×

Method for spatial measurement of holes

  • US 4,647,208 A
  • Filed: 07/22/1985
  • Issued: 03/03/1987
  • Est. Priority Date: 07/22/1985
  • Status: Expired due to Term
First Claim
Patent Images

1. A method for measuring the location of a hole in a workpiece comprising the steps of:

  • projecting feature lighting, characterized by substantially uniform illumination, upon said workpiece;

    optically sensing said workpiece under said feature lighting to receive an image comprising comparatively light and dark areas indicative of the centroid of said hole;

    projecting structured lighting, characterized by a predetermined geometric pattern of illumination, upon said workpiece;

    optically sensing said workpiece under said structured lighting to receive an image comprising a reflected pattern defining a plane in which said hole is disposed; and

    determining the geometric intersection of said plane and said centroid to thereby establish the real space location of said hole.

View all claims
  • 1 Assignment
Timeline View
Assignment View
    ×
    ×