×

Phase measuring method and apparatus

  • US 4,577,150 A
  • Filed: 05/26/1983
  • Issued: 03/18/1986
  • Est. Priority Date: 06/09/1982
  • Status: Expired due to Term
First Claim
Patent Images

1. A method of obtaining a primary measurement of the differences in the phase relationship between a pair of comparison signals at predetermined different times, the two comparison signals existing simultaneously and having the same comparison frequency, a first of the comparison signals being produced at a first station and a second of the comparison signals being produced at a second station spaced from the first station, which method comprises:

  • generating at the first station a first frequency-stable reference signal having a first reference frequency suitably close to the comparison frequency;

    generating at the second station a second frequency-stable reference signal having a second reference frequency suitably close to the comparison frequency;

    measuring at the first station the phase relationship between the first comparison signal and the first reference signal at each of said predetermined times to provide a first secondary measurement;

    measuring at the second station the phase relationship between the second comparison signal and the second reference signal at each of said predetermined times to provide a second secondary measurement; and

    bringing together and suitably processing the first and second secondary measurements to extract therefrom said primary measurement.

View all claims
  • 1 Assignment
Timeline View
Assignment View
    ×
    ×