.

4. A method in accordance with claim 3 wherein said chronological order grouping step comprises, for each count, arranging in sequence said binary code followed by said binary data, each count being arranged in consecutive order thereby to provide time-aligned data.

5. A method in accordance with claim 4 further comprising the step of displaying said time-aligned data.

6. An apparatus for time aligning in chronological order a second set of data with a corresponding separately-generated first set of data, comprising:

means for acquiring said first set of data;

means for producing an identifier signal in response to each acquisition of said first set of data, wherein a consecutive series of identifier signals is produced;

means for acquiring said second set of data;

means for associating one or more acquisitions of said second set of data with each of said identifier signals such that each identifier signal is associated with corresponding acquisitions of said first and second sets of data; and

means for grouping said corresponding acquisitons of said first and second sets of data in chronological order in accordance with said consecutive series of identifier signals.

7. An apparatus in accordance with claim 6 wherein said means for acquiring said first set of data is a first test instrument, and said first set of data is a set of binary codes representative of a set of instructions executed by a microprocessor;

and further wherein said means for acquiring said second set of data is a second test instrument, and said second set of data is binary data produced by a monitored system.

8. An apparatus in accordance with claim 7 wherein said means for grouping corresponding acquisitions in chronological order comprises processing means which receives said binary codes, said binary data, and said identifier signals and arranges in sequence for each identifier signal an acquired binary code and acquired binary data corresponding therewith so as to provide time-aligned data.

9. An apparatus in accordance with claim 7 wherein said means for producing an identifier signal comprises a counter for producing a count signal in response to each of said binary codes.

10. An apparatus in accordance wih claim 9 further comprising means for displaying said time-aligned data.