Method of three-dimensional measurement with few projected patterns
First Claim
Patent Images
1. A method for resolving ambiguity of a periodic pattern projected upon a surface to be measured in two or three dimensions comprising the steps of:
- projecting a periodic radiation pattern on a surface and obtaining a first reflected pattern;
recording an image of said first reflected pattern;
projecting one period of said periodic radiation pattern upon said surface and obtaining a second reflected pattern;
recording an image of said second reflected pattern;
identifying said one period image as a reference image; and
identifying each period image sequentially in the periodic image relative to the reference image.
3 Assignments
0 Petitions
Accused Products
Abstract
Methods are provided for reducing the number of projected patterns required to make two- or three-dimensional surface measurements on a sub-class of surfaces comprising relatively smooth surfaces. By including apriori knowledge about the surface to be measured, pattern ambiguities can be resolved by processing rather than by additional projected patterns.
-
Citations
5 Claims
-
1. A method for resolving ambiguity of a periodic pattern projected upon a surface to be measured in two or three dimensions comprising the steps of:
- projecting a periodic radiation pattern on a surface and obtaining a first reflected pattern;
recording an image of said first reflected pattern;
projecting one period of said periodic radiation pattern upon said surface and obtaining a second reflected pattern;
recording an image of said second reflected pattern;
identifying said one period image as a reference image; and
identifying each period image sequentially in the periodic image relative to the reference image.
- projecting a periodic radiation pattern on a surface and obtaining a first reflected pattern;
-
2. A method for resolving ambiguity of a periodic pattern projected upon a surface to be measured in two or three dimensions, comprising steps of:
- projecting a periodic radiation pattern with at least one period of a distinguishably different radiation wavelength from the remaining pattern and obtaining therefrom a periodic reflected pattern;
recording an image of said reflected pattern;
identifying the image of said different radiation wavelength period as a reference image; and
identifying an image of each period sequentially in the periodic image relative to the reference image.
- projecting a periodic radiation pattern with at least one period of a distinguishably different radiation wavelength from the remaining pattern and obtaining therefrom a periodic reflected pattern;
-
3. A method for resolving ambiguity within a periodic pattern projected upon a surface to be measured in two or three dimensions comprising the steps of:
- projecting a periodic radiation pattern on a surface, said pattern containing at least one period differing by a known length from the remaining pattern and obtaining therefrom a reflected pattern;
recording an image of said reflected pattern;
identifying said period differing by a known amount as a reference image; and
identifying each period image sequentially in the periodic image relative to the reference image.
- projecting a periodic radiation pattern on a surface, said pattern containing at least one period differing by a known length from the remaining pattern and obtaining therefrom a reflected pattern;
-
4. A method for resolving ambiguity within a periodic pattern projected upon a surface to be measured in two or three dimensions, comprising the steps of:
- projecting a periodic radiation pattern having a first and a last period onto a surface such that at least the first or last period is on said surface and obtaining therefrom a periodic reflected pattern;
recording an image of said reflected pattern;
identifying said first or last period as a reference image; and
identifying each period image sequentially in the periodic image relative to the reference image.
- projecting a periodic radiation pattern having a first and a last period onto a surface such that at least the first or last period is on said surface and obtaining therefrom a periodic reflected pattern;
-
5. A method for resolving ambiguity within a periodic pattern projected upon a surface to be measured in two or three dimensions, comprising the steps of:
- projecting a periodic radiation pattern on a surface, said pattern containing at least one aperiodic component, and obtaining therefrom a reflected pattern;
recording an image of said reflected pattern;
identifying said aperiodic component as a reference image; and
identifying each period image sequentially in the periodic image relative to the reference image.
- projecting a periodic radiation pattern on a surface, said pattern containing at least one aperiodic component, and obtaining therefrom a reflected pattern;
Specification