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Adaptive pattern recognition

  • US 4,637,055 A
  • Filed: 05/25/1984
  • Issued: 01/13/1987
  • Est. Priority Date: 05/27/1983
  • Status: Expired due to Fees
First Claim
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1. An optical inspection system for analyzing the object content of a field of view comprising:

  • an optical system adapted to produce either from the said object content or an image thereof, a diffraction pattern;

    a light level detection means on which the diffraction pattern is focussed for producing electrical signals corresponding to the light intensity at different points within the pattern;

    electrical circuit means response to said electrical signals comprising means for storing a plurality of different reference signal patterns and comparison means for comparing the electrical signals from the light level detection means produced from a subsequent field of view with each of the stored reference signal patterns to facilitate the identification of the subsequent signal pattern.

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