Method and apparatus for surface profilometry

• US 4,641,972 A
• Filed: 09/14/1984
• Issued: 02/10/1987
• Est. Priority Date: 09/14/1984
• Status: Expired due to Term

• Current Assignee: New York Institute of Technology Incorporated
• Original Assignee: New York Institute of Technology Incorporated
• Inventors: Srinivasan, Venugopal, Halioua, Maurice
• Primary Examiner(s): EVANS, FANNIE L
• Application Number:
  US06/650,824
• Time in Patent Office: 879 Days
• Field of Search: 356/376, 356/375, 356/1, 356/2, 250/237 G
• US Class Current: 356/604
• CPC Class Codes: G01B 11/2527 with phase change by in-plane movement of the patern

Abstract

Phase measurements of deformed grating images are used in performing improved optical profilometry. In one embodiment, phase differences between images of an object and a reference plane are used to obtain a measure of the object height.

Claims

1. A method for determining the surface profile of an object, comprising the steps of:

directing at said object an incident beam of light having a sinusoidally varying intensity pattern;

modulating the phase of the sinusoidal intensity pattern of said incident beam;

receiving at a detector a deformed grating image of the object for a number of different modulated phases of said incident beam;

determining, for points on the surface of the object, the height at each said point with respect to a reference plane, each said height determination including the step of combining image intensity values, for said different modulated phases of the incident beam, at a detector position corresponding to a respective point of the object.

2. The method as defined by claim 1, wherein said intensity values at each detector pixel position are combined to determine an object phase at a corresponding object point, and wherein the difference between the object phase at each such point and a reference phase at a corresponding point on the reference plane is used to determine the object height at such point.

3. The method as defined by claim 2, wherein said reference phases are obtained by positioning a reference plane in the vicinity of the object position, and determining, for points on the reference plane, detector intensity values for said different modulated phases of said incident beam, said intensity values for each point being combined to obtain a reference phase for such point.

4. The method as defined by claim 1, wherein said number of different phases of the incident beam comprises three different phases.

5. The method as defined by claim 3, wherein said number of different phases of the incident beam comprises three different phases.

6. The method as defined by claim 1, wherein reference phases are obtained by positioning a reference plane in the vicinity of the object position, and determining, for points on the reference plane, detector intensity values for said different modulated phases of said incident beam, said intensity values for each point being combined to obtain a reference phase for such point;

and wherein said step of determining height includes determining the distance between positions on the detector at which a reference phase corresponds to an object phase.

7. The method as defined by claim 6, wherein said number of different phases of the incident beam comprises three different phases.

8. A method for determining the surface profile of an object, comprising the steps of:

directing at said object an incident beam of light having a sinusoidally varying intensity pattern;

modulating the phase of the sinusoidal pattern of said incident beam;

receiving and storing a deformed grating image of the object for a number of different modulated phases of said input beam;

receiving and storing an image of a reference plane for said number of different modulated phases of said input beam;

combining image intensity values at each point of the deformed grating image of the object to obtain an object phase at each such point;

combining image intensity values at each point of the image of the reference plane to obtain a reference plane phase at each such point; and

determining the object height at each point from the object phase and reference plane phase for each such point.

9. The method as defined by claim 8, wherein the difference between the object phase at each point and the reference phase at a corresponding point on the reference plane is used to determine the object height at such point.

10. Apparatus for determining the surface profile of an object, comprising:

means for directing at said object an incident beam of light having a sinusoidally varying intensity pattern;

means for modulating the phase of the sinusoidal intensity pattern of said incident beam;

a detector for receiving a deformed grating image of the object for a number of different modulated phases of said incident beam; and

means for determining, for points on the surface of the object, the height at each said point with respect to a reference plane, said means being operative to combine image intensity values, for said different modulated phases of the incident beam, at a detector position corresponding to a respective point of the object.

11. Apparatus as defined by claim 10, wherein said determining means is operative to combine intensity values at each detector pixel position to determine an object phase at a corresponding object point, and is operative to obtain the difference between the object phase at each such point and a reference phase at a corresponding point on the reference plane to determine the object height at such point.