Method and apparatus for radiation testing of electron devices

• US 4,575,676 A
• Filed: 04/04/1983
• Issued: 03/11/1986
• Est. Priority Date: 04/04/1983
• Status: Expired due to Term

• Current Assignee: Advanced Research & Applications Corp. (OSI Systems Incorporated)
• Original Assignee: Advanced Research & Applications Corp. (OSI Systems Incorporated)
• Inventors: Palkuti, Leslie J.
• Primary Examiner(s): Karlsen, Ernest F.
• Application Number:
  US06/481,772
• Time in Patent Office: 1,072 Days
• Field of Search: 324/158 D, 324/158 F, 324/158 R, 324/73 R
• US Class Current: 324/750.19
• CPC Class Codes: G01R 31/2656 using non-ionising electromagnetic radiation, e.g. optical radiation
• CPC Class Codes: G01R 31/302 Contactless testing G01R31/66 takes precedence

Abstract

A test apparatus for electron devices, such as integrated circuits, at the wafer stage of fabrication, wherein a beam of ionizing radiation is directed through an electrical probe card and onto the wafer under test. The probe card and the radiation beam share a common port through which a selected device or group of devices is exposed, but other devices on the wafer are not similarly exposed. A microscope, supported on a frame, is interchangeable with the radiation beam source, sharing the common port, so that a tested device may be observed.

Claims

1. A test apparatus for electronic devices comprising,

means for supporting an electronic device, said electronic device partially formed of silicon dioxide,

a source of radiation having a collimated beam, said radiation having an energy which is ionizing to silicon dioxide, causing permanent degradation of electrical characteristics of said electronic device, said source mounted above said device supporting means,

an electrical probe means for applying electrical power to said electronic device and communicating device performance date outwardly, said probe means located between said device supporting means and said beam source, said probe means having fine electrical wires contacting said electronic device, said probe means having an auxiliary collimator with an aperture defined therein for transmitting the beam to the electronic device under test.

2. The apparatus of claim 1 wherein said means for supporting an electronic device is a chuck movable in X and Y directions.

3. The apparatus of claim 1 wherein said source of ionizing radiation causing electronic device degradation is selected from the group consisting of an X-ray tube, a short-wavelength laser source or an isotopic radiation source.

4. The apparatus of claim 1 wherein said probe means is a probe card having an auxiliary shield supported in a parallel plane above the card, said auxiliary shield having an auxiliary collimator with a beam aperture of a size limiting the radiation beam cross-sectional area to the approximate size of an electronic device under test.

5. The apparatus of claim 4 wherein said auxiliary collimator comprises coaxial cylinders of materials having low radiation scattering cross sections with respect to the beam.

6. The apparatus of claim 1 wherein said means for supporting an electronic device has a calibrated dosimeter connected thereto for measuring the flux of ionizing radiation.

7. The apparatus of claim 1 having a radiation-tight cabinet enclosing said electronic device supporting means, said source of ionizing radiation and said electrical probe means.

8. The apparatus of claim 1 having a frame supporting said source of ionizing radiation in a movable manner, said frame having a microscope movably mounted thereon whereby the positions of said microscope and said radiation source are interchangeable.

9. The apparatus of claim 8 wherein said frame comprises an upright member supporting a transverse rail, said microscope and radiation source mounted for interchangeable movement on said rail.

10. The apparatus of claim 3 wherein a portion of said X-ray tube is enclosed in a housing surrounding a beam exit portion of the tube, said housing having a primary beam collimating means directing the beam onto the electron device under test.

13. The apparatus of claim 1 wherein said wafer support means includes a calibrated radiation dosimeter.

11. A semiconductor test apparatus comprising,

a means for supporting a semiconductor wafer,

said wafer partially formed of silicon dioxide,

a radiation source having an energy which is ionizing to silicon dioxide directing a collimated beam of ionizing radiation onto an auxiliary collimator, said auxiliary collimator having an aperture of dimensions corresponding to a semiconductor integrated circuit die of said wafer,

an electrical test probe card for testing electrical characteristics of a semiconductor integrated circuit, said probe card mounted in proximity to said wafer support means, said support means and probe card both disposed beneath said auxiliary collimator, said probe card supporting the auxiliary collimator, the collimator defining an aperture therein through which said beam passes,

means for simultaneously energizing said ionizing radiation source and said probe card for electrical testing of an integrated circuit during irradiation, and

means for indexing said wafer support means to bring another integrated circuit die from said wafer into the path of said collimated beam.

12. The apparatus of claim 11 wherein said ionizing radiation source is selected from the group consisting of an X-ray tube source, a short-wavelength laser source or an isotopic radiation source.

14. The apparatus of claim 11 wherein said wafer support means is movable in X and Y directions.

15. The apparatus of claim 11 having optical means supported above said probe card for viewing an integrated circuit chip through said auxiliary collimator.

16. The apparatus of claim 15 wherein said optical means and said radiation source are both mounted on a rail directly above said probe card, whereby either of said optical means and radiation source may be disposed directly above said probe card.

17. The apparatus of claim 16 wherein said optical means is a microscope.

18. The apparatus of claim 11 having a shutter in the path of said beam of radiation and having a radiation-tight housing enclosing said wafer supporting means, said electrical test probe card and said means for indexing said wafer support means, said housing having protective interlock switches connected to the shutter whereby the shutter normally blocks said beam except when said protective interlock switches permit shutter removal from the beam path.