Inspection of unsintered single layer or multilayer ceramics using a broad area electrical contacting structure

• US 4,621,232 A
• Filed: 05/15/1984
• Issued: 11/04/1986
• Est. Priority Date: 05/26/1981
• Status: Expired due to Fees

• Current Assignee: International Business Machines Corporation
• Original Assignee: International Business Machines Corporation
• Inventors: Zingher, Arthur R., Chang, Tai-Hon P., Coane, Philip J., Molzen, Walter W. Jr., Hohn, Fritz-Jurgen
• Primary Examiner(s): Karlsen, Ernest F.
• Application Number:
  US06/610,445
• Time in Patent Office: 903 Days
• Field of Search: 324/51, 324/158 F, 324/158 D, 324/158 R, 324/71.3, 250/310, 250/311, 156/64
• US Class Current: 324/754.22
• CPC Class Codes: G01R 1/073 Multiple probes
• CPC Class Codes: G01R 31/2644 Adaptations of individual semiconductor devices to facilitate the testing thereof
• CPC Class Codes: H01B 1/24 the conductive material comprising carbon-silicon compounds, carbon or silicon

Abstract

Apparatus and methods are disclosed for inspecting unsintered single or multiple layer ceramic specimens containing or carrying metal paste patterns of the type commonly used to ultimately form laminated multilayer ceramic (MLC) carriers for large scale integrated (LSI) chips. A relatively large surface area of an unsintered ceramic specimen (large in comparison with the minimum feature size of the paste patterns) is temporarily electrically contacted with a conforming electrode. The conforming electrode makes non-damaging electrical contact to any metallic paste exposed at the contacted area. Electric charge is either collected or delivered by this electrode, depending upon the mode of operation. The electrical continuity of metallic paste paths which contact the electrode and extend through the unfired ceramic specimen to surface positions not contacted by the electrode are tested either by delivering electric charge to the other surface locations and correlating therewith the collection of charge by the electrode, or by delivering charge by the electrode to all paste paths in contact therewith and detecting the presence of charge at the other surface locations. A preferred method either for delivering charge to such other surface locations or for detecting charge at such other surface locations is by using an electron probe beam. Various embodiments for the conforming electrode are described.

Claims

1. A method of testing the physical continuity of metallic paste within unsintered ceramic structures having non-planar surface topography and containing exposed metallic paste lines and vias, comprising the steps of:

temporarily contacting a surface region of an unsintered ceramic structure containing metallic paste lines and vias with a detachable electrode which conforms to topographical contours in the contacted surface,

said contacted surface region having many exposed metallic paste regions and a non-planar surface topography;

said electrode contacting all of said exposed paste regions underlying said electrode without damaging any contacted paste lines or vias,

scanning a different surface are of said ceramic structure with an electron beam,

said different surface area being separate from said surface area contacting said electrode;

said different surface area having exposed paste regions, at least some of which have physical continuity with paste regions contacting said electrode; and

sensing current collected by said electrode as said electron beam scans said different surface area,

whereby paste continuity between each of said exposed paste regions at said different surface area and said eletrode thereby is individually tested by sensing the current collected by said electrode when each of said exposed paste regions at said different surface area is irradiated by said electron beam.

2. The method of claim 1 wherein said temporarily contacted surface region is at least a portion of the bottom surface of said ceramic structure and said different surface area is at least a portion of the top surface of said ceramic structure.

3. The method of claim 1 wherein said temporarily contacted surface region is a portion of the top surface of said ceramic structure and said different surface region is a different portion of the top surface of said ceramic structure.