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Method for measuring surface and near surface properties of materials

  • US 4,574,637 A
  • Filed: 08/03/1984
  • Issued: 03/11/1986
  • Est. Priority Date: 08/03/1984
  • Status: Expired due to Fees
First Claim
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1. A method of measuring the properties of the surface layer of a specimen having said surface layer and a subsurface layer, said surface layer having at least one physical property the value of which differs from the same physical property of said subsurface layer, which method comprises:

  • a. disposing an ultrasonic transducer at a point spaced from said specimen;

    b. causing said transducer to generate a pulse of ultrasound which impinges upon said surface layer of said specimen;

    c. detecting, by means of said transducer, the backscattered pulse produced by said impingement of said pulse upon said surface layer;

    d. repeating the steps (b) and (c) after varying the angle of incidence of the pulse of ultrasound, and detecting the local maximum of intensity of said backscattered pulse which occurs when said angle of incidence is approximately equal to the Rayleigh angle of said surface layer; and

    e. measuring said angle of incidence at said local maximum of intensity.

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