Automatic method and machine for the simultaneous testing of data processing systems

• US 4,639,916 A
• Filed: 06/19/1984
• Issued: 01/27/1987
• Est. Priority Date: 06/22/1983
• Status: Expired due to Term

• Current Assignee: Hewlett-Packard Development Company, L.P. (HP Inc.)
• Original Assignee: US Philips Corporation (Koninklijke Philips N.V.)
• Inventors: Bader, Alain, Bertaux, Jean-Paul, Boutterin, Daniel
• Primary Examiner(s): Fleming, Michael R.
• Application Number:
  US06/622,348
• Time in Patent Office: 952 Days
• Field of Search: 371/15, 371/16, 371/18, 371/21, 371/20, 371/25, 364/200, 364/900, 364/131, 364/132, 364/141, 364/551, 364/167, 364/162, 364/186, 364/189, 364/146, 364/171
• US Class Current: 714/27
• CPC Class Codes: G06F 11/273 Tester hardware, i.e. output processing circuits G06F11/263 takes precedence

Abstract

A method and machine for testing data processing systems wherein the test result is an acceptance or another condition for the central processing unit of the data processing system. For each data processing system having an intended configuration, the method embodies one or more test programs, each program requiring a predetermined configuration of peripheral devices, the execution of a specific test program being started only after the verification of the presence of the required peripheral. In the absence of an intended peripheral, the test machine has means for simulating the presence of said peripheral device. The determination of the peripherals in a configuration and the selection of a test program from a library of such programs may be automatic or may be chosen by operator input. Thus, the method and machine provides of the simultaneous testing of a number of central processing units before delivery to the customers and with a configuration specified by the customer by time multiplexing peripheral test devices which can be automatically connected to the system to be tested.

Claims

1. A method for testing a plurality of data processing systems, each by means of at least one test program from a first set of test programs, each data processing system comprising a central processing unit, a main memory, a stabilized power supply unit, and at least one control means for an associated peripheral device, and loading means for loading a test program in its main memory for execution by its central processing unit, each data processing system having an individual identification, said method being characterized by the following steps:

(a) providing a test machine for interconnection to said plurality of data processing systems, said test machine including a control unit, a power supply interconnection, a second set of tool peripherals controlled by an associated and selectable one of said control means, memory means for storing said first set of test programs and operator interface means;

(b) entering into said test machine the configuration data of each data processing system of said plurality of data processing systems as represented by the number and nature of the control means for peripheral devices thereof;

(c) automatic selecting by said test machine of specific test programs as a subset from said first set for execution in each data processing system as determined by said number and nature of said control means;

(d) executing said testing by recurrently executing the following substeps;

(d1) scanning the connection points of data processing systems interconnected to said test machine to determine the presence or absence of a system;

(d2) for a data processing system present and connected, scanning the set of specific test programs which can be selected to test said system;

(d3) for a specific test program selected, accessing any tool peripheral necessary for execution of the test program in question for determining the availability of said tool peripheral and in case of availability, allocating the tool peripheral in question to the data processing system in question;

(d4) in case of unavailability of any tool peripheral necessary, first, searching for any tool peripheral adapted as a substitute for the unavailable tool peripheral, second, in case of unavailability of any necessary substitute tool peripheral, disallocating any tool peripheral allocated to the data processing system in question and thereupon scanning any remaining test program of said specific test programs for the data processing system in question for detecting an executability condition thereof as based on an availability of all necessary tool peripherals then allocated thereto, third, in case of absence of any executability condition for the data processing system in question, disallocating any tool peripheral allocated to the data processing system in question and returning to the substep of scanning the data processing system;

(d5) in case of detecting an executability condition, loading the test program in question into the main memory of the data processing system in question for subsequent execution thereby and returning to the substep of scanning the data processing systems;

(d6) in said data processing system executing said test program as isolated from any other scanning, availability detecting, executability detecting, or allocating substep, and after terminating said executing, signalling said terminating to said test machine;

(d7) upon receiving a terminating signal from a data processing system, disallocating in said test machine any tool peripheral then allocated to the data processing system in question and returning to the substep of scanning the data processing system;

(e) upon reaching an output condition, outputting test results from each test program executed, as represented by an OK/OK condition, a test identity, and an identification as to the tested data processing system.

2. A method as claimed in claim 1, wherein in an executing and testing step each data processing system is initially tested once by a reduced test program for testing elementary functions of the central processing unit thereof and the stabilized power supply thereof.

3. A method as claimed in claim 2, wherein an incorrect execution of a reduced test program is signalled at said operator interface means directly upon reception of the associated terminating signal.

4. A method as claimed in claim 1, 2 or 3, wherein during an recurrently executing and testing step the subset of test programs for a particular data processing system is modified from said automatically selected subset under operator control at an instant when no test program is being executed by the data processing system in question.

5. A method as claimed in claim 4, wherein starting and finishing said executing and testing step for a particular data processing system is effected unconditionally under operator control.

6. A method as claimed in any one of claims 1 through 3, further including the step of storing in memory the number of executions of a particular test program by a particular data processing system until after finishing the testing of the data processing system in question and wherein after interrupting said executing and testing step at the intended restart thereof leaving unselected the particular test program for the data processing system in question if the number stored in memory therefor lies above a predetermined minimum value.

7. A method as claimed in any one of the claims 1 through 3, wherein during said executing and testing step at least one cyclic variation is induced in the ambient temperature for at least one data processing system.

8. A method as claimed in any of claims 1 through 3, wherein during said executing and testing step at least one power supply interruption for the stabilized power supply unit of at least one data processing system is controlled with a duration in the millisecond range to test for uninterrupted processing of the test program then being executed in the data processing system in question.

9. A method as claimed in any one of the claims 1 through 3, wherein before the execution of a test program at least one power supply interruption for the stabilized power supply unit of at least one data processing system is controlled with a longer duration than the power-sustaining time of the power supply unit in question to test for a correct restart operation by the data processing system in question.

10. A method as claimed in any one of the claims 1 through 3, wherein under operator control during said executing and testing step outputting a test result is outputted on a data output device.

11. A test machine for testing a plurality of data processing systems, each by means of at least one test program from a first set of test programs, each data processing system comprising a central processing unit, a main memory, a stabilized power supply unit, and at least one control means for an associated peripheral device, and loading means for loading a test program in its main memory for execution by its central processing unit, each data processing system having an individual identification, said machine comprising at least one control unit interconnected to a plurality of tool peripherals, and operator interface means, characterized in that there are provided a plurality of test sites for installing data processing systems to be tested by interconnection to said control unit, in that said test machine further comprises storing means for storing the configuration data of each data processing system inclusive of indication data for indicating the subset of test programs applicable to each data processing system, selection means for automatically selecting a data processing system and a test program to be executed thereby, allocating means for allocating to a data processing system selected any tool peripheral necessary for the execution of a test program selected therefore, until the end of the execution of the test program in question, and outputting means for under operator control outputting test results of a test program executed, on an output device.

12. A test machine as claimed in claim 11, characterized in that it comprises means for supplying an audible signal when a reduced test program is not correctly completed.

13. A test machine as claimed in claim 11 or 12, characterized in that it comprises means for controlling a temperature cycle of one or more rooms in which a data processing system to be tested is situated.

14. A test machine as claimed in claim 11 or 12, characterized in that it comprises means of selectively controlling power supply interruptions of variable duration, interruptions or microinterruptions, in the stabilized power supply units of a data processing system to be tested.